Bill Ward

830 total citations
11 papers, 633 citations indexed

About

Bill Ward is a scholar working on Surfaces, Coatings and Films, Computational Mechanics and Electrical and Electronic Engineering. According to data from OpenAlex, Bill Ward has authored 11 papers receiving a total of 633 indexed citations (citations by other indexed papers that have themselves been cited), including 9 papers in Surfaces, Coatings and Films, 5 papers in Computational Mechanics and 4 papers in Electrical and Electronic Engineering. Recurrent topics in Bill Ward's work include Electron and X-Ray Spectroscopy Techniques (9 papers), Ion-surface interactions and analysis (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). Bill Ward is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (9 papers), Ion-surface interactions and analysis (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). Bill Ward collaborates with scholars based in United States and Australia. Bill Ward's co-authors include John Notte, N. P. Economou, John Morgan, David C. Shaver, R.M. Percival, Shawn McVey, A. R. Kirkpatrick, C. Michael Garner, David G. Seiler and Alain C. Diebold and has published in prestigious journals such as Microscopy and Microanalysis, Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

In The Last Decade

Bill Ward

11 papers receiving 612 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Bill Ward United States 9 306 275 207 165 153 11 633
Shawn McVey United States 13 327 1.1× 300 1.1× 171 0.8× 150 0.9× 146 1.0× 24 662
Richard H. Livengood United States 13 378 1.2× 321 1.2× 172 0.8× 143 0.9× 146 1.0× 25 584
Tohru Ishitani Japan 16 417 1.4× 460 1.7× 233 1.1× 210 1.3× 128 0.8× 63 797
Vasilisa Veligura Netherlands 9 145 0.5× 195 0.7× 128 0.6× 123 0.7× 69 0.5× 10 369
Э. И. Рау Russia 16 560 1.8× 125 0.5× 527 2.5× 259 1.6× 89 0.6× 100 886
S. Reboh France 16 359 1.2× 73 0.3× 45 0.2× 141 0.9× 68 0.4× 57 528
Derren Dunn United States 14 231 0.8× 76 0.3× 87 0.4× 353 2.1× 51 0.3× 49 676
P.D. Prewett United Kingdom 14 379 1.2× 151 0.5× 64 0.3× 153 0.9× 15 0.1× 43 544
Jakub Zlámal Czechia 13 189 0.6× 38 0.1× 102 0.5× 151 0.9× 49 0.3× 40 455
Marián Maňkoš United States 14 337 1.1× 34 0.1× 242 1.2× 100 0.6× 185 1.2× 45 664

Countries citing papers authored by Bill Ward

Since Specialization
Citations

This map shows the geographic impact of Bill Ward's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bill Ward with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bill Ward more than expected).

Fields of papers citing papers by Bill Ward

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bill Ward. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bill Ward. The network helps show where Bill Ward may publish in the future.

Co-authorship network of co-authors of Bill Ward

This figure shows the co-authorship network connecting the top 25 collaborators of Bill Ward. A scholar is included among the top collaborators of Bill Ward based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bill Ward. Bill Ward is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

11 of 11 papers shown
1.
Sijbrandij, Sybren, et al.. (2008). Elemental analysis with the helium ion microscope. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 26(6). 2103–2106. 20 indexed citations
2.
Notte, John, et al.. (2008). The ALIS He ion source and its application to high resolution microscopy. Physics Procedia. 1(1). 135–141. 43 indexed citations
3.
Joy, David C., Brendan Griffin, John Notte, et al.. (2007). Device metrology with high-performance scanning ion beams. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6518. 65181I–65181I. 4 indexed citations
4.
Economou, N. P., Bill Ward, John Morgan, & John Notte. (2007). Helium Ion Microscopy: an Introduction Development of the Helium Ion Microscope offers the promise of a new and unique imaging technique as an alternative to existing microscopes. 1 indexed citations
5.
Notte, John, Bill Ward, R.M. Percival, et al.. (2007). An Introduction to the Helium Ion Microscope. AIP conference proceedings. 931. 489–496. 54 indexed citations
6.
Morgan, John, et al.. (2006). An Introduction to the Helium Ion Microscope. Microscopy Today. 14(4). 24–31. 98 indexed citations
7.
Notte, John, et al.. (2006). An Introduction to Helium Ion Microscopy. Microscopy and Microanalysis. 12(S02). 126–127. 28 indexed citations
8.
Ward, Bill, John Notte, & N. P. Economou. (2006). Helium ion microscope: A new tool for nanoscale microscopy and metrology. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 24(6). 2871–2874. 330 indexed citations
9.
Kirkpatrick, A. R., Bill Ward, & N. P. Economou. (1989). Focused ion-beam crater arrays for induced nucleation of diamond film. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 7(6). 1947–1949. 19 indexed citations
10.
Economou, N. P., David C. Shaver, & Bill Ward. (1987). Advances In Focused-Ion-Beam Repair Techniques. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 773. 201–201. 9 indexed citations
11.
Shaver, David C. & Bill Ward. (1986). Integrated circuit diagnosis using focused ion beams. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 4(1). 185–188. 27 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026