N. J. Ianno

1.5k citations
83 papers · 1.2k indexed · h-index 21
Topics
Semiconductor materials and devices (17 papers)Chalcogenide Semiconductor Thin Films (13 papers)Thin-Film Transistor Technologies (12 papers)

In The Last Decade

N. J. Ianno

76 papers receiving 1.1k citations

Peers

N. J. Ianno
Comparison fields: 5 of 69
  • Materials Chemistry 683
  • Electrical and Electronic Engineering 608
  • Biomedical Engineering 204
  • Mechanics of Materials 187
  • Electronic, Optical and Magnetic Materials 152
Replace J.J. Grob with:
J.J. Grob France
J.K.N. Lindner Germany
D. Gräf Germany
D. Chvostová Czechia
Yuden Teraoka Japan
T. Wágner Germany
Roland Thielsch Germany
A. Redondo‐Cubero Spain
H. Izumi Japan
J. Rivory France
N. J. Ianno relative to J.J. Grob France J.J. Grob's profile →
Citations per field
00.5×3.5×
J.J. Grob · 1×
Citations per year

Countries citing papers authored by N. J. Ianno

Since Specialization
Citations

This map shows the geographic impact of N. J. Ianno's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. J. Ianno with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. J. Ianno more than expected).

Fields of papers citing papers by N. J. Ianno

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. J. Ianno. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. J. Ianno. The network helps show where N. J. Ianno may publish in the future.

Co-authorship network of co-authors of N. J. Ianno

This figure shows the co-authorship network connecting the top 25 collaborators of N. J. Ianno. A scholar is included among the top collaborators of N. J. Ianno based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. J. Ianno. N. J. Ianno is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 7
2 10
3 6
4 20
5 1
6 76
7 1
8 22
9 38
10 16
11 2
12 0
13 4
14 11
15 0
16 20
17 29
18 13
19 29
20 5

About N. J. Ianno

N. J. Ianno is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Computational Mechanics, having authored 83 papers that have together received 1.2k indexed citations. Recurring topics across this work include Semiconductor materials and devices (17 papers), Chalcogenide Semiconductor Thin Films (13 papers) and Thin-Film Transistor Technologies (12 papers). The work is most often cited by research in Materials Chemistry (683 citations), Surfaces, Coatings and Films (76 citations) and Electrical and Electronic Engineering (608 citations). N. J. Ianno has collaborated with scholars based in United States, Czechia and Germany. Frequent co-authors include R. J. Soukup, P. A. Dowben, Dongjin Byun, Paul G. Snyder, Christopher L. Exstrom, Scott A. Darveau, Amitabha Sarkar, Blaine Johs, Zdeněk Hubička and Nek Muhammad Shaikh. Their work appears in journals such as Advanced Materials, Applied Physics Letters and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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