M. Vaez‐Iravani

676 total citations
16 papers, 498 citations indexed

About

M. Vaez‐Iravani is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. Vaez‐Iravani has authored 16 papers receiving a total of 498 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 11 papers in Biomedical Engineering and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. Vaez‐Iravani's work include Integrated Circuits and Semiconductor Failure Analysis (9 papers), Near-Field Optical Microscopy (9 papers) and Force Microscopy Techniques and Applications (6 papers). M. Vaez‐Iravani is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (9 papers), Near-Field Optical Microscopy (9 papers) and Force Microscopy Techniques and Applications (6 papers). M. Vaez‐Iravani collaborates with scholars based in United States, Finland and United Kingdom. M. Vaez‐Iravani's co-authors include Ricardo Toledo‐Crow, Pan Yang, Harald Ade, Chung W. See, Yue Chen, F. Seiferth, Bruce W. Smith, Andrew E. Carlson and B. Khan and has published in prestigious journals such as Applied Physics Letters, Langmuir and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

In The Last Decade

M. Vaez‐Iravani

15 papers receiving 482 citations

Peers

M. Vaez‐Iravani

EEE

AMPO

BIOPH

Khaled Sarayeddine France

Lukas Wesemann Australia

P. Regli Switzerland

Haesung Park South Korea

H. Huber Austria

Yudong Lian China

Umar Khan Belgium

M. Miyamoto Japan

B. Helbo Denmark

Martin Ebert United Kingdom

Khaled Sarayeddine France

M. Vaez‐Iravani

395 ×0.9

270 ×0.8

EEE

242 ×0.8

AMPO

31 ×0.6

43 ×0.9

BIOPH

Citations per year, relative to M. Vaez‐Iravani M. Vaez‐Iravani (= 1×) peers Khaled Sarayeddine

Countries citing papers authored by M. Vaez‐Iravani

Since Specialization

Citations

This map shows the geographic impact of M. Vaez‐Iravani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Vaez‐Iravani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Vaez‐Iravani more than expected).

Fields of papers citing papers by M. Vaez‐Iravani

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Vaez‐Iravani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Vaez‐Iravani. The network helps show where M. Vaez‐Iravani may publish in the future.

Co-authorship network of co-authors of M. Vaez‐Iravani

This figure shows the co-authorship network connecting the top 25 collaborators of M. Vaez‐Iravani. A scholar is included among the top collaborators of M. Vaez‐Iravani based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Vaez‐Iravani. M. Vaez‐Iravani is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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16 of 16 papers shown

Vaez‐Iravani, M.. (2011). Optical Inspection and Metrology in Semiconductor Manufacturing. Imaging and Applied Optics. AITuC1–AITuC1. 1 indexed citations

Vaez‐Iravani, M., et al.. (1998). Wafer inspection technology challenges for ULSI manufacturing. 405–415. 30 indexed citations

Ade, Harald, et al.. (1996). Observation of Polymer Birefringence in Near-Field Optical Microscopy. Langmuir. 12(2). 231–234. 19 indexed citations

Vaez‐Iravani, M., et al.. (1995). Resolution beyond the diffraction limit using frequency-domain field confinement in scanning microscopy. Ultramicroscopy. 61(1-4). 105–110. 10 indexed citations

Toledo‐Crow, Ricardo, et al.. (1995). On the heating of the fiber tip in a near-field scanning optical microscope. Applied Physics Letters. 67(19). 2771–2773. 38 indexed citations

Toledo‐Crow, Ricardo, et al.. (1995). Contrast mechanisms and imaging modes in near field optical microscopy. Ultramicroscopy. 57(2-3). 293–297. 4 indexed citations

Toledo‐Crow, Ricardo, et al.. (1994). <title>Near-field optical microscopy characterization of IC metrology</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2196. 62–73. 3 indexed citations

Vaez‐Iravani, M.. (1993). Detection of high- and low-frequency vibrations using a feedback- stabilized differential fiber optic interferometer. Optical Engineering. 32(8). 1879–1879. 5 indexed citations

Vaez‐Iravani, M., et al.. (1993). Correlative imaging in scanning near-field optical microscopy. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 11(4). 742–747. 16 indexed citations

10.

Toledo‐Crow, Ricardo, Yue Chen, & M. Vaez‐Iravani. (1992). <title>Atomic-force-regulated near-field scanning optical microscope</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1639. 44–53. 6 indexed citations

11.

Toledo‐Crow, Ricardo, et al.. (1992). Near-field differential scanning optical microscope with atomic force regulation. Applied Physics Letters. 60(24). 2957–2959. 351 indexed citations

12.

Vaez‐Iravani, M., et al.. (1992). Differential optical microscopy based on higher-order Gaussian–Hermite beam patterns. Applied Optics. 31(34). 7344–7344. 1 indexed citations

13.

Khan, B., et al.. (1990). High Performance Polysilicon Thin Film Transistors. MRS Proceedings. 182. 1 indexed citations

14.

Vaez‐Iravani, M., et al.. (1990). <title>Quantitative linewidth measurement using in-situ differential SEM techniques</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1261. 2–8. 2 indexed citations

15.

Vaez‐Iravani, M., et al.. (1988). Precision metrology of integrated circuit critical dimensions using in situ differential scanning electron microscopy. Scanning. 10(5). 201–206. 5 indexed citations

16.

See, Chung W. & M. Vaez‐Iravani. (1988). Differential amplitude scanning optical microscope: theory and applications. Applied Optics. 27(13). 2786–2786. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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