David B. Wittry

677 total citations
17 papers, 470 citations indexed

About

David B. Wittry is a scholar working on Surfaces, Coatings and Films, Radiation and Electrical and Electronic Engineering. According to data from OpenAlex, David B. Wittry has authored 17 papers receiving a total of 470 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Surfaces, Coatings and Films, 9 papers in Radiation and 7 papers in Electrical and Electronic Engineering. Recurrent topics in David B. Wittry's work include Electron and X-Ray Spectroscopy Techniques (13 papers), X-ray Spectroscopy and Fluorescence Analysis (8 papers) and Advancements in Photolithography Techniques (4 papers). David B. Wittry is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (13 papers), X-ray Spectroscopy and Fluorescence Analysis (8 papers) and Advancements in Photolithography Techniques (4 papers). David B. Wittry collaborates with scholars based in United States and Japan. David B. Wittry's co-authors include David F. Kyser, Masatoshi Kotera, Hiroshi Suga, James Nicholson, R. W. Fitzgerald, John McD. Tormey and Songquan Sun and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Japanese Journal of Applied Physics.

In The Last Decade

David B. Wittry

16 papers receiving 388 citations

Peers

David B. Wittry
P. J. Orders United States
Y. Takeishi Japan
D. Menke United States
L. S. O. Johansson Sweden
Satoshi Maeyama Japan
P. S. Mangat United States
Youiti Yamamoto Japan
J. T. McKinley United States
Toshihiro Ichikawa Japan
G.M. Guichar France
P. J. Orders United States
David B. Wittry
Citations per year, relative to David B. Wittry David B. Wittry (= 1×) peers P. J. Orders

Countries citing papers authored by David B. Wittry

Since Specialization
Citations

This map shows the geographic impact of David B. Wittry's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David B. Wittry with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David B. Wittry more than expected).

Fields of papers citing papers by David B. Wittry

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David B. Wittry. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David B. Wittry. The network helps show where David B. Wittry may publish in the future.

Co-authorship network of co-authors of David B. Wittry

This figure shows the co-authorship network connecting the top 25 collaborators of David B. Wittry. A scholar is included among the top collaborators of David B. Wittry based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David B. Wittry. David B. Wittry is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

17 of 17 papers shown
1.
Wittry, David B., et al.. (2001). X-ray Crystal Spectrometers and Monochromators in Microanalysis. Microscopy and Microanalysis. 7(2). 124–141. 10 indexed citations
2.
Sun, Songquan, John McD. Tormey, & David B. Wittry. (1990). High-efficiency x-ray monochromator for measurement of Ca in the TEM. Proceedings annual meeting Electron Microscopy Society of America. 48(2). 156–157. 1 indexed citations
3.
Kotera, Masatoshi, et al.. (1990). A Simulation of Electron Scattering in Metals. Japanese Journal of Applied Physics. 29(10R). 2277–2277. 33 indexed citations
4.
Kotera, Masatoshi, et al.. (1990). A Simulation of the Topographic Contrast in the SEM. Japanese Journal of Applied Physics. 29(10R). 2312–2312. 9 indexed citations
5.
Wittry, David B., et al.. (1968). ELECTRON BEAM MODULATED REFLECTANCE OF GERMANIUM. Applied Physics Letters. 13(8). 272–274. 5 indexed citations
6.
Wittry, David B. & David F. Kyser. (1967). Measurement of Diffusion Lengths in Direct-Gap Semiconductors by Electron-Beam Excitation. Journal of Applied Physics. 38(1). 375–382. 191 indexed citations
7.
Wittry, David B.. (1966). CATHODOLUMINESCENCE AND IMPURITY VARIATIONS IN Te-DOPED GaAs. Applied Physics Letters. 8(6). 142–144. 20 indexed citations
8.
Wittry, David B. & David F. Kyser. (1965). Cathodoluminescence at p-n Junctions in GaAs. Journal of Applied Physics. 36(4). 1387–1389. 103 indexed citations
9.
Wittry, David B. & David F. Kyser. (1964). Use of Electron Probes in the Study of Recombination Radiation. Journal of Applied Physics. 35(8). 2439–2442. 40 indexed citations
10.
Nicholson, James & David B. Wittry. (1963). A Comparison of the Performance of Gratings and Crystals in the 20-115 Å Region*. Advances in X-ray Analysis. 7. 497–511. 8 indexed citations
11.
Wittry, David B.. (1963). Methods of Quantitative Electron Probe Analysis*. Advances in X-ray Analysis. 7. 395–418. 3 indexed citations
12.
Wittry, David B. & R. W. Fitzgerald. (1961). Equipment for Beam Scanning and Step Scanning in Electron-Probe Analysis. Advances in X-ray Analysis. 5. 538–553. 5 indexed citations
13.
Wittry, David B.. (1959). Instrumentation for Electron Probe Micro Analysis. Advances in X-ray Analysis. 3. 185–195.
14.
Wittry, David B.. (1959). Errata: Resolution of Electron Probe Microanalyzers. Journal of Applied Physics. 30(6). 953–953. 1 indexed citations
15.
Wittry, David B.. (1959). Metallurgical Applications of Electron Probe Microanalysis. Advances in X-ray Analysis. 3. 197–212. 4 indexed citations
16.
Wittry, David B.. (1958). Resolution of Electron Probe Microanalyzers. Journal of Applied Physics. 29(11). 1543–1548. 36 indexed citations
17.
Wittry, David B.. (1957). Two Improvements in Electron Sources for Electron Probes. Review of Scientific Instruments. 28(1). 58–58. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026