Ee Jin Teo

81 papers receiving 1.6k citations

Peers

Ee Jin Teo
Comparison fields: 5 of 77
  • Structural Biology 56
  • Surfaces, Coatings and Films 184
  • Atomic and Molecular Physics, and Optics 566
  • Electrical and Electronic Engineering 1.0k
  • Computational Mechanics 358
Replace N. Cherkashin with:
N. Cherkashin France
M. Kittler Germany
G. K. Celler United States
Rajinder P. Khosla United States
M. D. Pashley United States
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Y. Iwai Japan
D. C. Flanders United States
Ee Jin Teo relative to N. Cherkashin France N. Cherkashin's profile →
Citations per field
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Citations per year

Countries citing papers authored by Ee Jin Teo

Since Specialization
Citations

This map shows the geographic impact of Ee Jin Teo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ee Jin Teo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ee Jin Teo more than expected).

Fields of papers citing papers by Ee Jin Teo

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ee Jin Teo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ee Jin Teo. The network helps show where Ee Jin Teo may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Ee Jin Teo, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Ee Jin Teo Line = papers co-authored together Ee Jin Teo links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20233
2 202266
3 20195
4 201810
5 20183
6 201721
7 20136
8 20127
9 20104
10 20105
11 200920
12 200818
13 200814
14 20062
15 20041
16 200416
17 200412
18 200465
19 200115
20 19998

About Ee Jin Teo

Ee Jin Teo is a scholar working on Structural Biology, Electrical and Electronic Engineering, Radiation, Computational Mechanics and Materials Chemistry, having authored 84 papers that have together received 1.7k indexed citations. Recurring topics across this work include Silicon Nanostructures and Photoluminescence (23 papers), Photonic and Optical Devices (19 papers), Ion-surface interactions and analysis (18 papers), Semiconductor materials and devices (16 papers), Photonic Crystals and Applications (15 papers), Diamond and Carbon-based Materials Research (13 papers), Nanowire Synthesis and Applications (13 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). The work is most often cited by research in Structural Biology (56 citations), Surfaces, Coatings and Films (184 citations), Atomic and Molecular Physics, and Optics (566 citations), Electrical and Electronic Engineering (1.0k citations) and Computational Mechanics (358 citations). Ee Jin Teo has collaborated with scholars based in Singapore, United Kingdom and Japan. Frequent co-authors include Andrew A. Bettiol, Mark B. H. Breese, F. Watt, J.A. van Kan, Daniel John Blackwood, Goran Z. Mashanovich, Jinghua Teng, Milan M. Milošević, Miloš Nedeljković and Youfang Hu. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Applied Physics Letters, Journal of Applied Physics, Optics Express and Diamond and Related Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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