Ian Mowat

400 total citations
21 papers, 300 citations indexed

About

Ian Mowat is a scholar working on Computational Mechanics, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Ian Mowat has authored 21 papers receiving a total of 300 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Computational Mechanics, 12 papers in Electrical and Electronic Engineering and 5 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Ian Mowat's work include Ion-surface interactions and analysis (13 papers), Force Microscopy Techniques and Applications (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). Ian Mowat is often cited by papers focused on Ion-surface interactions and analysis (13 papers), Force Microscopy Techniques and Applications (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). Ian Mowat collaborates with scholars based in United States, United Kingdom and Canada. Ian Mowat's co-authors include Matthew R. Linford, T.L. Niederhauser, Robert J. Donovan, Robert J. Donovan, Robert R. J. Maier, Robert C. Davis, Yit‐Yian Lua, Velimir Radmilović, Brent A. Wacaser and Guilin Jiang and has published in prestigious journals such as Angewandte Chemie International Edition, Applied Physics Letters and Langmuir.

In The Last Decade

Ian Mowat

20 papers receiving 292 citations

Peers

Countries citing papers authored by Ian Mowat

Since Specialization

Citations

This map shows the geographic impact of Ian Mowat's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ian Mowat with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ian Mowat more than expected).

Fields of papers citing papers by Ian Mowat

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ian Mowat. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ian Mowat. The network helps show where Ian Mowat may publish in the future.

Co-authorship network of co-authors of Ian Mowat

This figure shows the co-authorship network connecting the top 25 collaborators of Ian Mowat. A scholar is included among the top collaborators of Ian Mowat based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ian Mowat. Ian Mowat is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Removal of Trace Elements Using a Biodegradable Complexing Agent 2011 ·EU PVSEC ·(unknown), Matthieu George, D. A. Bohling, Anna Goldstein, (unknown), Ian Mowat, Werner Kern	1
2	Surface Contamination Removal from Si PV Substrates Using A Biodegradable Chelating Agent and Detection of Cleaning Endpoints Using UV/VIS Spectroscopy 2011 ·ECS Transactions ·(unknown), (unknown), D. A. Bohling, A. N. Goldstein, (unknown), (unknown), Ian Mowat, Werner Kern	1
3	Secondary Ion Mass Spectrometry and Time-of-Flight Secondary Ion Mass Spectrometry Study of Impurity Measurements in HgCdTe 2007 ·Journal of Electronic Materials ·Steve Price, Larry Wang, Alice Wang, Arwa S. Ginwalla, Ian Mowat	1
4	Ultrashallow profiling using secondary ion mass spectrometry: Estimating junction depth error using mathematical deconvolution 2006 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·(unknown), (unknown), Ian Mowat	11
5	A study of dynamic SIMS analysis of low-k dielectric materials 2006 ·Applied Surface Science ·Ian Mowat, (unknown), (unknown), (unknown), (unknown), (unknown)	5
6	An improved method for Hg1−xCdxTe surface chemistry characterization 2005 ·Journal of Electronic Materials ·(unknown), (unknown), Ian Mowat, (unknown), (unknown)	3
7	Metal delocalization and surface decoration in direct-write nanolithography by electron beam induced deposition 2004 ·Applied Physics Letters ·(unknown), (unknown), Velimir Radmilović, Ian Mowat	36
8	Chemomechanical surface patterning and functionalization of silicon surfaces using an atomic force microscope 2003 ·Applied Physics Letters ·Brent A. Wacaser, (unknown), Ian Mowat, T.L. Niederhauser, Matthew R. Linford, Robert C. Davis	46
9	Chemomechanical Production of Submicron Edge Width, Functionalized, ∼20 μm Features on Silicon 2002 ·Langmuir ·Yit‐Yian Lua, T.L. Niederhauser, Brent A. Wacaser, Ian Mowat, Adam T. Woolley, Robert C. Davis, Harvey A. Fishman, Matthew R. Linford	11
10	Arrays of Chemomechanically Patterned Patches of Homogeneous and Mixed Monolayers of 1-Alkenes and Alcohols on Single Silicon Surfaces 2002 ·Angewandte Chemie International Edition ·T.L. Niederhauser, Yit‐Yian Lua, Guilin Jiang, (unknown), (unknown), (unknown), Ian Mowat, Matthew R. Linford	40
11	Static Time-of-Flight Secondary Ion Mass Spectrometry of Monolayers on Scribed Silicon Derived from 1-Alkenes, 1-Alkynes, and 1-Haloalkanes 2002 ·Langmuir ·Yit‐Yian Lua, T.L. Niederhauser, (unknown), (unknown), Ian Mowat, Matthew C. Asplund, Matthew R. Linford	15
12	A correlation of TOF-SIMS and TXRF for the analysis of trace metal contamination on silicon and gallium arsenide 2002 ·Applied Surface Science ·Ian Mowat, (unknown), (unknown)	1
13	Arrays of Chemomechanically Patterned Patches of Homogeneous and Mixed Monolayers of 1-Alkenes and Alcohols on Single Silicon Surfaces 2002 ·Angewandte Chemie ·T.L. Niederhauser, Yit‐Yian Lua, Guilin Jiang, (unknown), (unknown), (unknown), Ian Mowat, Matthew R. Linford	1
14	Surface metal standards produced by ion implantation through a removable layer 2002 ·Applied Surface Science ·B. Schueler, (unknown), (unknown), Jennifer McKinley, (unknown), Ian Mowat, (unknown), Stephen P. Smith, F. A. Stevie, Manman Yang	1
15	The effects of radiation on (1,3,5 - triamino - 2,4,6 - trinitrobenzene) TATB studied by time-of-flight secondary ion mass spectrometry 2001 ·Journal of Energetic Materials ·J. W. McDonald, T. Schenkel, (unknown), George E. Overturf, (unknown), Thomas Niedermayr, A. V. Barnes, Dieter Schneider, Ian Mowat, A. V. Hamza	11
16	Matrix assisted laser desorption/ionization mass spectrometry of aryl ester dendrimers 1998 ·European Journal of Mass Spectrometry ·Ian Mowat, Robert J. Donovan, (unknown), W. James Feast, (unknown)	14
17	Process Control for Optimal PCR Performance in Glass Microstructures 1998 ·Biomedical Microdevices ·(unknown), (unknown), Michael Albin, (unknown), Yuebin Ning, Ian Mowat, (unknown), E. Principe	23
18	Evaluation of Single Semiconductor Defects Using Multiple Microanalysis Techniques 1998 ·MRS Proceedings ·Patrick Kinney, (unknown), (unknown), R. Savoy, Ian Mowat, (unknown)	0
19	Enhanced Cationization of Polymers Using Delayed Ion Extraction with Matrix-assisted Laser Desorption/Ionization 1997 ·Rapid Communications in Mass Spectrometry ·Ian Mowat, Robert J. Donovan, Robert R. J. Maier	34
20	Metal‐ion attachment to non‐polar polymers during laser desorption/ionization at 337 nm 1995 ·Rapid Communications in Mass Spectrometry ·Ian Mowat, Robert J. Donovan	24

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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