Maximilian W. Feil
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Renewable Energy, Sustainability and the Environment
- Co-authors
- Markus DöblingerHe HuangJochen FeldmannLakshminarayana PolavarapuH. ReisingerThomas AichingerA. RichterYu Tong
- Topics
- Semiconductor materials and devices (19 papers)Advancements in Semiconductor Devices and Circuit Design (17 papers)Silicon Carbide Semiconductor Technologies (17 papers)
In The Last Decade
Maximilian W. Feil
22 papers receiving 437 citations
Peers
Comparison fields: 5 of 25
- Electrical and Electronic Engineering 412
- Materials Chemistry 222
- Atomic and Molecular Physics, and Optics 63
- Electronic, Optical and Magnetic Materials 28
- Renewable Energy, Sustainability and the Environment 26
Countries citing papers authored by Maximilian W. Feil
This map shows the geographic impact of Maximilian W. Feil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Maximilian W. Feil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Maximilian W. Feil more than expected).
Fields of papers citing papers by Maximilian W. Feil
This network shows the impact of papers produced by Maximilian W. Feil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Maximilian W. Feil. The network helps show where Maximilian W. Feil may publish in the future.
Co-authorship network of co-authors of Maximilian W. Feil
This figure shows the co-authorship network connecting the top 25 collaborators of Maximilian W. Feil. A scholar is included among the top collaborators of Maximilian W. Feil based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Maximilian W. Feil. Maximilian W. Feil is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 6 | |
| 3 | 3 | |
| 4 | 0 | |
| 5 | 0 | |
| 6 | 9 | |
| 7 | 20 | |
| 8 | 3 | |
| 9 | 3 | |
| 10 | 10 | |
| 11 | 12 | |
| 12 | 2 | |
| 13 | 28 | |
| 14 | 26 | |
| 15 | 25 | |
| 16 | 10 | |
| 17 | 48 | |
| 18 | 9 | |
| 19 | 7 | |
| 20 | 115 |
About Maximilian W. Feil
Maximilian W. Feil is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Polymers and Plastics, having authored 25 papers that have together received 441 indexed citations. Recurring topics across this work include Semiconductor materials and devices (19 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers) and Silicon Carbide Semiconductor Technologies (17 papers). The work is most often cited by research in Electrical and Electronic Engineering (412 citations), Materials Chemistry (222 citations) and Acoustics and Ultrasonics (3 citations). Maximilian W. Feil has collaborated with scholars based in Germany, Austria and Canada. Frequent co-authors include Markus Döblinger, He Huang, Jochen Feldmann, Lakshminarayana Polavarapu, H. Reisinger, Thomas Aichinger, A. Richter, Yu Tong, Tibor Grasser and En‐Ping Yao. Their work appears in journals such as Angewandte Chemie International Edition, Journal of Applied Physics and Chemistry of Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.