T.L. van Rooy
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
-
- Surface and Thin Film Phenomena
- Advanced Chemical Physics Studies
- Semiconductor Quantum Structures and Devices
- Semiconductor materials and interfaces
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 4
- Co-authors
- J. van de LaarJoost N. H. ReekChristoph SchillerChristian SchönenbergerH. B. ElswijkM. FransenP. KruitRobby Aerts
- Journals
- Surface Science (3 papers)Applied Surface Science (1 paper)Physics Letters A (1 paper)Journal of Non-Crystalline Solids (1 paper)Journal of Vacuum Science and Technology (2 papers)
- Partner nations
- NetherlandsFinland
In The Last Decade
T.L. van Rooy
8 papers receiving 468 citations
Peers
Comparison fields: 5 of 28
- Surfaces, Coatings and Films 188
- Atomic and Molecular Physics, and Optics 399
- Structural Biology 11
- Electrical and Electronic Engineering 230
- Materials Chemistry 126
Countries citing papers authored by T.L. van Rooy
This map shows the geographic impact of T.L. van Rooy's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.L. van Rooy with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.L. van Rooy more than expected).
Fields of papers citing papers by T.L. van Rooy
This network shows the impact of papers produced by T.L. van Rooy. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.L. van Rooy. The network helps show where T.L. van Rooy may publish in the future.
Co-authors
The 9 scholars most cited alongside T.L. van Rooy, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1996 | 10 | |
| 2 | 1995 | 18 | |
| 3 | 1988 | 7 | |
| 4 | 1981 | 27 | |
| 5 | 1979 | 22 | |
| 6 | 1978 | 120 | |
| 7 | 1977 | 106 | |
| 8 | 1977 | 189 |
About T.L. van Rooy
T.L. van Rooy is a scholar working on Structural Biology, Surfaces, Coatings and Films, Ceramics and Composites, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 8 papers that have together received 499 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (4 papers), Photocathodes and Microchannel Plates (3 papers), Semiconductor Quantum Structures and Devices (2 papers), Chalcogenide Semiconductor Thin Films (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Advanced Chemical Physics Studies (2 papers), Advanced Semiconductor Detectors and Materials (2 papers) and Silicone and Siloxane Chemistry (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (188 citations), Atomic and Molecular Physics, and Optics (399 citations), Structural Biology (11 citations), Electrical and Electronic Engineering (230 citations) and Materials Chemistry (126 citations). T.L. van Rooy has collaborated with scholars based in Netherlands and Finland. Frequent co-authors include J. van de Laar, Joost N. H. Reek, Christoph Schiller, Christian Schönenberger, H. B. Elswijk, M. Fransen, P. Kruit, Robby Aerts and J.G. van Lierop. Their work appears in journals such as Surface Science, Applied Surface Science, Physics Letters A, Journal of Non-Crystalline Solids and Journal of Vacuum Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.