C. W. Snyder

1.4k citations

20 papers · 1.2k indexed · 1 hit paper · h-index 13

Impact in

Atomic and Molecular Physics, and Optics top 2%
- Semiconductor Quantum Structures and Devices
- Surface and Thin Film Phenomena
- Semiconductor materials and interfaces
- Advanced Chemical Physics Studies
Structural Biology top 10%

Papers in

Structural Biology 2
Atomic and Molecular Physics, and Optics 14
- Semiconductor Quantum Structures and Devices 10
- Advanced Chemical Physics Studies 5
- Mechanical and Optical Resonators 2
- Force Microscopy Techniques and Applications 2

Co-authors: B. G. Orr Leonard M. Sander David A. Kessler Bradford G. Orr Matthew D. Johnson John F. Mansfield J. Sudijono H. Munekata
Journals: Review of Scientific Instruments (3 papers)Physical Review Letters (3 papers)Applied Physics Letters (2 papers)Physical review. B, Condensed matter (2 papers)Journal of Electronic Materials (1 paper)
Partner nations: United States

In The Last Decade

C. W. Snyder

20 papers receiving 1.1k citations

Hit Papers

align trajectories log scale

Effect of strain on surface morphology in highly strained InGaAs films 1991 · 414 citations

Peers

Countries citing papers authored by C. W. Snyder

Since Specialization

Citations

This map shows the geographic impact of C. W. Snyder's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. W. Snyder with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. W. Snyder more than expected).

Fields of papers citing papers by C. W. Snyder

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. W. Snyder. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. W. Snyder. The network helps show where C. W. Snyder may publish in the future.

Co-authors

The 25 scholars most cited alongside C. W. Snyder, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. W. Snyder Line = papers co-authored together C. W. Snyder links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Algorithm Reliance: Fast and Slow Management Science ·C. W. Snyder, Samantha Keppler, Stephen Leider	2025	1
2	Algorithm Reliance Under Pressure: The Effect of Customer Load on Service Workers SSRN Electronic Journal ·C. W. Snyder, Samantha Keppler, Stephen Leider	2022	8
3	Algorithm development for intrafraction radiotherapy beam edge verification from Cherenkov imaging Journal of Medical Imaging ·C. W. Snyder, Brian W. Pogue, Michael Jermyn, Irwin I. Tendler, Jacqueline M. Andreozzi, Petr Brůža, Venkat Raghavan Krishnaswamy, David J. Gladstone, Lesley A. Jarvis	2018	12
4	Characterization of degradation mechanisins in GaAs/AlGaas heterojunction bipolar transistors M. Frei, C. R. Abernathy, T-Y. Chiu, T. R. Fullowan, J. R. Lothian, R.K. Montgomery, S. J. Pearton, F. Ren, P. R. Smith, C. W. Snyder, B. Tseng, J. S. Weiner, P. Wisk	2005	1
5	Realization of in-situ sub two-dimensional quantum structures by strained layer growth phenomena in the InxGa1- xAs/GaAs system Journal of Electronic Materials ·J. Pamulapati, P. Bhattacharya, J. Singh, Paul R. Berger, C. W. Snyder, B. G. Orr, Richard L. Tober	1996	12
6	Combining transmission electron microscopy with focused ion beam sputtering for microstructural investigations of AlGaAs/GaAs heterojunction bipolar transistors Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·C. W. Snyder, M. Frei, D. Bahnck, L. C. Hopkins, R. Hull, L. R. Harriott, T.-Y. Chiu, T. R. Fullowan, B. Tseng	1995	4
7	Catastrophic degradation lines at the facet of InGaAsP/InP lasers investigated by transmission electron microscopy Applied Physics Letters ·C. W. Snyder, J. W. Lee, R. Hull, R. A. Logan	1995	20
8	Surface transformations on annealed GaAs(001) Physical review. B, Condensed matter ·C. W. Snyder, J. Sudijono, Chi‐Hang Lam, Matthew D. Johnson, Bradford G. Orr	1994	25
9	Effect of surface tension on the growth mode of highly strained InGaAs on GaAs(100) Applied Physics Letters ·C. W. Snyder, B. G. Orr, H. Munekata	1993	55
10	Scanning tunneling microscopy study of molecular-beam epitaxial growth of GaAs on GaAs(001) Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·J. Sudijono, Matthew D. Johnson, C. W. Snyder, Bradford G. Orr	1993	6
11	Comment on ‘‘Delayed relaxation by surfactant action in highly strained III-V semiconductor epitaxial layers’’ Physical Review Letters ·C. W. Snyder, Bradford G. Orr	1993	31
12	An STM study of molecular-beam epitaxy growth of GaAs Surface Science ·J. Sudijono, Matthew D. Johnson, M. B. Elowitz, C. W. Snyder, Bradford G. Orr	1993	51
13	Kinetically controlled critical thickness for coherent islanding and thick highly strained pseudomorphic films ofInxGa1−xAs on GaAs(100) Physical review. B, Condensed matter ·C. W. Snyder, John F. Mansfield, B. G. Orr	1992	159
14	A Model for Strain-Induced Roughening and Coherent Island Growth Europhysics Letters (EPL) ·B. G. Orr, David A. Kessler, C. W. Snyder, Leonard M. Sander	1992	155
15	Surface evolution during molecular-beam epitaxy deposition of GaAs Physical Review Letters ·J. Sudijono, Matthew D. Johnson, C. W. Snyder, M. B. Elowitz, Bradford G. Orr	1992	132
16	A combined molecular-beam epitaxy and scanning tunneling microscopy system Review of Scientific Instruments ·B. G. Orr, C. W. Snyder, Matthew D. Johnson	1991	33
17	The molecular beam epitaxy growth of InGaAs on GaAs(100) studied by i n s i t u scanning tunneling microscopy and reflection high-energy electron diffraction Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·C. W. Snyder, D. Barlett, B. G. Orr, P. Bhattacharya, J. Singh	1991	31
18	CCD-based reflection high-energy electron diffraction detection and analysis system Review of Scientific Instruments ·D. Barlett, C. W. Snyder, B. G. Orr, Roy Clarke	1991	25
19	Effect of strain on surface morphology in highly strained InGaAs films Physical Review Letters ·C. W. Snyder, B. G. Orr, David A. Kessler, Leonard M. Sander Hit paper breakdown →	1991	414
20	Concentric tube scanning tunneling microscope Review of Scientific Instruments ·C. W. Snyder, Alex de Lozanne	1988	9

About C. W. Snyder

C. W. Snyder is a scholar working on Structural Biology, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Condensed Matter Physics and Atmospheric Science, having authored 20 papers that have together received 1.2k indexed citations. Recurring topics across this work include Semiconductor Quantum Structures and Devices (10 papers), Advanced Chemical Physics Studies (5 papers), Semiconductor materials and devices (5 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), nanoparticles nucleation surface interactions (3 papers), Mechanical and Optical Resonators (2 papers), Force Microscopy Techniques and Applications (2 papers) and Advanced Semiconductor Detectors and Materials (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (963 citations), Structural Biology (28 citations), Condensed Matter Physics (201 citations), Electrical and Electronic Engineering (642 citations) and Surfaces, Coatings and Films (60 citations). C. W. Snyder has collaborated with scholars based in United States. Frequent co-authors include B. G. Orr, Leonard M. Sander, David A. Kessler, Bradford G. Orr, Matthew D. Johnson, John F. Mansfield, J. Sudijono, H. Munekata, J. Singh and P. Bhattacharya. Their work appears in journals such as Review of Scientific Instruments, Physical Review Letters, Applied Physics Letters, Physical review. B, Condensed matter and Journal of Electronic Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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