O. Semenov

599 total citations
23 papers, 415 citations indexed

About

O. Semenov is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications. According to data from OpenAlex, O. Semenov has authored 23 papers receiving a total of 415 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 2 papers in Hardware and Architecture and 1 paper in Computer Networks and Communications. Recurrent topics in O. Semenov's work include Advancements in Semiconductor Devices and Circuit Design (15 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Electrostatic Discharge in Electronics (10 papers). O. Semenov is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (15 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Electrostatic Discharge in Electronics (10 papers). O. Semenov collaborates with scholars based in Canada, United States and United Kingdom. O. Semenov's co-authors include Manoj Sachdev, A. Vassighi, A. Keshavarzi, C.F. Hawkins and A. Pavlov and has published in prestigious journals such as Solid-State Electronics, IEEE Transactions on Semiconductor Manufacturing and IEEE Transactions on Device and Materials Reliability.

In The Last Decade

O. Semenov

20 papers receiving 392 citations

Peers

O. Semenov

EEE

HA

MC

BE

CNC

A. Vassighi Canada

M. Rencz Hungary

Hoyoung Song South Korea

Joo-Sun Choi South Korea

B.D. Shafer United States

K. Kurita Japan

Noah Sturcken United States

Bilal Chehab Belgium

R. Franch United States

Yasser Sherazi Belgium

A. Vassighi Canada

O. Semenov

307 ×0.9

EEE

97 ×1.2

HA

84 ×1.8

MC

32 ×1.1

BE

33 ×1.4

CNC

Citations per year, relative to O. Semenov O. Semenov (= 1×) peers A. Vassighi

Countries citing papers authored by O. Semenov

Since Specialization

Citations

This map shows the geographic impact of O. Semenov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Semenov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Semenov more than expected).

Fields of papers citing papers by O. Semenov

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O. Semenov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Semenov. The network helps show where O. Semenov may publish in the future.

Co-authorship network of co-authors of O. Semenov

This figure shows the co-authorship network connecting the top 25 collaborators of O. Semenov. A scholar is included among the top collaborators of O. Semenov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with O. Semenov. O. Semenov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

1.

Semenov, O., et al.. (2018). TRENDS IN ESD PROTECTION DESIGN FOR I/O LIBRARIES IN ADVANCED CMOS AND FINFET TECHNOLOGIES. 6(3). 1–1. 3 indexed citations

2.

Semenov, O., et al.. (2011). A Review of PVT Compensation Circuits for Advanced CMOS Technologies. Circuits and Systems. 2(3). 162–169. 3 indexed citations

3.

Semenov, O., et al.. (2008). A New Flip-Flop-Based Transient Power Supply Clamp for ESD Protection. IEEE Transactions on Device and Materials Reliability. 8(2). 358–367. 13 indexed citations

4.

Semenov, O., et al.. (2008). ESD protection design for I/O libraries in advanced CMOS technologies. Solid-State Electronics. 52(8). 1127–1139. 11 indexed citations

5.

Semenov, O., et al.. (2008). Adarlington-based SCR ESD protection device for high-speed applications. 633–634. 2 indexed citations

6.

Semenov, O., et al.. (2008). ESD Protection Device and Circuit Design for Advanced CMOS Technologies. DIAL (Catholic University of Leuven). 52 indexed citations

7.

Semenov, O., et al.. (2007). Optimizing Circuit Performance and ESD Protection for High-Speed Differential I/Os. 149–152. 6 indexed citations

8.

Semenov, O., et al.. (2007). A transient power supply ESD clamp with CMOS thyristor delay element. 7A.3–1. 11 indexed citations

9.

Semenov, O., A. Vassighi, & Manoj Sachdev. (2006). Impact of Self-Heating Effect on Long-Term Reliability and Performance Degradation in CMOS Circuits. IEEE Transactions on Device and Materials Reliability. 6(1). 17–27. 146 indexed citations

10.

Vassighi, A., O. Semenov, & Manoj Sachdev. (2004). Thermal runaway avoidance during burn-in. 655–656. 9 indexed citations

11.

Vassighi, A., O. Semenov, Manoj Sachdev, & A. Keshavarzi. (2004). Thermal management of high performance microprocessors in burn-in environment. 313–319. 11 indexed citations

12.

Vassighi, A., O. Semenov, Manoj Sachdev, A. Keshavarzi, & C.F. Hawkins. (2004). CMOS IC Technology Scaling and Its Impact on Burn-In. IEEE Transactions on Device and Materials Reliability. 4(2). 208–221. 28 indexed citations

13.

Semenov, O., A. Vassighi, Manoj Sachdev, A. Keshavarzi, & C.F. Hawkins. (2003). Effect of cmos technology scaling on thermal management during burn-in. IEEE Transactions on Semiconductor Manufacturing. 16(4). 686–695. 21 indexed citations

14.

Vassighi, A., O. Semenov, Manoj Sachdev, & A. Keshavarzi. (2003). Effect of static power dissipation in burn-in environment on yield of VLSI. 12–19.

15.

Semenov, O., A. Pavlov, & Manoj Sachdev. (2003). Sub-quarter micron SRAM cells stability in low-voltage operation: a comparative analysis. 168–171. 7 indexed citations

16.

Semenov, O., A. Vassighi, & Manoj Sachdev. (2003). Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing. Journal of Electronic Testing. 19(3). 341–352. 8 indexed citations

17.

Semenov, O., A. Vassighi, & Manoj Sachdev. (2002). Impact of technology scaling on thermal behavior of leakage current in sub-quarter micron MOSFETs: perspective of low temperature current testing. Microelectronics Journal. 33(11). 985–994. 29 indexed citations

18.

Semenov, O. & Manoj Sachdev. (2002). Impact of technology scaling on bridging fault detections in sequential and combinational CMOS circuits. 36–42.

19.

Semenov, O., et al.. (2002). Impact of gate induced drain leakage on overall leakage of submicrometer CMOS VLSI circuits. IEEE Transactions on Semiconductor Manufacturing. 15(1). 9–18. 33 indexed citations

20.

Semenov, O. & Manoj Sachdev. (2002). Impact of technology scaling on bridging fault detections. 1. 199–203.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact