Robert W. Odom

1.0k total citations
40 papers, 822 citations indexed

About

Robert W. Odom is a scholar working on Computational Mechanics, Spectroscopy and Analytical Chemistry. According to data from OpenAlex, Robert W. Odom has authored 40 papers receiving a total of 822 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Computational Mechanics, 18 papers in Spectroscopy and 14 papers in Analytical Chemistry. Recurrent topics in Robert W. Odom's work include Ion-surface interactions and analysis (20 papers), Mass Spectrometry Techniques and Applications (17 papers) and Analytical chemistry methods development (14 papers). Robert W. Odom is often cited by papers focused on Ion-surface interactions and analysis (20 papers), Mass Spectrometry Techniques and Applications (17 papers) and Analytical chemistry methods development (14 papers). Robert W. Odom collaborates with scholars based in United States, France and Netherlands. Robert W. Odom's co-authors include Kuang Jen Wu, David L. Smith, J. H. Futrell, B. Schueler, F. Radicati di Brozolo, Constance M. John, A. Inam, Mark Croft, T. Venkatesan and Y. Jeon and has published in prestigious journals such as The Journal of Chemical Physics, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Robert W. Odom

39 papers receiving 753 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Robert W. Odom United States	15	358	302	196	184	162	40	822
J. J. DeCorpo United States	15	363 1.0×	303 1.0×	362 1.8×	109 0.6×	163 1.0×	41	881
R. L. Woodin United States	14	462 1.3×	95 0.3×	439 2.2×	206 1.1×	335 2.1×	37	1.1k
R. L. Hines United States	13	1.0k 2.9×	430 1.4×	155 0.8×	460 2.5×	194 1.2×	32	1.5k
Ichiro Kanomata Japan	15	254 0.7×	126 0.4×	243 1.2×	408 2.2×	107 0.7×	41	823
H. Schaber Germany	18	238 0.7×	170 0.6×	723 3.7×	197 1.1×	606 3.7×	31	1.3k
David A. Weil United States	18	477 1.3×	139 0.5×	278 1.4×	31 0.2×	79 0.5×	34	892
Michael J. Bogan United States	21	185 0.5×	90 0.3×	206 1.1×	148 0.8×	236 1.5×	42	1.3k
Michael Rappaport Israel	16	499 1.4×	218 0.7×	517 2.6×	168 0.9×	88 0.5×	29	951
P. D. Brewer United States	15	277 0.8×	91 0.3×	488 2.5×	430 2.3×	137 0.8×	53	823
Ramona S. Taylor United States	13	105 0.3×	137 0.5×	341 1.7×	64 0.3×	170 1.0×	18	715

Countries citing papers authored by Robert W. Odom

Since Specialization

Citations

This map shows the geographic impact of Robert W. Odom's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Robert W. Odom with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Robert W. Odom more than expected).

Fields of papers citing papers by Robert W. Odom

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Robert W. Odom. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Robert W. Odom. The network helps show where Robert W. Odom may publish in the future.

Co-authorship network of co-authors of Robert W. Odom

This figure shows the co-authorship network connecting the top 25 collaborators of Robert W. Odom. A scholar is included among the top collaborators of Robert W. Odom based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Robert W. Odom. Robert W. Odom is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Schenkel, T., A. V. Hamza, A. V. Barnes, et al.. (1999). Surface Analysis by Highly Charged Ion Based Secondary Ion Mass Spectrometry. Physica Scripta. T80(A). 73–73. 14 indexed citations

Wu, Kuang Jen & Robert W. Odom. (1998). Peer Reviewed: Characterizing Synthetic Polymers by MALDI MS. Analytical Chemistry. 70(13). 456A–461A. 74 indexed citations

Baniecki, J. D., Q.Y. Ma, Robert W. Odom, et al.. (1997). Diffusion and gettering of implanted ions in YBCO films. IEEE Transactions on Applied Superconductivity. 7(2). 2150–2152. 1 indexed citations

John, Constance M. & Robert W. Odom. (1997). Static secondary ion mass spectrometry (SSIMS) of biological compounds in tissue and tissue-like matrices. International Journal of Mass Spectrometry and Ion Processes. 161(1-3). 47–67. 18 indexed citations

Baniecki, J. D., et al.. (1996). Observation of ion gettering effects in high-temperature superconducting oxide material. Applied Physics Letters. 69(11). 1629–1630. 2 indexed citations

Odom, Robert W. & M.L. Grossbeck. (1996). In-depth and ion image analysis of minor and trace constituents in V–Cr–Ti alloy welds. Journal of materials research/Pratt's guide to venture capital sources. 11(8). 1923–1933. 1 indexed citations

John, Constance M., et al.. (1995). XPS and TOF-SIMS Microanalysis of a Peptide/Polymer Drug Delivery Device. Analytical Chemistry. 67(21). 3871–3878. 14 indexed citations

Odom, Robert W., et al.. (1995). In situ analysis of organic monolayers and their reactivity on single micrometer-sized particles by time-of-flight secondary ion mass spectrometry. International Journal of Mass Spectrometry and Ion Processes. 143. 87–111. 6 indexed citations

Odom, Robert W., et al.. (1995). Direct Surface Analysis of Organic Contamination for Semiconductor Related Materials. MRS Proceedings. 386. 11 indexed citations

10.

Odom, Robert W., et al.. (1994). Surface Analysis Of Lcd Materials iN Various Stages of Production by Time-of-Flight Secondary Ion Mass Spectroscopy (TOF-SIMS). MRS Proceedings. 345. 2 indexed citations

11.

Chia, Victor K. F., et al.. (1991). Microvolume-secondary ion mass spectrometry analysis of nonvolatile sulfur residues in semiconductor process solutions. Applied Physics Letters. 59(20). 2567–2569. 2 indexed citations

12.

Odom, Robert W., et al.. (1990). Nondestructive imaging detectors for energetic particle beams. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 44(4). 465–472. 3 indexed citations

13.

Harrington, Peter de B., et al.. (1989). A rule-building expert system for classification of mass spectra. Analytical Chemistry. 61(7). 715–719. 45 indexed citations

14.

Venkatesan, T., X. D. Wu, A. Inam, et al.. (1988). Nature of the pulsed laser process for the deposition of high T c superconducting thin films. Applied Physics Letters. 53(15). 1431–1433. 116 indexed citations

15.

Odom, Robert W., C. J. Hitzman, & B. Schueler. (1986). Quantitative Materials Analysis by Laser Microprobe Mass Analysis. MRS Proceedings. 69. 4 indexed citations

16.

Odom, Robert W., et al.. (1978). Collision-induced formation of positive and negative ions from diatomic and triatomic negative hydrogen ions. The Journal of Chemical Physics. 68(4). 1489–1498. 7 indexed citations

17.

Odom, Robert W., et al.. (1977). Quasimolecular state interference effects inK+-Ar inelastic collisions. Physical review. A, General physics. 15(4). 1414–1422. 3 indexed citations

18.

Fournier, P. G., et al.. (1976). A new test of translational spectroscopy: The rotational predissociation of the X 1Σ state of HeH+. Chemical Physics Letters. 40(1). 170–174. 17 indexed citations

19.

Odom, Robert W., David L. Smith, & J. H. Futrell. (1975). A study of electron attachment to SF₆and auto-detachment and stabilization of SF₆^-. Journal of Physics B Atomic and Molecular Physics. 8(8). 1349–1366. 70 indexed citations

20.

Odom, Robert W., David L. Smith, & J. H. Futrell. (1974). A new measurement of the SF−6 autoionization lifetime. Chemical Physics Letters. 24(2). 227–230. 16 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact