F. Vergand
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 15
-
- X-ray Spectroscopy and Fluorescence Analysis 8
- Co-authors
- C. BonnellePhilippe JonnardPierre-François StaubE. GilletMarie FontaineJ. M. AndréDaniel D. LaPorteJ.F. Tempère
- Journals
- Surface Science (4 papers)Journal of Physics Condensed Matter (3 papers)Solid State Communications (2 papers)Journal of Applied Physics (2 papers)Review of Scientific Instruments (2 papers)
- Partner nations
- FranceNetherlandsPoland
In The Last Decade
F. Vergand
36 papers receiving 306 citations
Peers
Comparison fields: 5 of 37
- Surfaces, Coatings and Films 104
- Radiation 53
- Atomic and Molecular Physics, and Optics 110
- Catalysis 24
- Materials Chemistry 128
Countries citing papers authored by F. Vergand
This map shows the geographic impact of F. Vergand's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Vergand with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Vergand more than expected).
Fields of papers citing papers by F. Vergand
This network shows the impact of papers produced by F. Vergand. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Vergand. The network helps show where F. Vergand may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Vergand, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 4 | |
| 2 | 1998 | 17 | |
| 3 | 1997 | 1 | |
| 4 | 1997 | 2 | |
| 5 | 1996 | 12 | |
| 6 | 1994 | 3 | |
| 7 | 1993 | 3 | |
| 8 | 1992 | 21 | |
| 9 | 1989 | 2 | |
| 10 | 1989 | 10 | |
| 11 | 1989 | 10 | |
| 12 | 1989 | 4 | |
| 13 | 1988 | 2 | |
| 14 | 1987 | 1 | |
| 15 | 1987 | 7 | |
| 16 | 1987 | 2 | |
| 17 | 1986 | 3 | |
| 18 | 1981 | 9 | |
| 19 | 1975 | 11 | |
| 20 | 1966 | 5 |
About F. Vergand
F. Vergand is a scholar working on Surfaces, Coatings and Films, Radiation, Atomic and Molecular Physics, and Optics, Ceramics and Composites and Materials Chemistry, having authored 37 papers that have together received 322 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (15 papers), Surface and Thin Film Phenomena (10 papers), X-ray Spectroscopy and Fluorescence Analysis (8 papers), Semiconductor materials and devices (8 papers), Advanced Chemical Physics Studies (6 papers), Semiconductor materials and interfaces (4 papers), nanoparticles nucleation surface interactions (3 papers) and Electronic and Structural Properties of Oxides (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (104 citations), Radiation (53 citations), Atomic and Molecular Physics, and Optics (110 citations), Catalysis (24 citations) and Materials Chemistry (128 citations). F. Vergand has collaborated with scholars based in France, Netherlands and Poland. Frequent co-authors include C. Bonnelle, Philippe Jonnard, Pierre-François Staub, E. Gillet, Marie Fontaine, J. M. André, Daniel D. LaPorte, J.F. Tempère, H. Roulet and G. Dufour. Their work appears in journals such as Surface Science, Journal of Physics Condensed Matter, Solid State Communications, Journal of Applied Physics and Review of Scientific Instruments.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.