N. Finnegan

424 total citations
19 papers, 367 citations indexed

About

N. Finnegan is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Computational Mechanics. According to data from OpenAlex, N. Finnegan has authored 19 papers receiving a total of 367 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 8 papers in Mechanics of Materials and 6 papers in Computational Mechanics. Recurrent topics in N. Finnegan's work include Metal and Thin Film Mechanics (8 papers), Semiconductor materials and devices (7 papers) and Ion-surface interactions and analysis (6 papers). N. Finnegan is often cited by papers focused on Metal and Thin Film Mechanics (8 papers), Semiconductor materials and devices (7 papers) and Ion-surface interactions and analysis (6 papers). N. Finnegan collaborates with scholars based in United States, Sweden and Italy. N. Finnegan's co-authors include J. E. Baker, C.M. Loxton, Scott MacLaren, Richard T. Haasch, S. L. Rohde, F. Namavar, Samir Aouadi, I. Petrov, Paul W. Bohn and Mats Eriksson and has published in prestigious journals such as Journal of Applied Physics, Sensors and Actuators B Chemical and Thin Solid Films.

In The Last Decade

N. Finnegan

19 papers receiving 354 citations

Peers

Countries citing papers authored by N. Finnegan

Since Specialization

Citations

This map shows the geographic impact of N. Finnegan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Finnegan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Finnegan more than expected).

Fields of papers citing papers by N. Finnegan

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Finnegan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Finnegan. The network helps show where N. Finnegan may publish in the future.

Co-authorship network of co-authors of N. Finnegan

This figure shows the co-authorship network connecting the top 25 collaborators of N. Finnegan. A scholar is included among the top collaborators of N. Finnegan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. Finnegan. N. Finnegan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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19 of 19 papers shown

#	Work	Indexed citations
1	Factors influencing the interfacial width of copper gradients on gold produced by spatiotemporal control of the in-plane electrochemical potential distribution: electrode geometry and plating solution composition 2004 ·Journal of Electroanalytical Chemistry ·(unknown), N. Finnegan, Paul W. Bohn	8
2	Sharply defined lateral composition gradients of copper on gold by spatiotemporal control of the in-plane electrochemical potential distribution 2004 ·Thin Solid Films ·(unknown), N. Finnegan, Paul W. Bohn	7
3	Long-term thermal stability of Ti/Al/Mo/Au ohmic contacts on n-GaN 2003 ·Journal of Electronic Materials ·D. Selvanathan, (unknown), V. Kumar, I. Adesida, N. Finnegan	24
4	Experimental evidence for a dissociation mechanism in NH3 detection with MIS field-effect devices 2003 ·Sensors and Actuators B Chemical ·(unknown), Elisabetta Comini, Giorgio Sberveglieri, N. Finnegan, I. Petrov, Lars Hultman, Mats Eriksson	8
5	Characterization of the metal–insulator interface of field-effect chemical sensors 2003 ·Journal of Applied Physics ·(unknown), Richard T. Haasch, Niklas Hellgren, N. Finnegan, Lars Hultman, Mats Eriksson	25
6	Characterization of CrBN films deposited by ion beam assisted deposition 2002 ·Journal of Applied Physics ·Samir Aouadi, F. Namavar, Eric Tobin, N. Finnegan, Richard T. Haasch, Roshanak Nilchiani, Joseph A. Turner, S. L. Rohde	29
7	Characterization of Ti-based nanocrystalline ternary nitride films 2002 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Samir Aouadi, (unknown), F. Namavar, N. Finnegan, S. L. Rohde	24
8	Epitaxial TiN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar+ Sputter Etching 2000 ·Surface Science Spectra ·N. Finnegan, Taeyoon Lee, Richard T. Haasch, J. E. Greene, I. Petrov	1
9	A Comparison of Auger Electron Spectra from Stoichiometric Epitaxial TiN(001) After (1) UHV Cleaving and (2) Ar+ Sputter Etching 2000 ·Surface Science Spectra ·N. Finnegan, Richard T. Haasch, Daniel Gall, Suneel Kodambaka, J. E. Greene, I. Petrov	6
10	Epitaxial VN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar+ Sputter Etching 2000 ·Surface Science Spectra ·N. Finnegan, Taeyoon Lee, Richard T. Haasch, J. E. Greene, I. Petrov	1
11	In situ X-ray Photoelectron, Ultraviolet Photoelectron, and Auger Electron Spectroscopy Spectra from First-Row Transition-Metal Nitrides: ScN, TiN, VN, and CrN 2000 ·Surface Science Spectra ·Daniel Gall, Richard T. Haasch, N. Finnegan, Taeyoon Lee, Cheung Soo Shin, E. Sammann, J. E. Greene, I. Petrov	27
12	Formation of amorphous aluminum oxide and gallium oxide on InP substrates by water vapor oxidation 1998 ·Journal of Applied Physics ·(unknown), K. C. Hsieh, (unknown), K. Y. Cheng, N. Finnegan	9
13	Chemical and matrix effects on sensitivity factors in electron spectroscopies. I. C and Si containing materials 1996 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·(unknown), Richard T. Haasch, N. Finnegan, (unknown), Richard C. Alkire, H. H. Farrell	11
14	Effects of low-temperature annealing on the native oxide of AlxGa1−xAs 1993 ·Journal of Applied Physics ·A. R. Sugg, (unknown), N. Holonyak, K. C. Hsieh, J. E. Baker, N. Finnegan	30
15	Surface roughness development during sputtering of GaAs and InP: Evidence for the role of surface diffusion in ripple formation and sputter cone development 1992 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·Scott MacLaren, J. E. Baker, N. Finnegan, C.M. Loxton	130
16	Effect of heat treatment on the elemental distribution of Si,C,N,O fibers 1992 ·Ceramics International ·Avigdor Zangvil, (unknown), N. Finnegan, Jonathan Lipowitz	12
17	Etching of InP in methane-based plasmas 1990 ·I. Adesida, E. Andideh, C. L. Jones, N. Finnegan	2
18	Sputtered Fitas of Amorphous Hydrogenated Silicon Carbide 1987 ·MRS Proceedings ·R. Rizk, Alain E. Kaloyeros, Wendell S. Williams, N. Finnegan, (unknown)	1
19	Annealing encapsulants for InP I: Auger electron and secondary ion mass spectrometric studies 1982 ·Thin Solid Films ·J. D. Oberstar, B. G. Streetman, J. E. Baker, N. Finnegan, E. Sammann, (unknown)	12

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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