Moritz Fieback

509 total citations
45 papers, 252 citations indexed

About

Moritz Fieback is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Cellular and Molecular Neuroscience. According to data from OpenAlex, Moritz Fieback has authored 45 papers receiving a total of 252 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Electrical and Electronic Engineering, 9 papers in Hardware and Architecture and 8 papers in Cellular and Molecular Neuroscience. Recurrent topics in Moritz Fieback's work include Ferroelectric and Negative Capacitance Devices (29 papers), Advanced Memory and Neural Computing (27 papers) and Semiconductor materials and devices (20 papers). Moritz Fieback is often cited by papers focused on Ferroelectric and Negative Capacitance Devices (29 papers), Advanced Memory and Neural Computing (27 papers) and Semiconductor materials and devices (20 papers). Moritz Fieback collaborates with scholars based in Netherlands, Germany and France. Moritz Fieback's co-authors include Said Hamdioui, Mottaqiallah Taouil, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mathieu Moreau, Erik Jan Marinissen, Siddharth Rao, Tobias Gemmeke and Gouri Sankar Kar and has published in prestigious journals such as IEEE Access, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Electronics.

In The Last Decade

Moritz Fieback

38 papers receiving 247 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Moritz Fieback Netherlands 11 227 58 53 23 20 45 252
James Chien-Mo Li Taiwan 8 292 1.3× 249 4.3× 19 0.4× 39 1.7× 16 0.8× 53 332
Rajendra Bishnoi Netherlands 11 223 1.0× 24 0.4× 51 1.0× 36 1.6× 6 0.3× 25 247
Rafaella Fiorelli Spain 11 321 1.4× 52 0.9× 62 1.2× 15 0.7× 7 0.3× 33 359
Fotis Plessas Greece 10 235 1.0× 88 1.5× 26 0.5× 30 1.3× 3 0.1× 44 282
Pradip Mandal India 11 380 1.7× 50 0.9× 11 0.2× 10 0.4× 17 0.8× 68 412
Carmen Aracil Spain 11 151 0.7× 8 0.1× 35 0.7× 24 1.0× 38 1.9× 33 325
Pedro Toledo Brazil 13 423 1.9× 9 0.2× 40 0.8× 14 0.6× 7 0.3× 44 476
Changku Hwang United States 9 271 1.2× 76 1.3× 20 0.4× 19 0.8× 8 0.4× 26 332
R. Rodríguez‐Montañés Spain 13 705 3.1× 545 9.4× 37 0.7× 16 0.7× 15 0.8× 59 735
Wenjing Rao United States 11 325 1.4× 174 3.0× 34 0.6× 22 1.0× 29 1.4× 45 346

Countries citing papers authored by Moritz Fieback

Since Specialization
Citations

This map shows the geographic impact of Moritz Fieback's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Moritz Fieback with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Moritz Fieback more than expected).

Fields of papers citing papers by Moritz Fieback

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Moritz Fieback. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Moritz Fieback. The network helps show where Moritz Fieback may publish in the future.

Co-authorship network of co-authors of Moritz Fieback

This figure shows the co-authorship network connecting the top 25 collaborators of Moritz Fieback. A scholar is included among the top collaborators of Moritz Fieback based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Moritz Fieback. Moritz Fieback is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Fieback, Moritz, Mottaqiallah Taouil, Xiuyan Li, et al.. (2025). Device-Aware Test for Anomalous Charge Trapping in FeFETs. 635–641. 1 indexed citations
2.
Aziza, H., et al.. (2025). Experimental Analysis and Circuit-Level Mitigation Strategies for Intermittent Errors in Resistive RAMs. IEEE Transactions on Device and Materials Reliability. 26(1). 93–101.
3.
4.
Aziza, H., et al.. (2025). Conductance variability in RRAM and its implications at the neural network level. Microelectronics Reliability. 166. 115594–115594. 1 indexed citations
5.
Fieback, Moritz, et al.. (2024). A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing. Journal of Electronic Testing. 40(2). 245–257. 3 indexed citations
6.
Fieback, Moritz, et al.. (2024). Device-Aware Diagnosis for Yield Learning in RRAMs. 1–6. 2 indexed citations
7.
Li, Chaobo, Mottaqiallah Taouil, Moritz Fieback, et al.. (2024). Defects, Fault Modeling, and Test Development Framework for FeFETs. 91–95. 2 indexed citations
8.
Aziza, H., et al.. (2024). Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. 1–5. 1 indexed citations
9.
Fieback, Moritz, et al.. (2023). Device-Aware Test for Ion Depletion Defects in RRAMs. Research Repository (Delft University of Technology). 246–255. 4 indexed citations
10.
Fieback, Moritz, et al.. (2023). Online Fault Detection and Diagnosis in RRAM. Research Repository (Delft University of Technology). 1–6. 5 indexed citations
11.
Fieback, Moritz, et al.. (2023). Characterization and Test of Intermittent Over RESET in RRAMs. Research Repository (Delft University of Technology). 1 indexed citations
12.
Fieback, Moritz, Siddharth Rao, Erik Jan Marinissen, et al.. (2023). Device Aware Diagnosis for Unique Defects in STT-MRAMs. Research Repository (Delft University of Technology). 1–6. 1 indexed citations
13.
Fieback, Moritz, Erik Jan Marinissen, Gouri Sankar Kar, et al.. (2023). Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. 236–245. 2 indexed citations
14.
Taouil, Mottaqiallah, Moritz Fieback, Erik Jan Marinissen, et al.. (2023). Device-Aware Test for Back-Hopping Defects in STT-MRAMs. Research Repository (Delft University of Technology). 1–6. 2 indexed citations
15.
Fieback, Moritz, Lizhou Wu, Hassen Aziza, et al.. (2022). Defects, Fault Modeling, and Test Development Framework for RRAMs. ACM Journal on Emerging Technologies in Computing Systems. 18(3). 1–26. 26 indexed citations
16.
Fieback, Moritz, et al.. (2021). Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29(6). 1271–1284. 9 indexed citations
17.
Aziza, Hassen, Mathieu Moreau, Moritz Fieback, Mottaqiallah Taouil, & Said Hamdioui. (2020). An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). IEEE Access. 8. 137263–137274. 11 indexed citations
18.
Wu, Lizhou, Siddharth Rao, Mottaqiallah Taouil, et al.. (2019). Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Transactions on Emerging Topics in Computing. 9(2). 707–723. 21 indexed citations
19.
Fieback, Moritz, Mottaqiallah Taouil, & Said Hamdioui. (2018). Testing Resistive Memories: Where are We and What is Missing?. 1–9. 20 indexed citations
20.
Fieback, Moritz. (2017). DRAM Reliability: Aging Analysis and Reliability Prediction Model. Research Repository (Delft University of Technology). 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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