Yin-Jung Chang
- Electrical and Electronic Engineering
- Biomedical Engineering
- Surfaces, Coatings and Films top 10%
- Atomic and Molecular Physics, and Optics
- Materials Chemistry
- Co-authors
- Yuting ChenThomas K. GaylordDaniel GuidottiRenwei FengGee‐Kung ChangRao TummalaJianjun YuGee-Kung Chang
- Topics
- Photonic and Optical Devices (22 papers)Plasmonic and Surface Plasmon Research (11 papers)Semiconductor Lasers and Optical Devices (11 papers)
- Partner nations
- TaiwanUnited StatesSwitzerland
In The Last Decade
Yin-Jung Chang
30 papers receiving 191 citations
Peers
Comparison fields: 5 of 27
- Electrical and Electronic Engineering 172
- Biomedical Engineering 84
- Surfaces, Coatings and Films 44
- Atomic and Molecular Physics, and Optics 43
- Materials Chemistry 20
Countries citing papers authored by Yin-Jung Chang
This map shows the geographic impact of Yin-Jung Chang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yin-Jung Chang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yin-Jung Chang more than expected).
Fields of papers citing papers by Yin-Jung Chang
This network shows the impact of papers produced by Yin-Jung Chang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yin-Jung Chang. The network helps show where Yin-Jung Chang may publish in the future.
Co-authorship network of co-authors of Yin-Jung Chang
This figure shows the co-authorship network connecting the top 25 collaborators of Yin-Jung Chang. A scholar is included among the top collaborators of Yin-Jung Chang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yin-Jung Chang. Yin-Jung Chang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | First principles studies of the stability and Shottky barriers of metal/CdTe(111) interfaces | 1 |
| 5 | 13 | |
| 6 | 4 | |
| 7 | 2 | |
| 8 | 24 | |
| 9 | 6 | |
| 10 | 2 | |
| 11 | 1 | |
| 12 | 1 | |
| 13 | 5 | |
| 14 | 11 | |
| 15 | 4 | |
| 16 | 2 | |
| 17 | 0 | |
| 18 | 4 | |
| 19 | 6 | |
| 20 | 3 |
About Yin-Jung Chang
Yin-Jung Chang is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Biomedical Engineering, having authored 34 papers that have together received 194 indexed citations. Recurring topics across this work include Photonic and Optical Devices (22 papers), Plasmonic and Surface Plasmon Research (11 papers) and Semiconductor Lasers and Optical Devices (11 papers). The work is most often cited by research in Surfaces, Coatings and Films (44 citations), Electrical and Electronic Engineering (172 citations) and Biomedical Engineering (84 citations). Yin-Jung Chang has collaborated with scholars based in Taiwan, United States and Switzerland. Frequent co-authors include Yuting Chen, Thomas K. Gaylord, Daniel Guidotti, Renwei Feng, Gee‐Kung Chang, Rao Tummala, Jianjun Yu, Gee-Kung Chang, Fuhan Liu and Lixi Wan. Their work appears in journals such as Journal of Applied Physics, Optics Letters and Optics Express.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.