П. А. Тодуа

538 citations

67 papers · 455 indexed · h-index 14

Co-authors: A. V. Rakov Yu. A. Novikov В. П. Гавриленко М. Н. Филиппов K. A. Valiev М. А. Степович A. L. Vasiliev Vladimir Roddatis
Topics: Electron and X-Ray Spectroscopy Techniques (41 papers)Force Microscopy Techniques and Applications (14 papers)Advancements in Photolithography Techniques (14 papers)
Cited by: Structural Biology Surfaces, Coatings and Films Electrical and Electronic Engineering
Journals: Measurement Science and Technology Ultramicroscopy Inorganic Materials
Partner nations: Russia

In The Last Decade

П. А. Тодуа

66 papers receiving 455 citations

Peers

Countries citing papers authored by П. А. Тодуа

Since Specialization

Citations

This map shows the geographic impact of П. А. Тодуа's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by П. А. Тодуа with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites П. А. Тодуа more than expected).

Fields of papers citing papers by П. А. Тодуа

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by П. А. Тодуа. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by П. А. Тодуа. The network helps show where П. А. Тодуа may publish in the future.

Co-authorship network of co-authors of П. А. Тодуа

This figure shows the co-authorship network connecting the top 25 collaborators of П. А. Тодуа. A scholar is included among the top collaborators of П. А. Тодуа based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with П. А. Тодуа. П. А. Тодуа is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Evaluation of the Component of Bias of X-Ray Microanalysis Related to Surface Relief of the Specimen 2017 ·Inorganic Materials ·(unknown),(unknown),(unknown),П. А. Тодуа,М. Н. Филиппов	1
2	Thermal Action of an Electronic Probe with X-ray Spectral Nanoanalysis 2017 ·Measurement Techniques ·(unknown),(unknown),(unknown),(unknown),М. А. Степович,П. А. Тодуа,М. Н. Филиппов	5
3	Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images 2016 ·Measurement Techniques ·(unknown),(unknown),(unknown),(unknown),П. А. Тодуа,М. Н. Филиппов	1
4	Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces 2015 ·Measurement Techniques ·В. П. Гавриленко,(unknown),(unknown),М. А. Степович,П. А. Тодуа,М. Н. Филиппов	2
5	The Formation of an Oxide Film on the Surface of a Silicon Relief Structure During Plasma Cleaning 2015 ·Measurement Techniques ·В. П. Гавриленко,(unknown),(unknown),М. А. Степович,П. А. Тодуа,М. Н. Филиппов,(unknown)	1
6	Three-Dimensional Reconstruction of the Surfaces of Relief Structures from Stereoscopic Images Obtained in a Scanning Electron Microscope 2015 ·Measurement Techniques ·В. П. Гавриленко,(unknown),(unknown),(unknown),(unknown),П. А. Тодуа,М. Н. Филиппов,(unknown),(unknown)	3
7	An Estimate of the Uncertainty of Measurements of Lattice Spacings in Silicon Single Crystals Using a Laboratory x-Ray Diffractometer 2014 ·Measurement Techniques ·В. П. Гавриленко,М. А. Ермакова,(unknown),(unknown),П. А. Тодуа,М. Н. Филиппов	1
8	Electron-probe determination of carbon under conditions characterized by the formation of a film of surface contaminants 2013 ·Measurement Techniques ·(unknown),(unknown),П. А. Тодуа,М. Н. Филиппов,Н. В. Швындина,(unknown)	1
9	Measurement of the native oxide thickness on a reference relief pitch structure on a single-crystal silicon substrate 2013 ·Russian Microelectronics ·В. П. Гавриленко,(unknown),(unknown),(unknown),(unknown),A. V. Rakov,П. А. Тодуа,(unknown)	1
10	Measurements of linear dimensions of silicon nanorelief elements with a near-rectangular profile by defocusing the electron probe of a scanning electron microscope 2010 ·Russian Microelectronics ·K. A. Valiev,В. П. Гавриленко,(unknown),(unknown),(unknown),(unknown),(unknown),(unknown),A. V. Rakov,П. А. Тодуа,М. Н. Филиппов	2
11	Calibration of atomic force microscopes 2009 ·Bulletin of the Russian Academy of Sciences Physics ·Yu. A. Novikov,A. V. Rakov,П. А. Тодуа	1
12	First Russian standards in nanotechnology 2009 ·Bulletin of the Russian Academy of Sciences Physics ·В. П. Гавриленко,(unknown),Yu. A. Novikov,A. V. Rakov,П. А. Тодуа,М. Н. Филиппов	23
13	Calibrating a scanning electron microscope in two coordinates by the use of one certified dimension 2008 ·Measurement Techniques ·(unknown),Yu. A. Novikov,A. V. Rakov,П. А. Тодуа	12
14	Geometric aspects of AFM imaging 2008 ·Russian Microelectronics ·Yu. A. Novikov,A. V. Rakov,П. А. Тодуа	6
15	The direct measurement of linewidth using an atomic force microscope 2008 ·Measurement Techniques ·Yu. A. Novikov,A. V. Rakov,П. А. Тодуа	1
16	<title>Direct measurement of the linewidth of relief element on AFM in nanometer range</title> 2008 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yu. A. Novikov,М. Н. Филиппов,(unknown),A. V. Rakov,(unknown),П. А. Тодуа	2
17	Metrology And Standardization For Nanotechnologies 2008 ·AIP conference proceedings ·В. П. Гавриленко,Yu. A. Novikov,A. V. Rakov,П. А. Тодуа,А. С. Авилов,S. L. Dudarev,Laurence D. Marks	1
18	Silicon test object of the linewidth of the nanometer range for SEM and AFM 2007 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yu. A. Novikov,В. П. Гавриленко,(unknown),A. V. Rakov,П. А. Тодуа	24
19	<title>Metrology in linear measurements of nano-object elements</title> 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yu. A. Novikov,A. V. Rakov,П. А. Тодуа	7
20	Electrical properties of a fluorinated-polymer-cadmium-sulfide metal-Langmuir-film junction 1994 ·Semiconductors ·П. А. Тодуа,(unknown)	2

About П. А. Тодуа

П. А. Тодуа is a scholar working on Structural Biology, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 67 papers that have together received 455 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (41 papers), Force Microscopy Techniques and Applications (14 papers) and Advancements in Photolithography Techniques (14 papers). The work is most often cited by research in Structural Biology (164 citations), Surfaces, Coatings and Films (378 citations) and Electrical and Electronic Engineering (272 citations). П. А. Тодуа has collaborated with scholars based in Russia. Frequent co-authors include A. V. Rakov, Yu. A. Novikov, В. П. Гавриленко, М. Н. Филиппов, K. A. Valiev, М. А. Степович, A. L. Vasiliev, Vladimir Roddatis, M. V. Kovalchuk and V. I. Panov. Their work appears in journals such as Measurement Science and Technology, Ultramicroscopy and Inorganic Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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