Tohru Ishitani
- Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications 14
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 27
- Computational Mechanics top 2%
- Ion-surface interactions and analysis 37
- Radiation top 10%
-
- Integrated Circuits and Semiconductor Failure Analysis 27
- Semiconductor materials and devices 7
- Advancements in Photolithography Techniques 6
-
- Advanced Materials Characterization Techniques 10
-
- Mass Spectrometry Techniques and Applications 7
- Co-authors
- Toshie YaguchiHifumi TamuraTsuyoshi OhnishiRyuichi ShimizuKenji MurataHideki TsuboiK. OhyaS. Shukuri
- Journals
- Japanese Journal of Applied Physics (28 papers)Microscopy and Microanalysis (3 papers)Ultramicroscopy (2 papers)
- Partner nations
- Japan
In The Last Decade
Tohru Ishitani
61 papers receiving 727 citations
Peers
Comparison fields: 5 of 72
- Structural Biology 128
- Surfaces, Coatings and Films 233
- Computational Mechanics 460
- Radiation 75
- Electrical and Electronic Engineering 417
Countries citing papers authored by Tohru Ishitani
This map shows the geographic impact of Tohru Ishitani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tohru Ishitani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tohru Ishitani more than expected).
Fields of papers citing papers by Tohru Ishitani
This network shows the impact of papers produced by Tohru Ishitani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tohru Ishitani. The network helps show where Tohru Ishitani may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Tohru Ishitani, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2009 | 8 | |
| 3 | 2005 | 6 | |
| 4 | 2003 | 8 | |
| 5 | 2002 | 14 | |
| 6 | 2002 | 19 | |
| 7 | 2001 | 5 | |
| 8 | Focused ion beam system for TEM sample preparation | 1996 | 6 |
| 9 | 1996 | 95 | |
| 10 | 1994 | 1 | |
| 11 | 1991 | 8 | |
| 12 | 1990 | 11 | |
| 13 | 1987 | 7 | |
| 14 | 1986 | 4 | |
| 15 | 1983 | 19 | |
| 16 | 1982 | 1 | |
| 17 | 1982 | 2 | |
| 18 | 1975 | 28 | |
| 19 | 1972 | 67 | |
| 20 | 1971 | 8 |
About Tohru Ishitani
Tohru Ishitani is a scholar working on Structural Biology, Surfaces, Coatings and Films, Computational Mechanics, Metals and Alloys and Electrical and Electronic Engineering, having authored 63 papers that have together received 797 indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (37 papers), Electron and X-Ray Spectroscopy Techniques (27 papers), Integrated Circuits and Semiconductor Failure Analysis (27 papers), Advanced Electron Microscopy Techniques and Applications (14 papers), Advanced Materials Characterization Techniques (10 papers), Mass Spectrometry Techniques and Applications (7 papers), Semiconductor materials and devices (7 papers) and Advancements in Photolithography Techniques (6 papers). The work is most often cited by research in Structural Biology (128 citations), Surfaces, Coatings and Films (233 citations), Computational Mechanics (460 citations), Radiation (75 citations) and Electrical and Electronic Engineering (417 citations). Tohru Ishitani has collaborated with scholars based in Japan. Frequent co-authors include Toshie Yaguchi, Hifumi Tamura, Tsuyoshi Ohnishi, Ryuichi Shimizu, Kenji Murata, Hideki Tsuboi, K. Ohya, S. Shukuri, Ryuichi Shimizu and M. Tamura. Their work appears in journals such as Japanese Journal of Applied Physics, Microscopy and Microanalysis, Ultramicroscopy, Analytical Chemistry and Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.