S. M. Donovan

37 papers receiving 540 citations

Peers

S. M. Donovan
Comparison fields: 5 of 27
  • Condensed Matter Physics 449
  • Electronic, Optical and Magnetic Materials 172
  • Electrical and Electronic Engineering 363
  • Mechanics of Materials 136
  • Materials Chemistry 159
Replace R. A. Skogman with:
R. A. Skogman United States
M. W. Leksono United States
I. Berishev United States
W. Imler United States
Kikurou Takemoto Japan
Kensaku Motoki Japan
A. S. Zubrilov Russia
Y. Dikme Germany
Anand V. Sampath United States
T. Yamamoto Japan
S. M. Donovan relative to R. A. Skogman United States R. A. Skogman's profile →
Citations per field
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Citations per year

Countries citing papers authored by S. M. Donovan

Since Specialization
Citations

This map shows the geographic impact of S. M. Donovan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. M. Donovan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. M. Donovan more than expected).

Fields of papers citing papers by S. M. Donovan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. M. Donovan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. M. Donovan. The network helps show where S. M. Donovan may publish in the future.

Co-authors

The 25 scholars most cited alongside S. M. Donovan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. M. Donovan Line = papers co-authored together S. M. Donovan links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 38 papers — load more, or switch the sort, to bring in the rest.

#Work
1 199971
2 199852
3 200051
4 199836
5 199931
6 199826
7 200025
8 199821
9 199720
10 199719
11 199816
12 199716
13 199915
14 199812
15 199712
16 199812
17 199911
18 199611
19 199911
20 199710

About S. M. Donovan

S. M. Donovan is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering, Mechanics of Materials, Electronic, Optical and Magnetic Materials and Materials Chemistry, having authored 38 papers that have together received 549 indexed citations. Recurring topics across this work include GaN-based semiconductor devices and materials (37 papers), Semiconductor materials and devices (26 papers), Metal and Thin Film Mechanics (19 papers), Plasma Diagnostics and Applications (10 papers), Ga2O3 and related materials (7 papers), ZnO doping and properties (4 papers), Silicon Carbide Semiconductor Technologies (2 papers) and Semiconductor materials and interfaces (2 papers). The work is most often cited by research in Condensed Matter Physics (449 citations), Electronic, Optical and Magnetic Materials (172 citations), Electrical and Electronic Engineering (363 citations), Mechanics of Materials (136 citations) and Materials Chemistry (159 citations). S. M. Donovan has collaborated with scholars based in United States, Germany and Israel. Frequent co-authors include S. J. Pearton, C. R. Abernathy, J. D. MacKenzie, R. J. Shul, Jung Han, F. Ren, C. G. Willison, R. G. Wilson, Hyun Cho and C. B. Vartuli. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Solid-State Electronics, Journal of Electronic Materials, Materials Science and Engineering B and MRS Internet Journal of Nitride Semiconductor Research.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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