Y. Takeishi
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 10
-
- Surface and Thin Film Phenomena 4
- Semiconductor materials and interfaces 3
- Atomic and Molecular Physics 3
-
- Semiconductor materials and devices 10
- Advancements in Semiconductor Devices and Circuit Design 5
- Integrated Circuits and Semiconductor Failure Analysis 3
- Computational Mechanics top 10%
- Ion-surface interactions and analysis 5
- Co-authors
- Tai SatôHisashi HaraYoshihiko OkamotoH. D. HagstrumKanji HirabayashiK. OhuchiG. E. BeckerH. Iizuka
- Cited by
- Surfaces, Coatings and FilmsAtomic and Molecular Physics, and OpticsElectrical and Electronic Engineering
- Journals
- Applied Physics Letters (1 paper)Surface Science (4 papers)Japanese Journal of Applied Physics (4 papers)
- Partner nations
- JapanUnited States
In The Last Decade
Y. Takeishi
26 papers receiving 530 citations
Peers
Comparison fields: 5 of 37
- Surfaces, Coatings and Films 113
- Atomic and Molecular Physics, and Optics 255
- Electrical and Electronic Engineering 421
- Structural Biology 8
- Computational Mechanics 87
Countries citing papers authored by Y. Takeishi
This map shows the geographic impact of Y. Takeishi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Takeishi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Takeishi more than expected).
Fields of papers citing papers by Y. Takeishi
This network shows the impact of papers produced by Y. Takeishi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Takeishi. The network helps show where Y. Takeishi may publish in the future.
Co-authorship network
The 17 scholars most cited alongside Y. Takeishi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1978 | 1 | |
| 2 | 1972 | 8 | |
| 3 | 1972 | 4 | |
| 4 | 1972 | 2 | |
| 5 | 1971 | 27 | |
| 6 | 1971 | 1 | |
| 7 | 1971 | 2 | |
| 8 | 1970 | 9 | |
| 9 | 1968 | 3 | |
| 10 | 1967 | 9 | |
| 11 | 1966 | 36 | |
| 12 | 1966 | 7 | |
| 13 | 1965 | 11 | |
| 14 | 1965 | 27 | |
| 15 | 1965 | 10 | |
| 16 | 1965 | 8 | |
| 17 | 1964 | 9 | |
| 18 | 1958 | 5 | |
| 19 | 1956 | 11 | |
| 20 | 1954 | 2 |
About Y. Takeishi
Y. Takeishi is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Hardware and Architecture, having authored 26 papers that have together received 605 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (10 papers), Semiconductor materials and devices (10 papers), Ion-surface interactions and analysis (5 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Surface and Thin Film Phenomena (4 papers), Semiconductor materials and interfaces (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Atomic and Molecular Physics (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (113 citations), Atomic and Molecular Physics, and Optics (255 citations) and Electrical and Electronic Engineering (421 citations). Y. Takeishi has collaborated with scholars based in Japan and United States. Frequent co-authors include Tai Satô, Hisashi Hara, Yoshihiko Okamoto, H. D. Hagstrum, Kanji Hirabayashi, K. Ohuchi, G. E. Becker, H. Iizuka, T. Satô and Hajime Maeda. Their work appears in journals such as Applied Physics Letters, Surface Science and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.