B. Knoll

2.0k total citations · 1 hit paper
12 papers, 1.5k citations indexed

About

B. Knoll is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, B. Knoll has authored 12 papers receiving a total of 1.5k indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 11 papers in Biomedical Engineering and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in B. Knoll's work include Near-Field Optical Microscopy (11 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Force Microscopy Techniques and Applications (5 papers). B. Knoll is often cited by papers focused on Near-Field Optical Microscopy (11 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Force Microscopy Techniques and Applications (5 papers). B. Knoll collaborates with scholars based in Germany and United Kingdom. B. Knoll's co-authors include F. Keilmann, Rainer Hillenbrand, A. Krämer, R. Guckenberger, Werner Frammelsberger, Günther Benstetter, Guido Stromberg, C. Lauterbach, W. Weber and C. Braun and has published in prestigious journals such as Nature, Applied Physics Letters and Applied Physics A.

In The Last Decade

B. Knoll

12 papers receiving 1.5k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Near-field probing of vibrational absorption for chemical microscopy

1999 697 citations B. Knoll, F. Keilmann Nature profile →

Peers

Countries citing papers authored by B. Knoll

Since Specialization

Citations

This map shows the geographic impact of B. Knoll's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Knoll with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Knoll more than expected).

Fields of papers citing papers by B. Knoll

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Knoll. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Knoll. The network helps show where B. Knoll may publish in the future.

Co-authorship network of co-authors of B. Knoll

This figure shows the co-authorship network connecting the top 25 collaborators of B. Knoll. A scholar is included among the top collaborators of B. Knoll based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Knoll. B. Knoll is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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12 of 12 papers shown

#	Work	Indexed citations
1	Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling 2005 ·Microelectronics Reliability ·(unknown), Günther Benstetter, B. Knoll, Werner Frammelsberger	5
2	Disappearing electronics and the return of the physical world 2005 ·W. Weber, C. Braun, (unknown), (unknown), (unknown), B. Knoll, C. Lauterbach, M. Leitner, Mayue Shi, (unknown), (unknown), Guido Stromberg, (unknown)	3
3	Pure optical contrast in scattering‐type scanning near‐field microscopy 2001 ·Journal of Microscopy ·Rainer Hillenbrand, B. Knoll, F. Keilmann	163
4	Infrared conductivity mapping for nanoelectronics 2000 ·Applied Physics Letters ·B. Knoll, F. Keilmann	69
5	Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy 2000 ·Optics Communications ·B. Knoll, F. Keilmann	385
6	Mid‐infrared scanning near‐field optical microscope resolves 30 nm 1999 ·Journal of Microscopy ·B. Knoll, F. Keilmann	28
7	Near-field probing of vibrational absorption for chemical microscopy breakdown → 1999 ·Nature ·B. Knoll, F. Keilmann	697
8	Electromagnetic fields in the cutoff regime of tapered metallic waveguides 1999 ·Optics Communications ·B. Knoll, F. Keilmann	31
9	Long-Wave-Infrared Near-Field Microscopy 1999 ·physica status solidi (b) ·F. Keilmann, B. Knoll, A. Krämer	19
10	Scanning microscopy by mid-infrared near-field scattering 1998 ·Applied Physics A ·B. Knoll, F. Keilmann	31
11	Contrast of microwave near-field microscopy 1997 ·Applied Physics Letters ·B. Knoll, F. Keilmann, A. Krämer, R. Guckenberger	92
12	The coaxial tip as a nano-antenna for scanning near-field microwave transmission microscopy 1996 ·Micron ·A. Krämer, F. Keilmann, B. Knoll, R. Guckenberger	22

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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