Blaine Johs

4.1k total citations · 1 hit paper
88 papers, 3.3k citations indexed

About

Blaine Johs is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Blaine Johs has authored 88 papers receiving a total of 3.3k indexed citations (citations by other indexed papers that have themselves been cited), including 50 papers in Electrical and Electronic Engineering, 37 papers in Atomic and Molecular Physics, and Optics and 26 papers in Biomedical Engineering. Recurrent topics in Blaine Johs's work include Optical Polarization and Ellipsometry (23 papers), Advanced Semiconductor Detectors and Materials (22 papers) and Optical Coatings and Gratings (21 papers). Blaine Johs is often cited by papers focused on Optical Polarization and Ellipsometry (23 papers), Advanced Semiconductor Detectors and Materials (22 papers) and Optical Coatings and Gratings (21 papers). Blaine Johs collaborates with scholars based in United States, Germany and Sweden. Blaine Johs's co-authors include Craig M. Herzinger, John A. Woollam, William A. McGahan, W. M. Paulson, Jeffrey S. Hale, Paul G. Snyder, R. A. Synowicki, James N. Hilfiker, Corey Bungay and J. D. Benson and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Blaine Johs

85 papers receiving 3.2k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

1998 893 citations Craig M. Herzinger, Blaine Johs et al. profile →

Peers

Countries citing papers authored by Blaine Johs

Since Specialization

Citations

This map shows the geographic impact of Blaine Johs's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Blaine Johs with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Blaine Johs more than expected).

Fields of papers citing papers by Blaine Johs

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Blaine Johs. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Blaine Johs. The network helps show where Blaine Johs may publish in the future.

Co-authorship network of co-authors of Blaine Johs

This figure shows the co-authorship network connecting the top 25 collaborators of Blaine Johs. A scholar is included among the top collaborators of Blaine Johs based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Blaine Johs. Blaine Johs is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Ultrahigh purity plasma-enhanced atomic layer deposition and electrical properties of epitaxial scandium nitride 2025 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·G. B. Rayner, (unknown), Bangzhi Liu, Jeffrey R. Shallenberger, Jiadi Zhu, Tomás Palacios, Piush Behera, Suraj Cheema, Blaine Johs, (unknown)	2
2	Immersion ellipsometry for the uncorrelated determination of ultrathin film thickness and index of refraction: Theory and examples 2024 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·Samira Jafari, Blaine Johs, Matthew R. Linford	0
3	Real-time in situ ellipsometric monitoring of aluminum nitride film growth via hollow-cathode plasma-assisted atomic layer deposition 2019 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·(unknown), (unknown), (unknown), Brian G. Willis, Blaine Johs, Ali K. Okyay, Necmi Bıyıklı	20
4	Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations 2012 ·Jie Chen, Prakash Koirala, (unknown), R. W. Collins, Sylvain Marsillac, (unknown), Blaine Johs, Jeffrey S. Hale, (unknown)	3
5	Dielectric function of thin metal films by combined in situ transmission ellipsometry and intensity measurements 2004 ·Thin Solid Films ·Greg K. Pribil, Blaine Johs, N. J. Ianno	20
6	Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared 2003 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·James N. Hilfiker, Corey Bungay, R. A. Synowicki, Thomas E. Tiwald, Craig M. Herzinger, Blaine Johs, Greg K. Pribil, John A. Woollam	51
7	Spectroscopic ellipsometry in optical coatings manufacturing 2001 ·James N. Hilfiker, J. Scott Hale, Blaine Johs, Tom Tiwald, R. A. Synowicki, Corey Bungay, John A. Woollam	1
8	<title>Recent developments in spectroscopic ellipsometry for in-situ applications</title> 2001 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Blaine Johs, (unknown), N. J. Ianno, Craig M. Herzinger, Thomas E. Tiwald, John A. Woollam	29
9	Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications 1999 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·John A. Woollam, Blaine Johs, Craig M. Herzinger, James N. Hilfiker, R. A. Synowicki, Corey Bungay	179
10	Epitaxial growth of HgCdTe 1.55-μm avalanche photodiodes by molecular beam epitaxy 1999 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·T. J. de Lyon, (unknown), G. R. Chapman, (unknown), A. T. Hunter, (unknown), J. Eric Jensen, W.B. Johnson, Blaine Johs, K. Kosai, (unknown), G. L. Olson, (unknown), (unknown)	11
11	Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications 1999 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Blaine Johs, John A. Woollam, Craig M. Herzinger, James N. Hilfiker, R. A. Synowicki, Corey Bungay	89
12	Characterization of biaxially-stretched plastic films by generalized ellipsometry 1998 ·Thin Solid Films ·J.F. Elman, Jehuda Greener, Craig M. Herzinger, Blaine Johs	51
13	Automated compositional control of Hg1−xCdxTe during MBE, using in situ spectroscopic ellipsometry 1998 ·Journal of Electronic Materials ·L. A. Almeida, (unknown), J. D. Benson, J. H. Dinan, Blaine Johs	11
14	A multi-sample, multi-wavelength, multi-angle investigation of the interface layer between silicon and thermally grown silicon dioxide 1998 ·Thin Solid Films ·Craig M. Herzinger, Blaine Johs, William A. McGahan, W. M. Paulson	11
15	Real-time process control with in situ spectroscopic ellipsometry 1997 ·III-Vs Review ·Blaine Johs, (unknown), James N. Hilfiker	1
16	Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2 1996 ·Journal of the Optical Society of America A ·M. Schubert, John A. Woollam, Blaine Johs, Craig M. Herzinger, B. Rheinländer	151
17	In Situ Multi-Wavelength Ellipsometric Control of Thickness and Composition For Bragg Reflector Structures 1995 ·MRS Proceedings ·Craig M. Herzinger, Blaine Johs, Peter Chow, (unknown), (unknown), (unknown), (unknown)	13
18	Optical analysis of complex multilayer structures using multiple data types 1994 ·Thin Solid Films ·Blaine Johs, William A. McGahan, John A. Woollam	20
19	In Situ Spectroscopic Ellipsometry for Real Time Semiconductor Growth Monitor 1990 ·MRS Proceedings ·Blaine Johs, (unknown), (unknown), Huade Yao, Paul G. Snyder, John A. Woollam, J. L. Edwards, G.N. Maracas	4
20	Preparation of high T c Tl-Ba-Ca-Cu-O thin films by pulsed laser evaporation and Tl2O3 vapor processing 1989 ·Applied Physics Letters ·Blaine Johs, D. Thompson, N. J. Ianno, John A. Woollam, S. H. Liou, A. M. Hermann, Z. Z. Sheng, (unknown), (unknown), (unknown), Sheng Liu, (unknown)	29

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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