C. Christiansen

1.3k total citations
39 papers, 773 citations indexed

About

C. Christiansen is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Condensed Matter Physics. According to data from OpenAlex, C. Christiansen has authored 39 papers receiving a total of 773 indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Electrical and Electronic Engineering, 26 papers in Electronic, Optical and Magnetic Materials and 10 papers in Condensed Matter Physics. Recurrent topics in C. Christiansen's work include Copper Interconnects and Reliability (26 papers), Semiconductor materials and devices (26 papers) and Electronic Packaging and Soldering Technologies (18 papers). C. Christiansen is often cited by papers focused on Copper Interconnects and Reliability (26 papers), Semiconductor materials and devices (26 papers) and Electronic Packaging and Soldering Technologies (18 papers). C. Christiansen collaborates with scholars based in United States, Norway and Germany. C. Christiansen's co-authors include Nina Marković, A. M. Goldman, A. M. Mack, A. M. Goldman, Baozhen Li, D. E. Grupp, J. Gill, William Huber, C.-C. Yang and D. Badami and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Journal of Applied Physics.

In The Last Decade

C. Christiansen

38 papers receiving 758 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
C. Christiansen United States 15 382 334 313 281 179 39 773
Satyaki Ganguly United States 13 414 1.1× 524 1.6× 115 0.4× 306 1.1× 144 0.8× 30 630
Naotaka Uchitomi Japan 12 473 1.2× 132 0.4× 320 1.0× 158 0.6× 327 1.8× 127 709
C. Ducruet France 16 304 0.8× 218 0.7× 742 2.4× 407 1.4× 307 1.7× 41 862
Shingo Masui Japan 12 284 0.7× 475 1.4× 426 1.4× 121 0.4× 119 0.7× 22 601
J. P. Lascaray France 18 463 1.2× 251 0.8× 583 1.9× 168 0.6× 418 2.3× 58 886
N. Ronchi Belgium 19 1.1k 2.8× 879 2.6× 224 0.7× 370 1.3× 302 1.7× 66 1.2k
Desirée Queren Germany 12 269 0.7× 451 1.4× 408 1.3× 116 0.4× 100 0.6× 21 578
N. Zainal Malaysia 13 206 0.5× 314 0.9× 119 0.4× 190 0.7× 236 1.3× 73 484
C. Monier United States 18 781 2.0× 427 1.3× 504 1.6× 202 0.7× 191 1.1× 71 986
Hiroaki Matsumura Japan 8 409 1.1× 496 1.5× 455 1.5× 112 0.4× 120 0.7× 10 683

Countries citing papers authored by C. Christiansen

Since Specialization
Citations

This map shows the geographic impact of C. Christiansen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Christiansen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Christiansen more than expected).

Fields of papers citing papers by C. Christiansen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Christiansen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Christiansen. The network helps show where C. Christiansen may publish in the future.

Co-authorship network of co-authors of C. Christiansen

This figure shows the co-authorship network connecting the top 25 collaborators of C. Christiansen. A scholar is included among the top collaborators of C. Christiansen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. Christiansen. C. Christiansen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Li, Baozhen, et al.. (2018). Electromigration characteristics of power grid like structures. 4F.3–1. 5 indexed citations
3.
Restrepo, Oscar D., Jeffrey B. Johnson, Mohit Bajaj, et al.. (2018). Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies. 6F.6–1. 10 indexed citations
4.
Shen, Tian, Kong Boon Yeap, C. Christiansen, & Patrick Justison. (2017). Field acceleration factor extraction in MOL and BEOL TDDB. DG–2.1. 5 indexed citations
5.
Nag, Joyeeta, Brian S. Cohen, S. Choi, et al.. (2015). ALD TaN Barrier for Enhanced Performance with Low Contact Resistance for 14nm Technology Node Cu Interconnects. ECS Transactions. 69(7). 161–169. 1 indexed citations
6.
Li, Baozhen, C. Christiansen, & R. G. Filippi. (2014). Variability challenges to electromigration (EM) lifetime projections. 5A.4.1–5A.4.5. 2 indexed citations
7.
Christiansen, C., et al.. (2014). Stress migration in a copper - Aluminum hybrid technology. 2A.1.1–2A.1.5. 1 indexed citations
8.
Li, Baozhen, C. Christiansen, D. Badami, & C.-C. Yang. (2014). Electromigration challenges for advanced on-chip Cu interconnects. Microelectronics Reliability. 54(4). 712–724. 60 indexed citations
9.
Li, Baozhen, et al.. (2013). Short line electromigration characteristics and their applications for circuit design. 3F.2.1–3F.2.5. 7 indexed citations
10.
Li, Baozhen, et al.. (2011). A study of via depletion electromigration with very long failure times. 3E.4.1–3E.4.4. 4 indexed citations
11.
Fischer, A., Oliver Aubel, J. Gill, et al.. (2007). Reliability Challenges in Copper Metallizations arising with the PVD Resputter Liner Engineering for 65nm and Beyond. 511–515. 11 indexed citations
12.
Christiansen, C., et al.. (2006). Via-Depletion Electromigration in Copper Interconnects. IEEE Transactions on Device and Materials Reliability. 6(2). 163–168. 20 indexed citations
13.
Li, Baozhen, et al.. (2006). Application of three-parameter lognormal distribution in EM data analysis. Microelectronics Reliability. 46(12). 2049–2055. 8 indexed citations
14.
Christiansen, C., et al.. (2006). Via-Depletion Electromigration in Copper Interconnects. 22–26. 2 indexed citations
15.
Li, Baozhen, J. Gill, C. Christiansen, Timothy D. Sullivan, & P. McLaughlin. (2005). Impact of via-line contact on CU interconnect electromigration performance. 24–30. 19 indexed citations
16.
Christiansen, C., et al.. (2002). Evidence of Collective Charge Behavior in the Insulating State of Ultrathin Films of Superconducting Metals. Physical Review Letters. 88(3). 37004–37004. 52 indexed citations
17.
Marković, Nina, et al.. (2000). Anomalous hopping exponents of ultrathin metal films. Physical review. B, Condensed matter. 62(3). 2195–2200. 32 indexed citations
18.
Marković, Nina, C. Christiansen, A. M. Mack, William Huber, & A. M. Goldman. (1999). Superconductor-insulator transition in two dimensions. Physical review. B, Condensed matter. 60(6). 4320–4328. 89 indexed citations
19.
Marković, Nina, C. Christiansen, & A. M. Goldman. (1998). Thickness–Magnetic Field Phase Diagram at the Superconductor-Insulator Transition in 2D. Physical Review Letters. 81(23). 5217–5220. 93 indexed citations
20.
Grupp, D. E., et al.. (1997). Anomalous Field Effect in Ultrathin Films of Metals near the Superconductor-Insulator Transition. Physical Review Letters. 78(6). 1130–1133. 60 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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