Bill Ward
- Structural Biology top 1%
- Advanced Electron Microscopy Techniques and Applications 3
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 9
- Computational Mechanics top 5%
- Ion-surface interactions and analysis 5
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- Integrated Circuits and Semiconductor Failure Analysis 4
- Advancements in Photolithography Techniques 1
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- Advanced Materials Characterization Techniques 3
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- Surface and Thin Film Phenomena 2
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- Nuclear Physics and Applications 1
- Co-authors
- John NotteN. P. EconomouJohn MorganDavid C. ShaverR.M. PercivalShawn McVeyA. R. KirkpatrickC. Michael Garner
- Journals
- Microscopy and Microanalysis (1 paper)Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena (2 papers)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (2 papers)
- Partner nations
- United StatesAustralia
In The Last Decade
Bill Ward
11 papers receiving 612 citations
Peers
Comparison fields: 5 of 77
- Structural Biology 153
- Surfaces, Coatings and Films 207
- Computational Mechanics 275
- Electrical and Electronic Engineering 306
- Materials Chemistry 165
Countries citing papers authored by Bill Ward
This map shows the geographic impact of Bill Ward's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bill Ward with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bill Ward more than expected).
Fields of papers citing papers by Bill Ward
This network shows the impact of papers produced by Bill Ward. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bill Ward. The network helps show where Bill Ward may publish in the future.
Co-authorship network
The 18 scholars most cited alongside Bill Ward, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 20 | |
| 2 | 2008 | 43 | |
| 3 | 2007 | 4 | |
| 4 | Helium Ion Microscopy: an Introduction Development of the Helium Ion Microscope offers the promise of a new and unique imaging technique as an alternative to existing microscopes | 2007 | 1 |
| 5 | 2007 | 54 | |
| 6 | 2006 | 98 | |
| 7 | 2006 | 28 | |
| 8 | 2006 | 330 | |
| 9 | 1989 | 19 | |
| 10 | 1987 | 9 | |
| 11 | 1986 | 27 |
About Bill Ward
Bill Ward is a scholar working on Structural Biology, Surfaces, Coatings and Films, Computational Mechanics, Radiation and Electrical and Electronic Engineering, having authored 11 papers that have together received 633 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (9 papers), Ion-surface interactions and analysis (5 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Advanced Materials Characterization Techniques (3 papers), Advanced Electron Microscopy Techniques and Applications (3 papers), Surface and Thin Film Phenomena (2 papers), Advancements in Photolithography Techniques (1 paper) and Nuclear Physics and Applications (1 paper). The work is most often cited by research in Structural Biology (153 citations), Surfaces, Coatings and Films (207 citations), Computational Mechanics (275 citations), Electrical and Electronic Engineering (306 citations) and Materials Chemistry (165 citations). Bill Ward has collaborated with scholars based in United States and Australia. Frequent co-authors include John Notte, N. P. Economou, John Morgan, David C. Shaver, R.M. Percival, Shawn McVey, A. R. Kirkpatrick, C. Michael Garner, David G. Seiler and Alain C. Diebold. Their work appears in journals such as Microscopy and Microanalysis, Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE, Physics Procedia and AIP conference proceedings.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.