Sungju Park
About
In The Last Decade
Sungju Park
74 papers receiving 419 citations
Peers
Comparison fields: 5 of 77
- Electrical and Electronic Engineering 252
- Hardware and Architecture 210
- Computer Networks and Communications 68
- Molecular Biology 50
- Neurology 41
Countries citing papers authored by Sungju Park
This map shows the geographic impact of Sungju Park's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Sungju Park with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Sungju Park more than expected).
Fields of papers citing papers by Sungju Park
This network shows the impact of papers produced by Sungju Park. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Sungju Park. The network helps show where Sungju Park may publish in the future.
Co-authorship network of co-authors of Sungju Park
This figure shows the co-authorship network connecting the top 25 collaborators of Sungju Park. A scholar is included among the top collaborators of Sungju Park based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Sungju Park. Sungju Park is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 7 | |
| 4 | 11 | |
| 5 | 1 | |
| 6 | 2 | |
| 7 | 1 | |
| 8 | 0 | |
| 9 | 20 | |
| 10 | 4 | |
| 11 | 7 | |
| 12 | Efficient AMBA Based System-on-a-chip Core Test With IEEE 1500 Wrapper | 0 |
| 13 | 9 | |
| 14 | Interconnect Delay Fault Test in Boards and SoCs with Multiple System Clocks | 0 |
| 15 | Efficient Interconnect Test Patterns and BIST Implementation for Crosstalk and Static Faults | 1 |
| 16 | A Design of High Performance Parallel CRC Generator | 1 |
| 17 | A Reconfigurable Test Access Mechanism for Embedded Core Test | 1 |
| 18 | P1500 compliant Microcode - based Memory BIST for Testing of Embedded Memory | 0 |
| 19 | Complete Diagnosis Patterns for Wiring Interconnects | 2 |
| 20 | Partial Scan Design Based on Levelized Combinational Structure | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.