B. Schueler

1.1k total citations
32 papers, 923 citations indexed

About

B. Schueler is a scholar working on Computational Mechanics, Spectroscopy and Analytical Chemistry. According to data from OpenAlex, B. Schueler has authored 32 papers receiving a total of 923 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Computational Mechanics, 17 papers in Spectroscopy and 11 papers in Analytical Chemistry. Recurrent topics in B. Schueler's work include Ion-surface interactions and analysis (26 papers), Mass Spectrometry Techniques and Applications (17 papers) and Analytical chemistry methods development (11 papers). B. Schueler is often cited by papers focused on Ion-surface interactions and analysis (26 papers), Mass Spectrometry Techniques and Applications (17 papers) and Analytical chemistry methods development (11 papers). B. Schueler collaborates with scholars based in Canada, United States and Germany. B. Schueler's co-authors include F. R. Krueger, Werner Ens, Ronald C. Beavis, P. Sander, David Reed, Franz Hillenkamp, K. G. Standing, Robert W. Odom, Xuejun Tang and Yue Kuo and has published in prestigious journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Journal of Chromatography A.

In The Last Decade

B. Schueler

32 papers receiving 812 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
B. Schueler Canada 16 542 516 244 209 150 32 923
Steven J. Pachuta United States 14 283 0.5× 395 0.8× 147 0.6× 213 1.0× 158 1.1× 19 774
J. W. Amy United States 16 383 0.7× 792 1.5× 226 0.9× 229 1.1× 304 2.0× 27 1.4k
W. E. Baitinger United States 16 389 0.7× 619 1.2× 133 0.5× 263 1.3× 339 2.3× 28 1.3k
R. Hill United Kingdom 7 863 1.6× 395 0.8× 140 0.6× 356 1.7× 407 2.7× 7 926
Felicia M. Green United Kingdom 17 564 1.0× 421 0.8× 199 0.8× 236 1.1× 256 1.7× 37 945
John E. Crowell United States 17 264 0.5× 407 0.8× 139 0.6× 449 2.1× 420 2.8× 32 1.2k
Christopher Szakal United States 20 715 1.3× 279 0.5× 129 0.5× 263 1.3× 501 3.3× 35 993
Joseph Kozole United States 16 477 0.9× 352 0.7× 114 0.5× 173 0.8× 241 1.6× 20 709
D. E. Riederer United States 13 262 0.5× 323 0.6× 64 0.3× 201 1.0× 95 0.6× 24 559
Elizabeth J. Judge United States 18 242 0.4× 363 0.7× 232 1.0× 200 1.0× 84 0.6× 39 836

Countries citing papers authored by B. Schueler

Since Specialization
Citations

This map shows the geographic impact of B. Schueler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Schueler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Schueler more than expected).

Fields of papers citing papers by B. Schueler

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Schueler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Schueler. The network helps show where B. Schueler may publish in the future.

