P.K. Mozumder

412 total citations
31 papers, 272 citations indexed

About

P.K. Mozumder is a scholar working on Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Statistics, Probability and Uncertainty. According to data from OpenAlex, P.K. Mozumder has authored 31 papers receiving a total of 272 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 16 papers in Industrial and Manufacturing Engineering and 12 papers in Statistics, Probability and Uncertainty. Recurrent topics in P.K. Mozumder's work include Advanced Statistical Process Monitoring (11 papers), Manufacturing Process and Optimization (10 papers) and Industrial Vision Systems and Defect Detection (9 papers). P.K. Mozumder is often cited by papers focused on Advanced Statistical Process Monitoring (11 papers), Manufacturing Process and Optimization (10 papers) and Industrial Vision Systems and Defect Detection (9 papers). P.K. Mozumder collaborates with scholars based in United States, India and Germany. P.K. Mozumder's co-authors include Duane S. Boning, Gabriel G. Barna, Sharad Saxena, Andrzej J. Strojwas, Dave Collins, Lee M. Loewenstein, R.S. Gyurcsik, Martha Gardner, Jye‐Chyi Lu and Jerry A. Stefani and has published in prestigious journals such as Proceedings of the IEEE, IEEE Transactions on Electron Devices and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

In The Last Decade

P.K. Mozumder

26 papers receiving 259 citations

Peers

P.K. Mozumder

SPU

EEE

IME

CSE

MSOR

S.W. Director United States

LeRoy Winemberg United States

Tim Kramer United States

Vitaly Promyslov Russia

Eric Felt United States

Shupeng Sun United States

Marco Stolpe Germany

Jean-Marc Thiriet France

Vladimir Sklyar Ukraine

K.K. Schwarz United States

S.W. Director United States

P.K. Mozumder

30 ×0.3

SPU

335 ×3.4

EEE

42 ×0.5

IME

15 ×0.2

CSE

39 ×0.9

MSOR

Citations per year, relative to P.K. Mozumder P.K. Mozumder (= 1×) peers S.W. Director

Countries citing papers authored by P.K. Mozumder

Since Specialization

Citations

This map shows the geographic impact of P.K. Mozumder's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.K. Mozumder with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.K. Mozumder more than expected).

Fields of papers citing papers by P.K. Mozumder

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P.K. Mozumder. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.K. Mozumder. The network helps show where P.K. Mozumder may publish in the future.

Co-authorship network of co-authors of P.K. Mozumder

This figure shows the co-authorship network connecting the top 25 collaborators of P.K. Mozumder. A scholar is included among the top collaborators of P.K. Mozumder based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P.K. Mozumder. P.K. Mozumder is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Shohag, Sheikh, et al.. (2024). Peak Load Truncation From Consumer End: A Responsive Temperature Control Method of an Air Conditioner. 1–6.

Duvall, Steven G., M.D. Giles, Rachel D. Harris, et al.. (2005). Developing and Integrating TCAD Applications with the Semiconductor Wafer Representation. 199–204. 2 indexed citations

Mozumder, P.K., et al.. (2003). Statistical process simulation for CAD/CAM. 13.5/1–13.5/4.

Saxena, Sharad, et al.. (2002). An application of process synthesis methodology for first-pass fabrication success of high-performance deep-submicron CMOS. 149–152.

Mozumder, P.K., Sharad Saxena, & Kelly Taylor. (2002). Simultaneous control of multiple nonuniformity metrics using site models and monitor wafer control. nc27512 8000. 205–210. 2 indexed citations

Chatterjee, Amitava, et al.. (2002). Pass transistor designs using pocket implant to improve manufacturability for 256 Mbit DRAM and beyond. 87–90. 5 indexed citations

Saxena, Sharad, et al.. (1999). A new methodology for concurrent technology development and cell library optimization. 18–24. 1 indexed citations

Mozumder, P.K., et al.. (1998). Recent advances in process synthesis for semiconductor devices. IEEE Transactions on Electron Devices. 45(3). 626–633. 4 indexed citations

Saxena, Sharad, et al.. (1997). Methods for the design of microelectronic devices and process flows for manufacturability. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3212. 18–18. 1 indexed citations

10.

Gardner, Martha, et al.. (1997). Equipment fault detection using spatial signatures. 20(4). 295–304. 46 indexed citations

11.

Mozumder, P.K. & Amitava Chatterjee. (1996). A statistical methodology as applied to a 256 Mbit DRAM pass transistor design. IEEE Transactions on Semiconductor Manufacturing. 9(3). 437–446. 1 indexed citations

12.

Barna, Gabriel G., Lee M. Loewenstein, Stephanie Watts Butler, et al.. (1994). Sensor integration into plasma etch reactors of a developmental pilot line. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(4). 2860–2867. 4 indexed citations

13.

Collins, David, Andrzej J. Strojwas, & P.K. Mozumder. (1994). <title>Model-based equipment diagnosis</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7 indexed citations

14.

Mozumder, P.K. & Gabriel G. Barna. (1994). Statistical feedback control of a plasma etch process. IEEE Transactions on Semiconductor Manufacturing. 7(1). 1–11. 38 indexed citations

15.

Boning, Duane S. & P.K. Mozumder. (1994). DOE/Opt: a system for design of experiments, response surface modeling, and optimization using process and device simulation. IEEE Transactions on Semiconductor Manufacturing. 7(2). 233–244. 59 indexed citations

16.

Giles, M.D., Duane S. Boning, Mark E. Law, et al.. (1994). Semiconductor wafer representation for TCAD. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 13(1). 82–95. 7 indexed citations

17.

Mozumder, P.K., Sharad Saxena, & Dave Collins. (1994). A monitor wafer based controller for semiconductor processes. IEEE Transactions on Semiconductor Manufacturing. 7(3). 400–411. 25 indexed citations

18.

Mozumder, P.K., et al.. (1993). An integrated technology CAD system for process and device designers. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 1(4). 482–490. 1 indexed citations

19.

Mozumder, P.K. & Andrzej J. Strojwas. (1990). Statistical control of VLSI fabrication processes. Proceedings of the IEEE. 78(2). 436–455. 1 indexed citations

20.

Mozumder, P.K., et al.. (1988). Statistical control of VLSI fabrication processes. A framework. IEEE Transactions on Semiconductor Manufacturing. 1(2). 62–71. 16 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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