B. J. Mrstik

1.4k citations

43 papers · 1.1k indexed · h-index 17

Electrical and Electronic Engineering top 5%
Materials Chemistry top 10%
Atomic and Molecular Physics, and Optics top 10%
Surfaces, Coatings and Films top 5%
Computational Mechanics top 10%

Co-authors: Robert E. Stahlbush R.K. Lawrence P. J. McMarr S. Y. Tong R. W. Rendell H.L. Hughes M.A. Van Hove David L. Griscom
Topics: Semiconductor materials and devices (29 papers)Advancements in Semiconductor Devices and Circuit Design (13 papers)Silicon Nanostructures and Photoluminescence (12 papers)
Cited by: Electrical and Electronic Engineering Surfaces, Coatings and Films Materials Chemistry
Journals: Physical review. B, Condensed matter Applied Physics Letters Journal of Applied Physics
Partner nations: United States Belgium China

In The Last Decade

B. J. Mrstik

41 papers receiving 1.1k citations

Peers

Countries citing papers authored by B. J. Mrstik

Since Specialization

Citations

This map shows the geographic impact of B. J. Mrstik's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. J. Mrstik with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. J. Mrstik more than expected).

Fields of papers citing papers by B. J. Mrstik

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. J. Mrstik. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. J. Mrstik. The network helps show where B. J. Mrstik may publish in the future.

Co-authorship network of co-authors of B. J. Mrstik

This figure shows the co-authorship network connecting the top 25 collaborators of B. J. Mrstik. A scholar is included among the top collaborators of B. J. Mrstik based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. J. Mrstik. B. J. Mrstik is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Positive charge trapping in SOI materials 2002 ·R.K. Lawrence,B. J. Mrstik,H.L. Hughes,P. J. McMarr,M.J. Anc	1
2	Relationship between oxide density and charge trapping in SiO2 films 1999 ·Journal of Applied Physics ·B. J. Mrstik,V. V. Afanas’ev,A. Stesmans,P. J. McMarr,R.K. Lawrence	46
3	Relationship between hole trapping and oxide density in thermally grown SiO2 1999 ·Microelectronic Engineering ·B. J. Mrstik,V. V. Afanas’ev,A. Stesmans,P. J. McMarr	2
4	A study of the radiation sensitivity of non-crystalline SiO/sub 2/ films using spectroscopic ellipsometry 1998 ·IEEE Transactions on Nuclear Science ·B. J. Mrstik,P. J. McMarr,R.K. Lawrence,H.L. Hughes	9
5	Radiation induced charge in SIMOX buried oxides: lack of thickness dependence at low applied fields 1997 ·IEEE Transactions on Nuclear Science ·R.K. Lawrence,B. J. Mrstik,H.L. Hughes,P. J. McMarr	13
6	Dependence of radiation induced buried oxide charge on silicon-on-insulator fabrication technology 1996 ·IEEE Transactions on Nuclear Science ·R.K. Lawrence,B. J. Mrstik,H.L. Hughes,P. J. McMarr	6
7	Improvement in electrical properties of buried SiO2 layers by high-temperature oxidation 1995 ·Applied Physics Letters ·B. J. Mrstik,P. J. McMarr,H.L. Hughes,M.J. Anc,W. Krull	5
8	Charge trapping versus buried oxide thickness for SIMOX structures 1995 ·IEEE Transactions on Nuclear Science ·R.K. Lawrence,Dimitris E. Ioannou,H.L. Hughes,P. J. McMarr,B. J. Mrstik	7
9	Relationship between radiation response and density of buried oxide in separation-by-implantation-of-oxygen material 1994 ·Applied Physics Letters ·B. J. Mrstik,P. J. McMarr,R.K. Lawrence	4
10	Post-irradiation cracking of H2 and formation of interface states in irradiated metal-oxide-semiconductor field-effect transistors 1993 ·Journal of Applied Physics ·Robert E. Stahlbush,Arthur H. Edwards,David L. Griscom,B. J. Mrstik	147
11	Si-SiO/sub 2/ interface state generation during X-ray irradiation and during post-irradiation exposure to a hydrogen ambient (MOSFET) 1991 ·IEEE Transactions on Nuclear Science ·B. J. Mrstik,R. W. Rendell	60
12	Measurement of the Thickness and Optical Properties of Thermal Oxides of Si Using Spectroscopic Ellipsometry and Stylus Profilometry 1991 ·Journal of The Electrochemical Society ·B. J. Mrstik,P. J. McMarr,(unknown),J. M. Bennett	15
13	A study of Si implanted with oxygen using spectroscopic ellipsometry 1990 ·Journal of Applied Physics ·P. J. McMarr,B. J. Mrstik,(unknown),(unknown),(unknown)	51
14	Structural and Strain‐Related Effects during Growth of SiO2 Films on Silicon 1987 ·Journal of The Electrochemical Society ·B. J. Mrstik,A. G. Revesz,Mario G. Ancona,H.L. Hughes	42
15	The Implantation Of MeV Er Into Si 1985 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·H.B. Dietrich,P. B. Klein,B. J. Mrstik,David C. Ingram	6
16	GROWTH AND STRUCTURE OF NONCRYSTALLINE SiO₂ FILMS ON SILICON 1985 ·Le Journal de Physique Colloques ·A. G. Revesz,B. J. Mrstik,H.L. Hughes	0
17	Surface bond angle and bond lengths of rearranged As and Ga atoms on GaAs(110) 1978 ·Physical review. B, Condensed matter ·S. Y. Tong,A. R. Lubinsky,B. J. Mrstik,M.A. Van Hove	141
18	Determination of the surface structure of layered compounds by low-energy electron diffraction 1977 ·Il Nuovo cimento della Società italiana di fisica. B/Il Nuovo cimento B ·B. J. Mrstik,R. Kaplan,T. L. Reinecke,(unknown),S. Y. Tong	17
19	Abstract: Surface structure determination of the layered compounds MoS2 and NbSe2 by the dynamical LEED approach 1976 ·Journal of Vacuum Science and Technology ·S. Y. Tong,(unknown),B. J. Mrstik,R. Kaplan,T. L. Reinecke	2
20	Accurate interpretation of LEED intensity spectra of a layered transition-metal dichalcogenide compound 1975 ·Solid State Communications ·B. J. Mrstik,S. Y. Tong,R. Kaplan,A. K. Ganguly	14

About B. J. Mrstik

B. J. Mrstik is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films, having authored 43 papers that have together received 1.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (29 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers) and Silicon Nanostructures and Photoluminescence (12 papers). The work is most often cited by research in Electrical and Electronic Engineering (891 citations), Surfaces, Coatings and Films (97 citations) and Materials Chemistry (418 citations). B. J. Mrstik has collaborated with scholars based in United States, Belgium and China. Frequent co-authors include Robert E. Stahlbush, R.K. Lawrence, P. J. McMarr, S. Y. Tong, R. W. Rendell, H.L. Hughes, M.A. Van Hove, David L. Griscom, Arthur H. Edwards and A. R. Lubinsky. Their work appears in journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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