O. Vatel

1.5k total citations · 1 hit paper
10 papers, 1.3k citations indexed

About

O. Vatel is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Computational Mechanics. According to data from OpenAlex, O. Vatel has authored 10 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Atomic and Molecular Physics, and Optics, 5 papers in Electrical and Electronic Engineering and 4 papers in Computational Mechanics. Recurrent topics in O. Vatel's work include Force Microscopy Techniques and Applications (6 papers), Ion-surface interactions and analysis (2 papers) and Mechanical and Optical Resonators (2 papers). O. Vatel is often cited by papers focused on Force Microscopy Techniques and Applications (6 papers), Ion-surface interactions and analysis (2 papers) and Mechanical and Optical Resonators (2 papers). O. Vatel collaborates with scholars based in France, Japan and Belgium. O. Vatel's co-authors include E. André, F. Houzay, J. M. Moison, L. Leprince, F. Barthe, Masafumi Tanimoto, Philippe Dumas, Pascal Brault, Daniel Henry and Claude Amra and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Japanese Journal of Applied Physics.

In The Last Decade

O. Vatel

10 papers receiving 1.2k citations

Hit Papers

Self-organized growth of regular nanometer-scale InAs dot... 1994 2026 2004 2015 1994 250 500 750
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Self-organized growth of regular nanometer-scale InAs dots on GaAs
    1994 764 citations J. M. Moison, F. Houzay et al. Applied Physics Letters profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
O. Vatel France 9 1.0k 811 415 255 124 10 1.3k
E. André France 10 816 0.8× 782 1.0× 380 0.9× 161 0.6× 103 0.8× 23 1.1k
Hisao Nakashima Japan 19 1.0k 1.0× 965 1.2× 333 0.8× 184 0.7× 134 1.1× 116 1.3k
T. Y. Tan United States 17 950 0.9× 818 1.0× 438 1.1× 126 0.5× 77 0.6× 47 1.4k
Н. А. Берт Russia 19 1.2k 1.2× 1.1k 1.3× 523 1.3× 206 0.8× 151 1.2× 118 1.5k
O. P. Pchelyakov Russia 22 1.1k 1.1× 995 1.2× 690 1.7× 331 1.3× 69 0.6× 132 1.6k
T. O. Sedgwick United States 19 626 0.6× 1.2k 1.5× 435 1.0× 146 0.6× 45 0.4× 78 1.4k
M. Hohenstein Germany 14 937 0.9× 653 0.8× 404 1.0× 161 0.6× 150 1.2× 30 1.1k
L. González Spain 23 1.4k 1.4× 1.1k 1.3× 556 1.3× 423 1.7× 133 1.1× 119 1.6k
V. Swaminathan United States 20 969 1.0× 1.1k 1.3× 303 0.7× 109 0.4× 118 1.0× 87 1.3k
J. Weber Germany 19 681 0.7× 842 1.0× 615 1.5× 110 0.4× 69 0.6× 52 1.2k

Countries citing papers authored by O. Vatel

Since Specialization
Citations

This map shows the geographic impact of O. Vatel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Vatel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Vatel more than expected).

Fields of papers citing papers by O. Vatel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O. Vatel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Vatel. The network helps show where O. Vatel may publish in the future.

Co-authorship network of co-authors of O. Vatel

This figure shows the co-authorship network connecting the top 25 collaborators of O. Vatel. A scholar is included among the top collaborators of O. Vatel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with O. Vatel. O. Vatel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

10 of 10 papers shown
1.
Tanimoto, Masafumi & O. Vatel. (1996). Kelvin probe force microscopy for characterization of semiconductor devices and processes. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(2). 1547–1551. 91 indexed citations
2.
Vatel, O. & Masafumi Tanimoto. (1995). Kelvin probe force microscopy for potential distribution measurement of semiconductor devices. Journal of Applied Physics. 77(6). 2358–2362. 101 indexed citations
3.
Chavez-Pirson, Arturo, et al.. (1995). Nanometer-scale imaging of potential profiles in optically excited n-i-p-i heterostructure using Kelvin probe force microscopy. Applied Physics Letters. 67(21). 3069–3071. 45 indexed citations
4.
Brault, Pascal, et al.. (1994). Silicon roughness induced by plasma etching. Journal of Applied Physics. 75(11). 7498–7506. 97 indexed citations
5.
Moison, J. M., F. Houzay, F. Barthe, et al.. (1994). Self-organized growth of regular nanometer-scale InAs dots on GaAs. Applied Physics Letters. 64(2). 196–198. 764 indexed citations breakdown →
6.
Bender, H., Steven Verhaverbeke, Matty Caymax, O. Vatel, & Marc Heyns. (1994). Surface reconstruction of hydrogen annealed (100) silicon. Journal of Applied Physics. 75(2). 1207–1209. 36 indexed citations
7.
Vatel, O., et al.. (1994). Atomic force microscopy studies of polysilicon growth during deposition on silicon. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(3). 2037–2039. 7 indexed citations
8.
Dumas, Philippe, et al.. (1993). Quantitative Microroughness Analysis down to the Nanometer Scale. Europhysics Letters (EPL). 22(9). 717–722. 87 indexed citations
9.
Vatel, O., et al.. (1993). Roughness Assessment of Polysilicon Using Power Spectral Density. Japanese Journal of Applied Physics. 32(12R). 5671–5671. 11 indexed citations
10.
Vatel, O., Steven Verhaverbeke, H. Bender, et al.. (1993). Atomic Force Microscopy and Infrared Spectroscopy Studies of Hydrogen Baked Si Surfaces. Japanese Journal of Applied Physics. 32(10B). L1489–L1489. 20 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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