O. Vatel
Impact in
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- Semiconductor Quantum Structures and Devices
- Force Microscopy Techniques and Applications
- Quantum and electron transport phenomena
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- Advanced Semiconductor Detectors and Materials
- Semiconductor materials and devices
- Semiconductor Lasers and Optical Devices
Papers in ⓘ
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- Force Microscopy Techniques and Applications 6
- Surface and Thin Film Phenomena 2
- Mechanical and Optical Resonators 2
- Semiconductor Quantum Structures and Devices 1
- Co-authors
- E. André (3 shared papers)F. Barthe (1 shared paper)F. Houzay (1 shared paper)L. Leprince (1 shared paper)J. M. Moison (1 shared paper)Masafumi Tanimoto (2 shared papers)Philippe Dumas (2 shared papers)Pascal Brault (1 shared paper)
- Journals
- Journal of Applied Physics (3 papers)Japanese Journal of Applied Physics (2 papers)Applied Physics Letters (2 papers)Europhysics Letters (EPL) (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (2 papers)
In The Last Decade
O. Vatel
10 papers receiving 1.2k citations
Hit Papers
Peers
Comparison fields: 5 of 54
- Atomic and Molecular Physics, and Optics 1.0k
- Electrical and Electronic Engineering 811
- Condensed Matter Physics 124
- Materials Chemistry 415
- Structural Biology 9
Countries citing papers authored by O. Vatel
This map shows the geographic impact of O. Vatel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Vatel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Vatel more than expected).
Fields of papers citing papers by O. Vatel
This network shows the impact of papers produced by O. Vatel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Vatel. The network helps show where O. Vatel may publish in the future.
Co-authors
The 21 scholars most cited alongside O. Vatel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Self-organized growth of regular nanometer-scale InAs dots on GaAs Hit paper breakdown → | 1994 | 764 |
| 2 | 1995 | 101 | |
| 3 | 1994 | 97 | |
| 4 | 1996 | 91 | |
| 5 | 1993 | 87 | |
| 6 | 1995 | 45 | |
| 7 | 1994 | 36 | |
| 8 | 1993 | 20 | |
| 9 | 1993 | 11 | |
| 10 | 1994 | 7 |
About O. Vatel
O. Vatel is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Computational Mechanics, Biomedical Engineering and Materials Chemistry, having authored 10 papers that have together received 1.3k indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (6 papers), Ion-surface interactions and analysis (2 papers), Surface Roughness and Optical Measurements (2 papers), Near-Field Optical Microscopy (2 papers), Surface and Thin Film Phenomena (2 papers), Mechanical and Optical Resonators (2 papers), Semiconductor Quantum Structures and Devices (1 paper) and Electron and X-Ray Spectroscopy Techniques (1 paper). The work is most often cited by research in Atomic and Molecular Physics, and Optics (1.0k citations), Electrical and Electronic Engineering (811 citations), Condensed Matter Physics (124 citations), Materials Chemistry (415 citations) and Structural Biology (9 citations). O. Vatel has collaborated with scholars based in France, Japan and Belgium. Frequent co-authors include E. André, F. Barthe, F. Houzay, L. Leprince, J. M. Moison, Masafumi Tanimoto, Philippe Dumas, Pascal Brault, Daniel Henry and Claude Amra. Their work appears in journals such as Journal of Applied Physics, Japanese Journal of Applied Physics, Applied Physics Letters, Europhysics Letters (EPL) and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.