Co-authorship network of co-authors of B. Schueler

This figure shows the co-authorship network connecting the top 25 collaborators of B. Schueler. A scholar is included among the top collaborators of B. Schueler based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Schueler. B. Schueler is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kuo, Yue, et al.. (2005). Influence of a 5 A Tantalum Nitride Interface Layer on Dielectric Properties of Zirconium-Doped Tantalum Oxide High-k Films. Journal of The Electrochemical Society. 152(8). G617–G617. 8 indexed citations
2.
Lu, J.X., et al.. (2004). Effects of the TaNx interface layer on doped tantalum oxide high-k films. Vacuum. 74(3-4). 539–547. 9 indexed citations
3.
Schueler, B., Jennifer McKinley, Ian Mowat, et al.. (2002). Surface metal standards produced by ion implantation through a removable layer. Applied Surface Science. 203-204. 847–850. 1 indexed citations
4.
Schueler, B., et al.. (2000). Depth scale distortions in shallow implant secondary ion mass spectrometry profiles. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(1). 496–500. 20 indexed citations
5.
Chu, Paul K., et al.. (1997). Determination of trace metallic impurities on 200-mm silicon wafers by time-of-flight secondary-ion-mass spectroscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 15(6). 1908–1912. 9 indexed citations
6.
Schueler, B., et al.. (1996). Comparison of submicron particle analysis by Auger electron spectroscopy, time-of-flight secondary ion mass spectrometry, and secondary electron microscopy with energy dispersive x-ray spectroscopy. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 14(4). 2392–2404. 21 indexed citations
7.
Schueler, B.. (1992). Microscope imaging by time-of-flight secondary ion mass spectrometry. Microscopy Microanalysis Microstructures. 3(2-3). 119–139. 182 indexed citations
8.
Standing, Kenneth G., Werner Ens, Y. Mao, et al.. (1989). MEASUREMENTS OF ION DISSOCIATION IN A REFLECTING TIME-OF-FLIGHT MASS SPECTROMETER. Le Journal de Physique Colloques. 50(C2). C2–163. 1 indexed citations
9.
Bolbach, Gérard, Ronald C. Beavis, S. Della‐Negra, et al.. (1988). Variation of yield with thickness in SIMS and PDMS: Measurements of secondary ion emission from organized molecular films. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 30(1). 74–82. 33 indexed citations
10.
Standing, Kenneth G., Ronald C. Beavis, Gérard Bolbach, et al.. (1987). Secondary Ion Time-Of-Flight Mass Spectrometers and Data Systems. Instrumentation Science & Technology. 16(1). 173–189. 23 indexed citations
11.
Ens, Werner, et al.. (1987). Redox reactions occurring during secondary ion mass spectrometry of some heteroanthracycline antitumor antibiotic precursors. Journal of Mass Spectrometry. 14(2). 91–96. 13 indexed citations
12.
Schueler, B. & Robert W. Odom. (1987). Nonresonant multiphoton ionization of the neutrals ablated in laser microprobe mass spectrometry analysis of GaAs and Hg0.78Cd0.22Te. Journal of Applied Physics. 61(9). 4652–4661. 26 indexed citations
13.
Odom, Robert W., C. J. Hitzman, & B. Schueler. (1986). Quantitative Materials Analysis by Laser Microprobe Mass Analysis. MRS Proceedings. 69. 4 indexed citations
14.
Beavis, Ronald C., et al.. (1986). Automated dry fraction collection for microbore high-performance liquid chromatography—mass spectrometry. Journal of Chromatography A. 359. 489–497. 7 indexed citations
15.
Krueger, F. R., et al.. (1984). Determination of organic and inorganic compounds in the femtogram range by laser microprobe mass spectrometry. Microchimica Acta. 83(1-2). 85–96. 4 indexed citations
16.
Standing, Kenneth G., Ronald C. Beavis, Werner Ens, & B. Schueler. (1983). Secondary ion mass spectrometry by time-of-flight. International Journal of Mass Spectrometry and Ion Physics. 53. 125–134. 27 indexed citations
17.
Schueler, B., et al.. (1983). Influence of the Static Sample Temperature on the Mass Spectra of Alkali Halides and Metals Obtained with Pulsed Laser Induced Ion Generation. Zeitschrift für Naturforschung A. 38(10). 1078–1083. 5 indexed citations
18.
Schueler, B., et al.. (1983). Kinetics of ion formation from salts by pulsed-laser irradiation. International Journal of Mass Spectrometry and Ion Physics. 47. 3–6. 12 indexed citations
19.
Schueler, B., et al.. (1981). Cationization of organic molecules under pulsed laser induced ion generation. Organic Mass Spectrometry. 16(11). 502–506. 14 indexed citations
20.
Schueler, B. & F. R. Krueger. (1979). Spectra of quaternary ammonium salts taken by fission‐fragment and laser‐induced desorption. Organic Mass Spectrometry. 14(8). 439–441. 55 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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