Jeffrey S. Hale

873 total citations
27 papers, 732 citations indexed

About

Jeffrey S. Hale is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Aerospace Engineering. According to data from OpenAlex, Jeffrey S. Hale has authored 27 papers receiving a total of 732 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 8 papers in Materials Chemistry and 6 papers in Aerospace Engineering. Recurrent topics in Jeffrey S. Hale's work include Gas Sensing Nanomaterials and Sensors (6 papers), Silicone and Siloxane Chemistry (5 papers) and Optical Coatings and Gratings (5 papers). Jeffrey S. Hale is often cited by papers focused on Gas Sensing Nanomaterials and Sensors (6 papers), Silicone and Siloxane Chemistry (5 papers) and Optical Coatings and Gratings (5 papers). Jeffrey S. Hale collaborates with scholars based in United States, Japan and Sweden. Jeffrey S. Hale's co-authors include Blaine Johs, John A. Woollam, Michael J. DeVries, James N. Hilfiker, William A. McGahan, Thomas E. Tiwald, R. A. Synowicki, Daniel W. Thompson, Chris Trimble and Andrew Martin and has published in prestigious journals such as Blood, European Journal of Immunology and Applied Surface Science.

In The Last Decade

Jeffrey S. Hale

27 papers receiving 716 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jeffrey S. Hale United States 11 327 249 200 111 89 27 732
Sejal Shah India 16 212 0.6× 185 0.7× 154 0.8× 107 1.0× 77 0.9× 87 745
Paul A. O’Connell United States 20 81 0.2× 713 2.9× 516 2.6× 348 3.1× 176 2.0× 29 1.6k
Shuhei Inoue Japan 15 123 0.4× 392 1.6× 27 0.1× 236 2.1× 52 0.6× 86 860
Farhad Khosravi United States 16 152 0.5× 140 0.6× 52 0.3× 172 1.5× 129 1.4× 35 682
Yukihide Ota Japan 9 327 1.0× 312 1.3× 84 0.4× 49 0.4× 19 0.2× 28 645
Andreas Undisz Germany 19 309 0.9× 602 2.4× 42 0.2× 295 2.7× 100 1.1× 78 1.3k
Makiko Ito Japan 17 51 0.2× 160 0.6× 154 0.8× 68 0.6× 191 2.1× 49 779
Vladimir Mikhailovskii Russia 15 273 0.8× 270 1.1× 48 0.2× 305 2.7× 156 1.8× 56 851
Hamed Heidari Belgium 21 281 0.9× 502 2.0× 133 0.7× 363 3.3× 109 1.2× 30 1.3k
Masamichi Yamada Japan 19 482 1.5× 323 1.3× 69 0.3× 204 1.8× 370 4.2× 73 1.2k

Countries citing papers authored by Jeffrey S. Hale

Since Specialization
Citations

This map shows the geographic impact of Jeffrey S. Hale's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeffrey S. Hale with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeffrey S. Hale more than expected).

Fields of papers citing papers by Jeffrey S. Hale

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jeffrey S. Hale. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeffrey S. Hale. The network helps show where Jeffrey S. Hale may publish in the future.

