O. Semenov
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 10%
- Materials Chemistry
- Biomedical Engineering
- Computer Networks and Communications
- Topics
- Advancements in Semiconductor Devices and Circuit Design (15 papers)Integrated Circuits and Semiconductor Failure Analysis (12 papers)Electrostatic Discharge in Electronics (10 papers)
- Journals
- Solid-State ElectronicsIEEE Transactions on Semiconductor ManufacturingIEEE Transactions on Device and Materials Reliability
- Partner nations
- CanadaUnited StatesUnited Kingdom
In The Last Decade
O. Semenov
20 papers receiving 392 citations
Peers
Comparison fields: 5 of 37
- Electrical and Electronic Engineering 347
- Hardware and Architecture 78
- Materials Chemistry 47
- Biomedical Engineering 29
- Computer Networks and Communications 23
Countries citing papers authored by O. Semenov
This map shows the geographic impact of O. Semenov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Semenov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Semenov more than expected).
Fields of papers citing papers by O. Semenov
This network shows the impact of papers produced by O. Semenov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Semenov. The network helps show where O. Semenov may publish in the future.
Co-authorship network of co-authors of O. Semenov
This figure shows the co-authorship network connecting the top 25 collaborators of O. Semenov. A scholar is included among the top collaborators of O. Semenov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with O. Semenov. O. Semenov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 3 | |
| 3 | 13 | |
| 4 | 11 | |
| 5 | 2 | |
| 6 | 52 | |
| 7 | 6 | |
| 8 | 11 | |
| 9 | 146 | |
| 10 | 9 | |
| 11 | 11 | |
| 12 | 28 | |
| 13 | 21 | |
| 14 | 0 | |
| 15 | 7 | |
| 16 | 8 | |
| 17 | 29 | |
| 18 | 0 | |
| 19 | 33 | |
| 20 | 0 |
About O. Semenov
O. Semenov is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications, having authored 23 papers that have together received 415 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (15 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Electrostatic Discharge in Electronics (10 papers). The work is most often cited by research in Hardware and Architecture (78 citations), Electrical and Electronic Engineering (347 citations) and Materials Chemistry (47 citations). O. Semenov has collaborated with scholars based in Canada, United States and United Kingdom. Frequent co-authors include Manoj Sachdev, A. Vassighi, A. Keshavarzi, C.F. Hawkins and A. Pavlov. Their work appears in journals such as Solid-State Electronics, IEEE Transactions on Semiconductor Manufacturing and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.