James Nakos

696 total citations
12 papers, 488 citations indexed

About

James Nakos is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanics of Materials. According to data from OpenAlex, James Nakos has authored 12 papers receiving a total of 488 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 3 papers in Atomic and Molecular Physics, and Optics and 2 papers in Mechanics of Materials. Recurrent topics in James Nakos's work include Semiconductor materials and devices (8 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Advanced MEMS and NEMS Technologies (3 papers). James Nakos is often cited by papers focused on Semiconductor materials and devices (8 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Advanced MEMS and NEMS Technologies (3 papers). James Nakos collaborates with scholars based in United States. James Nakos's co-authors include J. B. Lasky, O.J. Cain, Shahryar Motakef, A. F. Witt, D.J. Carlson, David H. Matthiesen, Michael J. Wargo, S. Geißler, Steven H. Voldman and G. L. Miles and has published in prestigious journals such as Applied Physics Letters, IEEE Transactions on Electron Devices and Journal of Crystal Growth.

In The Last Decade

James Nakos

11 papers receiving 438 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
James Nakos United States	6	348	310	131	109	37	12	488
E. Ganin United States	12	547 1.6×	173 0.6×	121 0.9×	57 0.5×	19 0.5×	31	634
Jinjer Huang China	13	255 0.7×	188 0.6×	108 0.8×	94 0.9×	43 1.2×	58	401
D. Chidambarrao United States	12	398 1.1×	132 0.4×	114 0.9×	57 0.5×	35 0.9×	43	514
Roumen Kakanakov Bulgaria	12	351 1.0×	224 0.7×	137 1.0×	62 0.6×	46 1.2×	66	489
P.W. Pellegrini United States	11	188 0.5×	201 0.6×	117 0.9×	50 0.5×	14 0.4×	26	323
H. Jaouen France	11	550 1.6×	235 0.8×	118 0.9×	27 0.2×	40 1.1×	80	642
G. Regula France	12	344 1.0×	105 0.3×	181 1.4×	44 0.4×	27 0.7×	58	438
R. T. Fulks United States	12	378 1.1×	205 0.7×	154 1.2×	45 0.4×	9 0.2×	27	447
M. Grégoire France	11	234 0.7×	195 0.6×	72 0.5×	31 0.3×	39 1.1×	51	334
A. N. Safonov United Kingdom	12	287 0.8×	115 0.4×	173 1.3×	69 0.6×	10 0.3×	42	423

Countries citing papers authored by James Nakos

Since Specialization

Citations

This map shows the geographic impact of James Nakos's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James Nakos with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James Nakos more than expected).

Fields of papers citing papers by James Nakos

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by James Nakos. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James Nakos. The network helps show where James Nakos may publish in the future.

Co-authorship network of co-authors of James Nakos

This figure shows the co-authorship network connecting the top 25 collaborators of James Nakos. A scholar is included among the top collaborators of James Nakos based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with James Nakos. James Nakos is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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12 of 12 papers shown

1.

Nakos, James, et al.. (2014). Morphological Instability of High Ge Percent SiGe Films Grown by Ultra-High Vacuum Chemical Vapor Deposition. ECS Transactions. 64(6). 659–667. 6 indexed citations

2.

Nakos, James, et al.. (2014). The Use of Dopants for Defect Monitoring for Silicon-Germanium Ultra-High Vaccuum Chemical Vapor Deposition. ECS Transactions. 64(6). 441–454. 2 indexed citations

3.

Voldman, Steven H., S. Geißler, James Nakos, John J. Pekarik, & Robert Gauthier. (2002). Semiconductor process and structural optimization of shallow trench isolation-defined and polysilicon-bound source/drain diodes for ESD networks. 151–160. 33 indexed citations

4.

Koburger, Charles W., J. Adkisson, William F. Clark, et al.. (2002). Simple, fast, 2.5-V CMOS logic with 0.25-μm channel lengths and damascene interconnect. 85–86. 3 indexed citations

5.

Cabral, C., L. A. Clevenger, J. M. E. Harper, et al.. (1997). Low temperature formation of C54–TiSi2 using titanium alloys. Applied Physics Letters. 71(24). 3531–3533. 56 indexed citations

6.

Adler, E.L., J. DeBrosse, S. Geißler, et al.. (1995). The evolution of IBM CMOS DRAM technology. IBM Journal of Research and Development. 39(1.2). 167–188. 35 indexed citations

7.

Nakos, James. (1993). <title>Seamless application of rapid thermal processing in manufacturing</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1805. 105–114. 2 indexed citations

8.

Strong, A., A. K. Stamper, R. Bolam, et al.. (1993). Gate dielectric integrity and reliability in 0.5- mu m CMOS technology. 18–21. 3 indexed citations

9.

Nakos, James. (1993). <title>Seamless application of rapid thermal processing in manufacturing</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1804. 24–33. 1 indexed citations

10.

Nakos, James, et al.. (1992). <title>Influence of pyrometer signal absorption due to process gas on temperature control in rapid thermal processing</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1595. 35–38. 2 indexed citations

11.

Lasky, J. B., et al.. (1991). Comparison of transformation to low-resistivity phase and agglomeration of TiSi/sub 2/ and CoSi/sub 2/. IEEE Transactions on Electron Devices. 38(2). 262–269. 274 indexed citations

12.

Matthiesen, David H., Michael J. Wargo, Shahryar Motakef, et al.. (1987). Dopant segregation during vertical Bridgman-Stockbarger growth with melt stabilization by strong axial magnetic fields. Journal of Crystal Growth. 85(3). 557–560. 71 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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