B. Drévillon

6.8k total citations
231 papers, 5.3k citations indexed

About

B. Drévillon is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, B. Drévillon has authored 231 papers receiving a total of 5.3k indexed citations (citations by other indexed papers that have themselves been cited), including 139 papers in Electrical and Electronic Engineering, 111 papers in Materials Chemistry and 47 papers in Computational Mechanics. Recurrent topics in B. Drévillon's work include Thin-Film Transistor Technologies (107 papers), Silicon Nanostructures and Photoluminescence (74 papers) and Silicon and Solar Cell Technologies (55 papers). B. Drévillon is often cited by papers focused on Thin-Film Transistor Technologies (107 papers), Silicon Nanostructures and Photoluminescence (74 papers) and Silicon and Solar Cell Technologies (55 papers). B. Drévillon collaborates with scholars based in France, United Kingdom and Portugal. B. Drévillon's co-authors include Eric Compain, A. De Martino, C. Godet, T. Heitz, Satyendra Kumar, I. Solomon, N. Layadi, Pere Roca i Cabarrocas, J.E. Bourée and Stéphane Poirier and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

B. Drévillon

230 papers receiving 5.0k citations

Peers

Countries citing papers authored by B. Drévillon

Since Specialization

Citations

This map shows the geographic impact of B. Drévillon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Drévillon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Drévillon more than expected).

Fields of papers citing papers by B. Drévillon

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Drévillon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Drévillon. The network helps show where B. Drévillon may publish in the future.

Co-authorship network of co-authors of B. Drévillon

This figure shows the co-authorship network connecting the top 25 collaborators of B. Drévillon. A scholar is included among the top collaborators of B. Drévillon based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Drévillon. B. Drévillon is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Application of Mueller polarimetry in conical diffraction for critical dimension measurements in microelectronics 2006 ·Applied Optics ·Tatiana Novikova, A. De Martino, (unknown), B. Drévillon	88
2	Characterization of bidimensional gratings by spectroscopic ellipsometry and angle-resolved Mueller polarimetry 2004 ·Applied Optics ·(unknown), Tatiana Novikova, A. De Martino, B. Drévillon	21
3	Full-field optical coherence tomography with thermal light 2002 ·Applied Optics ·(unknown), A. De Martino, B. Drévillon, (unknown), Laurent Schwartz	54
4	Müller matrix measurements of small spherical particles deposited on a c-Si wafer 2002 ·Applied Optics ·(unknown), B. Drévillon	5
5	Application of Fourier transform infrared ellipsometry to assess the concentration of biological molecules 2002 ·Applied Optics ·Enric Garcia‐Caurel, B. Drévillon, A. De Martino, L. Schwartz	18
6	Direct numerical inversion method for kinetic ellipsometric data I Presentation of the method and numerical evaluation 2002 ·Applied Optics ·(unknown), (unknown), B. Drévillon	9
7	Ultraviolet phase-modulated ellipsometer 2002 ·Review of Scientific Instruments ·Enric Garcia‐Caurel, (unknown), (unknown), B. Drévillon	1
8	Three-dimensional microscopy through white light interferometry 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), A. De Martino, B. Drévillon, (unknown), Laurent Schwartz	2
9	Measurement of transversal ambipolar diffusion coefficient in microcrystalline silicon 2000 ·Journal of Non-Crystalline Solids ·R. Brenot, R. Vanderhaghen, B. Drévillon, Pere Roca i Cabarrocas	9
10	X-ray photoelectron spectra of adhesion-enhanced a-Si:H on stainless steel induced by plasma treatments 1998 ·HAL (Le Centre pour la Communication Scientifique Directe) ·(unknown), Nicolas Bertrand, (unknown), Pavel Bulkin, B. Drévillon, (unknown)	2
11	Complete Mueller matrix measurement with a single high frequency modulation 1998 ·Thin Solid Films ·Eric Compain, B. Drévillon, J. Huc, (unknown), J.E. Bourée	13
12	Real-time spectroscopic ellipsometry study of the growth of amorphous and microcrystalline silicon thin films prepared by alternating silicon deposition and hydrogen plasma treatment 1995 ·Physical review. B, Condensed matter ·N. Layadi, Pere Roca i Cabarrocas, B. Drévillon, I. Solomon	122
13	Substrate selectivity in the formation of microcrystalline silicon: Mechanisms and technological consequences 1995 ·Applied Physics Letters ·P. Roca i Cabarrocas, N. Layadi, T. Heitz, B. Drévillon, I. Solomon	139
14	An IR phase-modulated ellipsometer using a Fourier transform spectrometer for in situ applications 1993 ·Thin Solid Films ·A. Canillas, E. Pascual, B. Drévillon	17
15	In situ investigation of the growth of microcrystalline silicon obtained by alternating deposition and hydrogen-etching sequences 1991 ·Journal of Non-Crystalline Solids ·Mei Fang, (unknown), B. Drévillon	21
16	Spectroscopic ellipsometry of ultrathin films: From UV to IR 1988 ·Thin Solid Films ·B. Drévillon	24
17	I n s i t u spectroscopic ellipsometry investigation of the nucleation of microcrystalline silicon 1987 ·Applied Physics Letters ·B. Drévillon, C. Godet, Satyendra Kumar	23
18	Hydrogen content of amorphous silicon films deposited in a multipole plasma 1985 ·Journal of Applied Physics ·B. Drévillon, M. Toulemonde	25
19	Inclusive production of charged and neutral sigma hyperons in K−p interactions at 14.3 GeV/c 1975 ·Nuclear Physics B ·M. Bardadin-Otwinowska, A. Borg, F. Pierre, R. Barloutaud, C. Louedec, M. Spiro, B. Chaurand, B. Drévillon, J. Gago, G. Labrosse, R. Salmeron, K. Paler, S.N. Tovey, T.P. Shah, R. J. Miller, J.J. Phelan	15
20	Inclusive production of lambda and neutral kaon in K−p interactions at 3.93 GeV/c and 14.3 GeV/c 1974 ·Nuovo cimento della Società italiana di fisica. A, Nuclei, particles and fields ·A. Borg, M. Bardadin-Otwinowska, R. Barloutaud, C. Louedec, L. Moscoso, F. Pierre, M. Spiro, B. Chaurand, B. Drévillon, G. Labrosse, R. Lestienne, A. Rougé, R. Salmeron, H. Videau, R. Miller, K. Paler, J.J. Phelan, T.P. Shah, S.N. Tovey	31

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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