T. Heitz

572 citations
23 papers · 497 indexed · h-index 10

T. Heitz

23 papers receiving 491 citations

Peers

T. Heitz
Comparison fields: 5 of 39
  • Materials Chemistry 422
  • Mechanics of Materials 130
  • Electrical and Electronic Engineering 277
  • Geophysics 42
  • Surfaces, Coatings and Films 16
Replace A.P. Burden with:
A.P. Burden United Kingdom
Olivier M. Küttel Switzerland
A. D. Stewart United Kingdom
I. C. Wu Taiwan
F. Hörmann Germany
D. A. Pawlik United States
J. E. Jaskie United States
K. Okumura United States
Umesh Palnitkar Taiwan
A.V. Karabutov Russia
T. Heitz relative to A.P. Burden United Kingdom A.P. Burden's profile →
Citations per field
00.5×1.5×
A.P. Burden · 1×
Citations per year

Countries citing papers authored by T. Heitz

Since Specialization
Citations

This map shows the geographic impact of T. Heitz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Heitz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Heitz more than expected).

Fields of papers citing papers by T. Heitz

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Heitz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Heitz. The network helps show where T. Heitz may publish in the future.

Co-authorship network

The 23 scholars most cited alongside T. Heitz, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with T. Heitz Line = papers co-authored together T. Heitz links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20028
2 20023
3 20001
4 20002
5 20001
6 200015
7 200010
8 199910
9 199979
10 199915
11 19982
12 19989
13 19981
14 199830
15 19986
16 19987
17 19982
18 19971
19 199611
20 1995139

About T. Heitz

T. Heitz is a scholar working on Materials Chemistry, Geophysics, Surfaces, Coatings and Films, Physical and Theoretical Chemistry and Electrical and Electronic Engineering, having authored 23 papers that have together received 497 indexed citations. Recurring topics across this work include Diamond and Carbon-based Materials Research (17 papers), Thin-Film Transistor Technologies (7 papers), Carbon Nanotubes in Composites (6 papers), Metal and Thin Film Mechanics (5 papers), Ion-surface interactions and analysis (4 papers), High-pressure geophysics and materials (4 papers), Semiconductor materials and devices (3 papers) and Copper Interconnects and Reliability (2 papers). The work is most often cited by research in Materials Chemistry (422 citations), Mechanics of Materials (130 citations), Electrical and Electronic Engineering (277 citations), Geophysics (42 citations) and Surfaces, Coatings and Films (16 citations). T. Heitz has collaborated with scholars based in France, Portugal and Germany. Frequent co-authors include B. Drévillon, J.E. Bourée, C. Godet, N. Layadi, I. Solomon, P. Roca i Cabarrocas, J. P. Conde, C. Clerc, Pavel Bulkin and Mário N. Berberan‐Santos. Their work appears in journals such as Journal of Non-Crystalline Solids, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters, Physical review. B, Condensed matter and Carbon.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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