R. Burch
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Embedded Systems Design Techniques
- Parallel Computing and Optimization Techniques
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- Low-power high-performance VLSI design
- VLSI and FPGA Design Techniques
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
Papers in
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- VLSI and Analog Circuit Testing 9
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- Manufacturing Process and Optimization 5
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (4 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)IEEE Journal of the Electron Devices Society (1 paper)Design Automation Conference (1 paper)
- Partner nations
- United States
In The Last Decade
R. Burch
17 papers receiving 520 citations
Peers
Comparison fields: 5 of 31
- Hardware and Architecture 360
- Electrical and Electronic Engineering 504
- Computational Theory and Mathematics 44
- Software 10
- Electronic, Optical and Magnetic Materials 33
Countries citing papers authored by R. Burch
This map shows the geographic impact of R. Burch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Burch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Burch more than expected).
Fields of papers citing papers by R. Burch
This network shows the impact of papers produced by R. Burch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Burch. The network helps show where R. Burch may publish in the future.
Co-authorship network
The 24 scholars most cited alongside R. Burch, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 0 | |
| 2 | 2021 | 1 | |
| 3 | 2006 | 1 | |
| 4 | 2003 | 0 | |
| 5 | 2003 | 1 | |
| 6 | 2003 | 8 | |
| 7 | 2003 | 11 | |
| 8 | 2002 | 0 | |
| 9 | 2002 | 1 | |
| 10 | 2002 | 7 | |
| 11 | 2002 | 4 | |
| 12 | 1998 | 4 | |
| 13 | 1997 | 1 | |
| 14 | 1993 | 3 | |
| 15 | 1993 | 275 | |
| 16 | 1992 | 5 | |
| 17 | 1991 | 25 | |
| 18 | 1990 | 153 | |
| 19 | 1989 | 11 | |
| 20 | 1988 | 50 |
About R. Burch
R. Burch is a scholar working on Hardware and Architecture, Industrial and Manufacturing Engineering, Statistics, Probability and Uncertainty, Electrical and Electronic Engineering and Computational Theory and Mathematics, having authored 20 papers that have together received 561 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (9 papers), Low-power high-performance VLSI design (8 papers), Manufacturing Process and Optimization (5 papers), VLSI and FPGA Design Techniques (5 papers), Electromagnetic Simulation and Numerical Methods (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Copper Interconnects and Reliability (3 papers) and Electromagnetic Scattering and Analysis (3 papers). The work is most often cited by research in Hardware and Architecture (360 citations), Electrical and Electronic Engineering (504 citations), Computational Theory and Mathematics (44 citations), Software (10 citations) and Electronic, Optical and Magnetic Materials (33 citations). R. Burch has collaborated with scholars based in United States. Frequent co-authors include Farid N. Najm, Po-Hui Yang, T.N. Trick, Ping Yang, I.N. Hajj, D.E. Hocevar, P. Cox, Izzat El Hajj, Kartikeya Mayaram and Vasant B. Rao. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Transactions on Semiconductor Manufacturing, IEEE Journal of the Electron Devices Society and Design Automation Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.