B. Gruzza

402 total citations
31 papers, 347 citations indexed

About

B. Gruzza is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, B. Gruzza has authored 31 papers receiving a total of 347 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 17 papers in Atomic and Molecular Physics, and Optics and 13 papers in Surfaces, Coatings and Films. Recurrent topics in B. Gruzza's work include Semiconductor materials and devices (20 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Surface and Thin Film Phenomena (10 papers). B. Gruzza is often cited by papers focused on Semiconductor materials and devices (20 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Surface and Thin Film Phenomena (10 papers). B. Gruzza collaborates with scholars based in France, Hungary and Czechia. B. Gruzza's co-authors include L. Bideux, E. Gillet, Vladimı́r Matolín, C. Robert‐Goumet, György Gergely, Guillaume Monier, M. Menyhárd, Matthieu Petit, Damien Chaudanson and François Réveret and has published in prestigious journals such as The Journal of Physical Chemistry C, Applied Surface Science and Surface Science.

In The Last Decade

B. Gruzza

30 papers receiving 338 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
B. Gruzza France 11 221 131 118 107 65 31 347
R. Keyse United Kingdom 8 108 0.5× 72 0.5× 181 1.5× 108 1.0× 29 0.4× 15 351
A. J. McGibbon United States 9 150 0.7× 166 1.3× 277 2.3× 138 1.3× 81 1.2× 23 515
S.D. Foulias Greece 13 125 0.6× 162 1.2× 240 2.0× 77 0.7× 24 0.4× 35 367
Claudio Fava Italy 9 151 0.7× 97 0.7× 161 1.4× 66 0.6× 37 0.6× 21 355
K. Sumitani Japan 9 122 0.6× 139 1.1× 142 1.2× 28 0.3× 108 1.7× 34 349
F. Vergand France 11 121 0.5× 110 0.8× 128 1.1× 104 1.0× 17 0.3× 37 322
D. Vlachos Greece 12 177 0.8× 101 0.8× 288 2.4× 65 0.6× 40 0.6× 35 402
Tomohisa Kitano Japan 12 192 0.9× 76 0.6× 164 1.4× 25 0.2× 41 0.6× 24 328
L.S. Caputi Italy 13 134 0.6× 222 1.7× 190 1.6× 173 1.6× 14 0.2× 25 408
P. Y. Yu United States 10 212 1.0× 226 1.7× 181 1.5× 32 0.3× 79 1.2× 19 398

Countries citing papers authored by B. Gruzza

Since Specialization
Citations

This map shows the geographic impact of B. Gruzza's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Gruzza with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Gruzza more than expected).

Fields of papers citing papers by B. Gruzza

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Gruzza. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Gruzza. The network helps show where B. Gruzza may publish in the future.

Co-authorship network of co-authors of B. Gruzza

This figure shows the co-authorship network connecting the top 25 collaborators of B. Gruzza. A scholar is included among the top collaborators of B. Gruzza based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Gruzza. B. Gruzza is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Maaref, Hassen, et al.. (2019). The effect of nitridation on the optical properties of InAs quantum dots grown on GaAs substrate by MBE. Vacuum. 172. 109097–109097. 2 indexed citations
2.
Monier, Guillaume, C. Robert‐Goumet, François Réveret, et al.. (2016). Synthesis and Study of Stable and Size-Controlled ZnO–SiO2 Quantum Dots: Application as a Humidity Sensor. The Journal of Physical Chemistry C. 120(21). 11652–11662. 59 indexed citations
3.
Monier, Guillaume, et al.. (2015). XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure. Applied Surface Science. 357. 1268–1273. 7 indexed citations
4.
Monier, Guillaume, et al.. (2014). New method for the determination of the correction function of a hemisperical electron analyser based on elastic electron images. Journal of Electron Spectroscopy and Related Phenomena. 197. 80–87. 13 indexed citations
5.
Robert‐Goumet, C., Guillaume Monier, L. Bideux, et al.. (2013). Development of Monte-Carlo simulations for nano-patterning surfaces associated with MM-EPES analysis. Surface Science. 618. 72–77. 2 indexed citations
6.
Mostefaoui, Mohammed, et al.. (2011). Study of the Characteristics Current–Voltage and Capacity–Voltage of Hg/GaN/GaAs Structures. Sensor Letters. 9(6). 2268–2271. 4 indexed citations
7.
Bideux, L., D. Bača, B. Gruzza, Vladimı́r Matolín, & C. Robert‐Goumet. (2004). Surface modification of GaAs during argon ionic cleaning and nitridation: EELS, EPES and XPS studies. Surface Science. 566-568. 1158–1162. 8 indexed citations
8.
Matolín, Vladimı́r, et al.. (2004). Experimental system for GaN thin films growth and in situ characterisation by electron spectroscopic methods. Vacuum. 76(4). 471–476. 27 indexed citations
9.
Petit, Matthieu, et al.. (2004). Auger electronic spectroscopy and electrical characterisation of InP(100) surfaces passivated by N2 plasma. Applied Surface Science. 234(1-4). 451–456. 4 indexed citations
10.
Adamowicz, B., et al.. (2003). Rigorous analysis of the electronic properties of InP interfaces for gas sensing. Thin Solid Films. 436(1). 101–106. 3 indexed citations
11.
Petit, Matthieu, et al.. (2003). First stages of the InP(1 0 0) surfaces nitridation studied by AES, EELS and EPES. Applied Surface Science. 212-213. 601–606. 8 indexed citations
12.
Gruzza, B., et al.. (2003). EPES applied to the study of gold/alumina interfaces. Applied Surface Science. 212-213. 667–673. 4 indexed citations
13.
Gruzza, B., et al.. (2002). Study and characterization of the structures Au/Al2O3/Si and Au/Al0/Al2O3/Si. Vacuum. 67(1). 125–129. 6 indexed citations
14.
Gergely, György, M. Menyhárd, J. Adam, et al.. (2002). Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter. Surface and Interface Analysis. 34(1). 206–210. 19 indexed citations
15.
Sulyok, A., M. Menyhárd, J. Tóth, et al.. (1999). Experimental determination of the inelastic mean free path of electrons in GaSb and InSb. Applied Surface Science. 144-145. 173–177. 8 indexed citations
16.
Bideux, L., B. Gruzza, T. Lohner, et al.. (1998). Spectroellipsometry and electron spectroscopy of porous Si thin films on p+ substrates. Thin Solid Films. 317(1-2). 210–213.
17.
18.
19.
Bideux, L., B. Gruzza, A. L. Porte, & H. Robert. (1993). Structural and electrical study of 〈Au/InP(100)〉 and 〈Au/InSb/InP(100)〉 systems. Surface and Interface Analysis. 20(9). 803–807. 15 indexed citations
20.
Sulyok, A., György Gergely, & B. Gruzza. (1992). Spectrometer corrections for a retarding field analyser used for elastic peak electron spectroscopy and auger electron spectroscopy. Acta physica Hungarica. 72(1). 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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