M. Vaez‐Iravani
-
- Force Microscopy Techniques and Applications 6
- Biomedical Engineering top 10%
- Near-Field Optical Microscopy 9
- Advanced Surface Polishing Techniques 2
- Biophysics top 5%
- Advanced Fluorescence Microscopy Techniques 2
-
- Integrated Circuits and Semiconductor Failure Analysis 9
- Advancements in Photolithography Techniques 5
- Photonic and Optical Devices 2
-
- Electron and X-Ray Spectroscopy Techniques 2
- Co-authors
- Ricardo Toledo‐CrowPan YangHarald AdeChung W. SeeYue ChenF. SeiferthBruce W. SmithAndrew E. Carlson
- Journals
- Applied Physics Letters (2 papers)Langmuir (1 paper)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (1 paper)
- Partner nations
- United StatesFinlandUnited Kingdom
In The Last Decade
M. Vaez‐Iravani
15 papers receiving 482 citations
Peers
Comparison fields: 5 of 35
- Atomic and Molecular Physics, and Optics 316
- Biomedical Engineering 442
- Biophysics 49
- Electrical and Electronic Engineering 352
- Surfaces, Coatings and Films 22
Countries citing papers authored by M. Vaez‐Iravani
This map shows the geographic impact of M. Vaez‐Iravani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Vaez‐Iravani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Vaez‐Iravani more than expected).
Fields of papers citing papers by M. Vaez‐Iravani
This network shows the impact of papers produced by M. Vaez‐Iravani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Vaez‐Iravani. The network helps show where M. Vaez‐Iravani may publish in the future.
Co-authorship network
The 9 scholars most cited alongside M. Vaez‐Iravani, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 1 | |
| 2 | 1998 | 30 | |
| 3 | 1996 | 19 | |
| 4 | 1995 | 10 | |
| 5 | 1995 | 38 | |
| 6 | 1995 | 4 | |
| 7 | 1994 | 3 | |
| 8 | 1993 | 5 | |
| 9 | 1993 | 16 | |
| 10 | 1992 | 6 | |
| 11 | 1992 | 351 | |
| 12 | 1992 | 1 | |
| 13 | 1990 | 1 | |
| 14 | 1990 | 2 | |
| 15 | 1988 | 5 | |
| 16 | 1988 | 6 |
About M. Vaez‐Iravani
M. Vaez‐Iravani is a scholar working on Biophysics, Surfaces, Coatings and Films and Biomedical Engineering, having authored 16 papers that have together received 498 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (9 papers), Near-Field Optical Microscopy (9 papers), Force Microscopy Techniques and Applications (6 papers), Advancements in Photolithography Techniques (5 papers), Advanced Surface Polishing Techniques (2 papers), Photonic and Optical Devices (2 papers), Electron and X-Ray Spectroscopy Techniques (2 papers) and Advanced Fluorescence Microscopy Techniques (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (316 citations), Biomedical Engineering (442 citations) and Biophysics (49 citations). M. Vaez‐Iravani has collaborated with scholars based in United States, Finland and United Kingdom. Frequent co-authors include Ricardo Toledo‐Crow, Pan Yang, Harald Ade, Chung W. See, Yue Chen, F. Seiferth, Bruce W. Smith, Andrew E. Carlson and B. Khan. Their work appears in journals such as Applied Physics Letters, Langmuir and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.