Mariusz Sochacki
Impact in
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- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and devices
- Silicon and Solar Cell Technologies
- Integrated Circuits and Semiconductor Failure Analysis
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- Semiconductor materials and interfaces
Papers in
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- Silicon Carbide Semiconductor Technologies 37
- Semiconductor materials and devices 26
- Silicon and Solar Cell Technologies 6
- Integrated Circuits and Semiconductor Failure Analysis 3
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- Semiconductor materials and interfaces 19
Mariusz Sochacki
43 papers receiving 420 citations
Peers
Comparison fields: 5 of 45
- Electrical and Electronic Engineering 366
- Atomic and Molecular Physics, and Optics 167
- Condensed Matter Physics 48
- Ceramics and Composites 22
- Electronic, Optical and Magnetic Materials 58
Countries citing papers authored by Mariusz Sochacki
This map shows the geographic impact of Mariusz Sochacki's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mariusz Sochacki with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mariusz Sochacki more than expected).
Fields of papers citing papers by Mariusz Sochacki
This network shows the impact of papers produced by Mariusz Sochacki. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mariusz Sochacki. The network helps show where Mariusz Sochacki may publish in the future.
Co-authors
The 25 scholars most cited alongside Mariusz Sochacki, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2024 | 3 | |
| 3 | 2020 | 1 | |
| 4 | 2020 | 0 | |
| 5 | 2020 | 2 | |
| 6 | 2019 | 4 | |
| 7 | 2016 | 4 | |
| 8 | 2015 | 16 | |
| 9 | Charge pumping characterization of MISFETs with SiO2/BaTiO3 as a gate stack | 2014 | 0 |
| 10 | 2014 | 3 | |
| 11 | 2013 | 2 | |
| 12 | 2013 | 3 | |
| 13 | Symulacje i modelowanie tranzystorów HEMT AlGaN/GaN : wpływ przewodności cieplnej podłoża | 2012 | 0 |
| 14 | 2012 | 5 | |
| 15 | Wytwarzanie i charakteryzacja cienkich warstw tlenku hafnu dla zastosowań w technologii MOSFET w węgliku krzemu | 2011 | 1 |
| 16 | Optymalizacja konstrukcji i modelowanie tranzystora RESURF LJFET w 4H-SiC | 2009 | 0 |
| 17 | 2009 | 3 | |
| 18 | Symulacje elektryczne diod Schottky'ego oraz tranzystorów RESURF JFET i RESURF MOSFET na podłożach z węglika krzemu (SiC) | 2008 | 1 |
| 19 | 2003 | 4 | |
| 20 | 2002 | 13 |
About Mariusz Sochacki
Mariusz Sochacki is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electronic, Optical and Magnetic Materials and Bioengineering, having authored 50 papers that have together received 440 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (37 papers), Semiconductor materials and devices (26 papers), Semiconductor materials and interfaces (19 papers), GaN-based semiconductor devices and materials (6 papers), Copper Interconnects and Reliability (6 papers), Silicon and Solar Cell Technologies (6 papers), ZnO doping and properties (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (366 citations), Atomic and Molecular Physics, and Optics (167 citations), Condensed Matter Physics (48 citations), Ceramics and Composites (22 citations) and Electronic, Optical and Magnetic Materials (58 citations). Mariusz Sochacki has collaborated with scholars based in Poland, Canada and Sweden. Frequent co-authors include J. Szmidt, Andrzej Taube, M. Guziewicz, E. Kamińska, Sylwia Gierałtowska, Ł. Wachnicki, A. Piotrowska, M. Borecki, M. Godlewski and Michael L. Korwin-Pawlowski. Their work appears in journals such as Materials Science and Engineering B, Solid-State Electronics, Materials, Applied Surface Science and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.