Yao-Ching Ku
Impact in
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- Electron and X-Ray Spectroscopy Techniques
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- Semiconductor materials and devices
- Advancements in Photolithography Techniques
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
Papers in
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- Advancements in Photolithography Techniques 5
- Integrated Circuits and Semiconductor Failure Analysis 3
- Advancements in Semiconductor Devices and Circuit Design 2
- Semiconductor materials and devices 2
- Silicon Carbide Semiconductor Technologies 1
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- Optical Coatings and Gratings 1
- Co-authors
- Anthony Yen (1 shared paper)K.K. Young (1 shared paper)C.H. Diaz (1 shared paper)B. Taylor (1 shared paper)Matthew A. Thompson (1 shared paper)J.D. Hayden (1 shared paper)Kazuyoshi Nakamura (1 shared paper)Hiroshi Uno (1 shared paper)
- Journals
- IEEE Electron Device Letters (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (5 papers)
- Partner nations
- TaiwanJapanUnited States
In The Last Decade
Yao-Ching Ku
6 papers receiving 124 citations
Peers
Comparison fields: 5 of 17
- Surfaces, Coatings and Films 15
- Electrical and Electronic Engineering 120
- Structural Biology 2
- Computational Mechanics 16
- Hardware and Architecture 5
Countries citing papers authored by Yao-Ching Ku
This map shows the geographic impact of Yao-Ching Ku's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yao-Ching Ku with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yao-Ching Ku more than expected).
Fields of papers citing papers by Yao-Ching Ku
This network shows the impact of papers produced by Yao-Ching Ku. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yao-Ching Ku. The network helps show where Yao-Ching Ku may publish in the future.
Co-authors
The 17 scholars most cited alongside Yao-Ching Ku, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 111 | |
| 2 | 2002 | 9 | |
| 3 | 2010 | 6 | |
| 4 | 2007 | 2 | |
| 5 | 2007 | 1 | |
| 6 | 2004 | 1 | |
| 7 | 2004 | 0 |
About Yao-Ching Ku
Yao-Ching Ku is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Computational Mechanics and Electronic, Optical and Magnetic Materials, having authored 7 papers that have together received 130 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (5 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers), Advanced Surface Polishing Techniques (2 papers), Semiconductor materials and devices (2 papers), Optical Coatings and Gratings (1 paper), Copper Interconnects and Reliability (1 paper) and Silicon Carbide Semiconductor Technologies (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (15 citations), Electrical and Electronic Engineering (120 citations), Structural Biology (2 citations), Computational Mechanics (16 citations) and Hardware and Architecture (5 citations). Yao-Ching Ku has collaborated with scholars based in Taiwan, Japan and United States. Frequent co-authors include Anthony Yen, K.K. Young, C.H. Diaz, B. Taylor, Matthew A. Thompson, J.D. Hayden, Kazuyoshi Nakamura, Hiroshi Uno, Wenge Yang and Victor Liu. Their work appears in journals such as IEEE Electron Device Letters and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.