D. Vlachos

477 citations
35 papers · 402 indexed · h-index 12

D. Vlachos

33 papers receiving 393 citations

Peers

D. Vlachos
Comparison fields: 5 of 44
  • Surfaces, Coatings and Films 65
  • Materials Chemistry 288
  • Structural Biology 5
  • Condensed Matter Physics 40
  • Atomic and Molecular Physics, and Optics 101
Replace N. Franco with:
N. Franco Germany
A. J. Leyendecker United States
T.-L. Lee France
A. Ramstad Norway
K. Nakatsuji Japan
L. J. Holleboom Sweden
S. Di Nardo Italy
B. Cord Germany
C. Koitzsch Switzerland
C. Bandis United States
D. Vlachos relative to N. Franco Germany N. Franco's profile →
Citations per field
00.5×3.7×
N. Franco · 1×
Citations per year

Countries citing papers authored by D. Vlachos

Since Specialization
Citations

This map shows the geographic impact of D. Vlachos's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Vlachos with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Vlachos more than expected).

Fields of papers citing papers by D. Vlachos

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Vlachos. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Vlachos. The network helps show where D. Vlachos may publish in the future.

Co-authorship network

The 25 scholars most cited alongside D. Vlachos, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D. Vlachos Line = papers co-authored together D. Vlachos links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20123
2 20121
3 201015
4 20093
5 200522
6 20054
7 20057
8 20049
9 200315
10 20037
11 200221
12 20024
13 200118
14 19984
15 19958
16 199436
17 199424
18 19934
19 199213
20 199210

About D. Vlachos

D. Vlachos is a scholar working on Surfaces, Coatings and Films, Radiation, Materials Chemistry, Atomic and Molecular Physics, and Optics and General Materials Science, having authored 35 papers that have together received 402 indexed citations. Recurring topics across this work include Electronic and Structural Properties of Oxides (16 papers), Electron and X-Ray Spectroscopy Techniques (14 papers), Semiconductor materials and devices (13 papers), Surface and Thin Film Phenomena (6 papers), Advanced Chemical Physics Studies (6 papers), Ion-surface interactions and analysis (5 papers), X-ray Spectroscopy and Fluorescence Analysis (5 papers) and Semiconductor materials and interfaces (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (65 citations), Materials Chemistry (288 citations), Structural Biology (5 citations), Condensed Matter Physics (40 citations) and Atomic and Molecular Physics, and Optics (101 citations). D. Vlachos has collaborated with scholars based in Greece, United Kingdom and Germany. Frequent co-authors include M. Kamaratos, David W. McComb, C.A. Papageorgopoulos, S.D. Foulias, A. J. Craven, S. Ostanin, Michael W. Finnis, A. T. Paxton, A. Alavi and S. Kennou. Their work appears in journals such as Journal of Physics Condensed Matter, Surface Science, Physical review. B, Condensed matter, Surface Review and Letters and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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