Co-authorship network of co-authors of Jeffrey S. Hale

This figure shows the co-authorship network connecting the top 25 collaborators of Jeffrey S. Hale. A scholar is included among the top collaborators of Jeffrey S. Hale based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jeffrey S. Hale. Jeffrey S. Hale is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Tiwald, Thomas E., et al.. (2019). Application of a B-spline model dielectric function to infrared spectroscopic ellipsometry data analysis. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 38(1). 14 indexed citations
2.
Hilfiker, James N., Greg K. Pribil, R. A. Synowicki, Andrew Martin, & Jeffrey S. Hale. (2018). Spectroscopic ellipsometry characterization of multilayer optical coatings. Surface and Coatings Technology. 357. 114–121. 28 indexed citations
3.
Hilfiker, James N., Jeffrey S. Hale, Craig M. Herzinger, et al.. (2016). Estimating Depolarization with the Jones Matrix Quality Factor. Applied Surface Science. 421. 494–499. 10 indexed citations
4.
Kanda, Junya, Paul Szabolcs, Gregory D. Sempowski, et al.. (2012). Immune Recovery in Adult Patients after Myeloablative Dual Umbilical Cord Blood, Matched Sibling, and Matched Unrelated Donor Hematopoietic Cell Transplantation. Biology of Blood and Marrow Transplantation. 18(11). 1664–1676.e1. 73 indexed citations
5.
Chen, Jie, Prakash Koirala, R. W. Collins, et al.. (2012). Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations. 377–381. 3 indexed citations
6.
7.
Trimble, Chris, Michael J. DeVries, Jeffrey S. Hale, et al.. (1999). Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide. Thin Solid Films. 355-356. 26–34. 30 indexed citations
8.
Hale, Jeffrey S. & John A. Woollam. (1999). Prospects for IR emissivity control using electrochromic structures 1Presentented at the ICMCTF ’97 Conference, San Diego, CA, USA, April 1997. 1. Thin Solid Films. 339(1-2). 174–180. 74 indexed citations
9.
Hale, Jeffrey S., et al.. (1998). Visible and infrared optical constants of electrochromic materials for emissivity modulation applications. Thin Solid Films. 313-314. 205–209. 70 indexed citations
10.
Synowicki, R. A., et al.. (1996). Oxygen plasma asher contamination: An analysis of sources and remedies. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 14(6). 3075–3081. 5 indexed citations
11.
Synowicki, R. A., et al.. (1995). Low-Earth-orbit exposure of carbon-based materials aboard Shuttle flight STS-46. Journal of Spacecraft and Rockets. 32(6). 1015–1017. 2 indexed citations
12.
Synowicki, R. A., et al.. (1995). Thin film materials exposure to low Earth orbit aboard Space Shuttle. Journal of Spacecraft and Rockets. 32(1). 97–102. 9 indexed citations
13.
Hilfiker, James N., Daniel W. Thompson, Jeffrey S. Hale, & John A. Woollam. (1995). In-situ ellipsometric characterization of the electrodeposition of metal films. Thin Solid Films. 270(1-2). 73–77. 6 indexed citations
14.
Hale, Jeffrey S., et al.. (1995). Spectroscopic ellipsometry as a sensitive monitor of materials contamination. NASA Technical Reports Server (NASA). 1 indexed citations
15.
McGahan, William A., et al.. (1994). Modified Forouhi and Bloomer dispersion model for the optical constants of amorphous hydrogenated carbon thin films. Thin Solid Films. 253(1-2). 57–61. 50 indexed citations
16.
Woollam, John A., et al.. (1993). In situ and Ex situ Applications of Spectroscopic Ellipsometry. MRS Proceedings. 324. 1 indexed citations
17.
Synowicki, R. A., Jeffrey S. Hale, & John A. Woollam. (1993). Errata-Low Earth Orbit Simulation and Materials Characterization. Journal of Spacecraft and Rockets. 30(6). 788–788. 1 indexed citations
18.
Synowicki, R. A., et al.. (1993). Low Earth orbit effects on indium tin oxide and polyester and comparison with laboratory simulations. Surface and Coatings Technology. 62(1-3). 499–503. 8 indexed citations
19.
Synowicki, R. A., et al.. (1991). Oxygen plasma ashing effects on aluminum and titanium space protective coatings. Thin Solid Films. 206(1-2). 254–258. 8 indexed citations
20.
Hale, Jeffrey S., et al.. (1991). Atomic Oxygen Plasma Effects on CVD Deposited Diamond-Like Carbon Films. MRS Proceedings. 235. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Sejal Shah Breakdown of academic impact, for papers by Paul A. O’Connell Breakdown of academic impact, for papers by Shuhei Inoue Breakdown of academic impact, for papers by Farhad Khosravi Breakdown of academic impact, for papers by Yukihide Ota Breakdown of academic impact, for papers by Andreas Undisz Breakdown of academic impact, for papers by Makiko Ito Breakdown of academic impact, for papers by Vladimir Mikhailovskii Breakdown of academic impact, for papers by Hamed Heidari Breakdown of academic impact, for papers by Masamichi Yamada
Rankless by CCL
2026