J. Vancea

1.5k total citations
40 papers, 1.3k citations indexed

About

J. Vancea is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, J. Vancea has authored 40 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Atomic and Molecular Physics, and Optics, 27 papers in Electrical and Electronic Engineering and 19 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in J. Vancea's work include Copper Interconnects and Reliability (19 papers), Surface and Thin Film Phenomena (18 papers) and Semiconductor materials and devices (18 papers). J. Vancea is often cited by papers focused on Copper Interconnects and Reliability (19 papers), Surface and Thin Film Phenomena (18 papers) and Semiconductor materials and devices (18 papers). J. Vancea collaborates with scholars based in Germany, Switzerland and China. J. Vancea's co-authors include Horst Hoffmann, G. Reiß, H. Hoffmann, H. Hoffmann, Fabian Schneider, K. Kastner, Alexander Olbrich, Franz Kreupl, H. Brückl and H. Gräf and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

J. Vancea

40 papers receiving 1.3k citations

Peers

Countries citing papers authored by J. Vancea

Since Specialization

Citations

This map shows the geographic impact of J. Vancea's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Vancea with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Vancea more than expected).

Fields of papers citing papers by J. Vancea

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Vancea. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Vancea. The network helps show where J. Vancea may publish in the future.

Co-authorship network of co-authors of J. Vancea

This figure shows the co-authorship network connecting the top 25 collaborators of J. Vancea. A scholar is included among the top collaborators of J. Vancea based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Vancea. J. Vancea is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Conductivity of multiwall carbon nanotubes: Role of multiple shells and defects 2010 ·Physical Review B ·(unknown), J. Vancea, C. H. Back	13
2	Ballistic electron magnetic microscopy on epitaxial spin valves 2007 ·Physical Review B ·(unknown), J. Vancea, C. H. Back	5
3	Influence of the incident angle of energetic carbon ions on the properties of tetrahedral amorphous carbon (ta-C) films 2003 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·Dongping Liu, Günther Benstetter, (unknown), J. Vancea	29
4	Oxide thickness mapping of ultrathin Al2O3 at nanometer scale with conducting atomic force microscopy 2001 ·Applied Physics Letters ·Alexander Olbrich, B. Ebersberger, Christian Boit, J. Vancea, Horst Hoffmann, Hans Altmann, G. Gieres, J. Wecker	22
5	A new AFM-based tool for testing dielectric quality and reliability on a nanometer scale 1999 ·Microelectronics Reliability ·Alexander Olbrich, B. Ebersberger, Christian Boit, J. Vancea, (unknown)	7
6	The origin of the integral barrier height in inhomogeneous Au/Co/GaAs67P33-Schottky contacts: A ballistic electron emission microscopy study 1998 ·Journal of Applied Physics ·Alexander Olbrich, J. Vancea, Franz Kreupl, Horst Hoffmann	43
7	Potential pinch-off effect in inhomogeneous Au/Co/GaAs67P33(100)-Schottky contacts 1997 ·Applied Physics Letters ·Alexander Olbrich, J. Vancea, Franz Kreupl, Horst Hoffmann	39
8	Ultrasmall Pt clusters for single electron tunneling studies 1996 ·Microelectronic Engineering ·Franz Kreupl, J. Vancea, Lorenz Risch, F. Hofmann, H. Hoffmann	4
9	Growth and structure of polycrystalline Cr/Au multilayered thin films 1994 ·Thin Solid Films ·H. Brückl, J. Vancea, (unknown), G. Reiß, H. Hoffmann	4
10	Surface-roughness contributions to the electrical resistivity of polycrystalline metal films 1990 ·Physical review. B, Condensed matter ·(unknown), J. Vancea, H. Hoffmann	48
11	Scanning tunneling microscopy on rough surfaces: Deconvolution of constant current images 1990 ·Applied Physics Letters ·G. Reiß, Fabian Schneider, J. Vancea, H. Hoffmann	73
12	Thickness-Dependent Effects in the Work Function of Polycrystalline Cu-Films 1989 ·Europhysics Letters (EPL) ·J. Vancea, G. Reiß, (unknown), H. Hoffmann	15
13	A new method for determining the electronic mean free path in polycrystalline metals 1989 ·Journal of Physics Condensed Matter ·(unknown), J. Vancea, H. Hoffmann	6
14	Grain size-dependent Hall coefficient in polycrystalline copper films 1989 ·Journal of Physics Condensed Matter ·J. Vancea, F. Hofmann, H. Hoffmann	11
15	Comment on "Reinterpretation of the thickness-dependent conductivity of thin platinum films" 1987 ·Journal of Materials Science Letters ·J. Vancea, G. Reiß, H. Hoffmann	3
16	Mean-free-path concept in polycrystalline metals 1987 ·Physical review. B, Condensed matter ·J. Vancea, G. Reiß, H. Hoffmann	42
17	Surface scattering of electrons in metals 1985 ·Thin Solid Films ·Horst Hoffmann, J. Vancea, (unknown)	29
18	Electrical properties of very thin metal films 1985 ·Thin Solid Films ·Horst Hoffmann, (unknown), (unknown), J. Vancea	7
19	Critical assessment of thickness-dependent conductivity of thin metal films 1981 ·Thin Solid Films ·Horst Hoffmann, J. Vancea	82
20	Mean free path and density of conductance electrons in platinum determined by the size effect in extremely thin films 1980 ·Physical review. B, Condensed matter ·(unknown), Horst Hoffmann, J. Vancea	112

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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