T. Ishitani

1.1k total citations
47 papers, 762 citations indexed

About

T. Ishitani is a scholar working on Computational Mechanics, Electrical and Electronic Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, T. Ishitani has authored 47 papers receiving a total of 762 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Computational Mechanics, 29 papers in Electrical and Electronic Engineering and 19 papers in Surfaces, Coatings and Films. Recurrent topics in T. Ishitani's work include Ion-surface interactions and analysis (29 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers) and Electron and X-Ray Spectroscopy Techniques (19 papers). T. Ishitani is often cited by papers focused on Ion-surface interactions and analysis (29 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers) and Electron and X-Ray Spectroscopy Techniques (19 papers). T. Ishitani collaborates with scholars based in Japan. T. Ishitani's co-authors include Ryōsuke Shimizu, Hiroshi Tamura, K. Ohya, H. Koike, K. Inai, Toshie Yaguchi, Takeo Kamino, Tsuyoshi Ohnishi, Masahiro Kato and Hideki Tsuboi and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

T. Ishitani

47 papers receiving 698 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
T. Ishitani Japan 17 452 447 224 212 160 47 762
Tohru Ishitani Japan 16 460 1.0× 417 0.9× 210 0.9× 233 1.1× 168 1.1× 63 797
A. Desalvo Italy 17 146 0.3× 510 1.1× 429 1.9× 126 0.6× 95 0.6× 72 796
O. Osmani Germany 13 481 1.1× 283 0.6× 322 1.4× 67 0.3× 114 0.7× 21 649
M.H.F. Overwijk Netherlands 10 77 0.2× 201 0.4× 158 0.7× 150 0.7× 65 0.4× 20 462
R. Jarocki Poland 16 175 0.4× 232 0.5× 116 0.5× 77 0.4× 96 0.6× 83 902
P.D. Prewett United Kingdom 14 151 0.3× 379 0.8× 153 0.7× 64 0.3× 161 1.0× 43 544
I. H. Wilson Hong Kong 16 362 0.8× 396 0.9× 451 2.0× 46 0.2× 117 0.7× 78 911
Szymon L. Daraszewicz United Kingdom 14 320 0.7× 122 0.3× 295 1.3× 38 0.2× 57 0.4× 16 559
M. M. El Gomati United Kingdom 15 84 0.2× 335 0.7× 103 0.5× 571 2.7× 56 0.3× 47 723
A. A. van Gorkum Netherlands 20 207 0.5× 589 1.3× 492 2.2× 84 0.4× 134 0.8× 44 1.0k

Countries citing papers authored by T. Ishitani

Since Specialization
Citations

This map shows the geographic impact of T. Ishitani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Ishitani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Ishitani more than expected).

Fields of papers citing papers by T. Ishitani

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Ishitani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Ishitani. The network helps show where T. Ishitani may publish in the future.

Co-authorship network of co-authors of T. Ishitani

This figure shows the co-authorship network connecting the top 25 collaborators of T. Ishitani. A scholar is included among the top collaborators of T. Ishitani based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. Ishitani. T. Ishitani is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ishitani, T., et al.. (2010). Secondary electron emission in scanning Ga ion, He ion and electron microscopes. Vacuum. 84(8). 1018–1024. 13 indexed citations
2.
Inai, K., et al.. (2007). Simulation Study on Image Contrast and Spatial Resolution in Helium Ion Microscope. Journal of Electron Microscopy. 56(5). 163–169. 37 indexed citations
3.
Ishitani, T. & Mikano Sato. (2007). Evaluation of both image resolution and contrast-to-noise ratio in scanning electron microscopy. Journal of Electron Microscopy. 56(4). 145–151. 11 indexed citations
4.
Ishitani, T. & Masataka Satô. (2006). Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy. Journal of Electron Microscopy. 55(5). 253–260. 1 indexed citations
5.
Ishitani, T.. (2004). Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy. Journal of Electron Microscopy. 53(3). 245–255. 8 indexed citations
6.
Ishitani, T.. (2004). Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction. Journal of Electron Microscopy. 53(5). 443–449. 77 indexed citations
7.
Ohya, K. & T. Ishitani. (2002). Target material dependence of secondary electron images induced by focused ion beams. Surface and Coatings Technology. 158-159. 8–13. 19 indexed citations
8.
Kamino, Takeo, Toshie Yaguchi, Yasushi Kuroda, et al.. (2002). A Newly Developed Fib System For Tem Specimen Preparation. Microscopy and Microanalysis. 8(S02). 48–49. 5 indexed citations
9.
Ishitani, T.. (1999). A general expression of beam intensity distribution subjected to spherical aberration. Journal of Electron Microscopy. 48(5). 617–620. 2 indexed citations
10.
Ishitani, T., Hideki Tsuboi, Toshie Yaguchi, & H. Koike. (1994). Transmission Electron Microscope Sample Preparation Using a Focused Ion Beam. Journal of Electron Microscopy. 45 indexed citations
11.
Ohnishi, T., Sumio Hosaka, Hiroshi Tamura, T. Ishitani, & T. Noda. (1991). A new resistor network for an electrostatic octupole deflector combined with a stigmator. Review of Scientific Instruments. 62(1). 240–241. 1 indexed citations
12.
Ishitani, T., et al.. (1989). Development of Liquid‐Metal‐Ion Sources for Focused‐Ion‐Beam Applications. Journal of The Electrochemical Society. 136(11). 3502–3505. 7 indexed citations
13.
Ishitani, T., et al.. (1989). Development of an arsenic liquid-metal ion source. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 37-38. 208–211. 3 indexed citations
14.
Shukuri, S., et al.. (1988). Phosphorus liquid metal ion source using a Pt–P–Sb alloy. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 6(4). 2457–2461. 8 indexed citations
15.
Ishitani, T., et al.. (1988). Favorable source material in liquid-metal-ion sources for focused beam applications. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 6(3). 931–935. 17 indexed citations
16.
Ishitani, T., et al.. (1984). Development of boron liquid–metal–ion source. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 2(3). 1365–1369. 17 indexed citations
17.
Ishitani, T., et al.. (1983). Mass-separated microbeam system with a liquid-metal-ion source. Nuclear Instruments and Methods in Physics Research. 218(1-3). 363–367. 15 indexed citations
18.
Sakai, T., et al.. (1979). Elevated electrode integrated circuits. IEEE Transactions on Electron Devices. 26(4). 379–385. 13 indexed citations
19.
Kobayashi, Hitome, et al.. (1977). Correction of secondary ion intensity by a new total ion monitoring method. Review of Scientific Instruments. 48(10). 1298–1302. 8 indexed citations
20.
Ishitani, T., et al.. (1976). Fundamental investigations of secondary ion production during ion bombardment. Surface Science. 55(1). 179–188. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Tohru Ishitani Breakdown of academic impact, for papers by A. Desalvo Breakdown of academic impact, for papers by O. Osmani Breakdown of academic impact, for papers by M.H.F. Overwijk Breakdown of academic impact, for papers by R. Jarocki Breakdown of academic impact, for papers by P.D. Prewett Breakdown of academic impact, for papers by I. H. Wilson Breakdown of academic impact, for papers by Szymon L. Daraszewicz Breakdown of academic impact, for papers by M. M. El Gomati Breakdown of academic impact, for papers by A. A. van Gorkum
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