M. P. Murrell

411 total citations
14 papers, 313 citations indexed

About

M. P. Murrell is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. P. Murrell has authored 14 papers receiving a total of 313 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 5 papers in Computational Mechanics and 4 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. P. Murrell's work include Integrated Circuits and Semiconductor Failure Analysis (9 papers), Ion-surface interactions and analysis (5 papers) and Semiconductor materials and devices (5 papers). M. P. Murrell is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (9 papers), Ion-surface interactions and analysis (5 papers) and Semiconductor materials and devices (5 papers). M. P. Murrell collaborates with scholars based in United Kingdom, Belgium and Switzerland. M. P. Murrell's co-authors include Mark E. Welland, S. J. O’Shea, C.J. Sofield, J. R. Barnes, Steven Verhaverbeke, Marc Heyns, J. E. Draper, Clifton Woods, N. E. B. Cowern and A. N. Broers and has published in prestigious journals such as Applied Physics Letters, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and Vacuum.

In The Last Decade

M. P. Murrell

14 papers receiving 305 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. P. Murrell United Kingdom 8 210 171 88 58 56 14 313
M. Richter United States 11 306 1.5× 283 1.7× 97 1.1× 17 0.3× 65 1.2× 29 460
Akira Obara Japan 11 380 1.8× 235 1.4× 291 3.3× 45 0.8× 38 0.7× 52 465
J. S. Park United States 7 336 1.6× 292 1.7× 159 1.8× 47 0.8× 60 1.1× 9 451
R. E. Kremer United States 9 256 1.2× 222 1.3× 129 1.5× 11 0.2× 18 0.3× 20 358
K. Seibert Germany 9 213 1.0× 169 1.0× 166 1.9× 49 0.8× 68 1.2× 17 346
R. W. Streater Canada 12 250 1.2× 250 1.5× 105 1.2× 16 0.3× 78 1.4× 31 359
V. D. Tkachev Belarus 11 294 1.4× 148 0.9× 247 2.8× 64 1.1× 44 0.8× 25 390
Paul S. Ho United States 8 216 1.0× 330 1.9× 103 1.2× 27 0.5× 57 1.0× 11 404
S. L. Skala United States 8 157 0.7× 302 1.8× 99 1.1× 15 0.3× 80 1.4× 17 371
Tadatsugu Itoh Japan 12 351 1.7× 152 0.9× 157 1.8× 110 1.9× 51 0.9× 44 422

Countries citing papers authored by M. P. Murrell

Since Specialization
Citations

This map shows the geographic impact of M. P. Murrell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. P. Murrell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. P. Murrell more than expected).

Fields of papers citing papers by M. P. Murrell

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. P. Murrell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. P. Murrell. The network helps show where M. P. Murrell may publish in the future.

Co-authorship network of co-authors of M. P. Murrell

This figure shows the co-authorship network connecting the top 25 collaborators of M. P. Murrell. A scholar is included among the top collaborators of M. P. Murrell based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. P. Murrell. M. P. Murrell is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

14 of 14 papers shown
1.
O’Shea, S. J., et al.. (1995). Conducting atomic force microscopy study of silicon dioxide breakdown. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(5). 1945–1952. 113 indexed citations
2.
Barnes, J. R., A. C. F. Hoole, M. P. Murrell, et al.. (1995). Characterization of electron beam induced modification of thermally grown SiO2. Applied Physics Letters. 67(11). 1538–1540. 13 indexed citations
3.
Murrell, M. P., et al.. (1995). Conducting AFM: Applications to Semiconductor Surfaces. MRS Proceedings. 386. 1 indexed citations
4.
Murrell, M. P.. (1994). Ion scattering spectroscopy. Vacuum. 45(6-7). 773–781. 3 indexed citations
5.
Murrell, M. P., Mark E. Welland, S. J. O’Shea, et al.. (1993). Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied Physics Letters. 62(7). 786–788. 92 indexed citations
6.
Welland, Mark E. & M. P. Murrell. (1993). Characterisation of electronic and structural properties of thin silicon dioxide films by scanned probe microscopy. Scanning. 15(5). 251–256. 8 indexed citations
7.
Sofield, C.J., et al.. (1992). Radiation enhanced adhesion by MeV ions. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 67(1-4). 452–457. 3 indexed citations
8.
Sofield, C.J., et al.. (1992). Sputtering by MeV ions. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 67(1-4). 569–573. 24 indexed citations
9.
Verhaverbeke, Steven, J. L. Alay, Paul Mertens, et al.. (1992). Surface Characterisation of Si After HF Treatments and its Influence on the Dielectric Breakdown of Thermal Oxides. MRS Proceedings. 259. 3 indexed citations
10.
Sofield, C.J., et al.. (1992). Cleaning Procedures for UHV Cluster-tool MOS Fabrication. MRS Proceedings. 259. 2 indexed citations
11.
Murrell, M. P., et al.. (1991). Silicon transport during oxidation. Philosophical Magazine B. 63(6). 1277–1287. 12 indexed citations
12.
Sofield, C.J., et al.. (1990). Thin film adhesion modification by MeV ion beams: A model based on ion track concepts. Radiation effects and defects in solids. 115(1-3). 79–82. 4 indexed citations
13.
Sofield, C.J., et al.. (1989). MeV ion enhanced adhesion in the gold on tantalum system. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 44(2). 137–140. 7 indexed citations
14.
Woods, Clifton, C.J. Sofield, N. E. B. Cowern, M. P. Murrell, & J. E. Draper. (1984). Comparison of charge-changing cross sections in gaseous and solid targets. Journal of Physics B Atomic and Molecular Physics. 17(5). 867–878. 28 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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