L. Bolzani

412 citations
36 papers · 288 indexed · h-index 11
Topics
VLSI and Analog Circuit Testing (20 papers)Radiation Effects in Electronics (14 papers)Integrated Circuits and Semiconductor Failure Analysis (10 papers)
Partner nations
ItalyBrazilUnited States

In The Last Decade

L. Bolzani

36 papers receiving 269 citations

Peers

L. Bolzani
Comparison fields: 5 of 31
  • Electrical and Electronic Engineering 244
  • Hardware and Architecture 175
  • Computer Networks and Communications 56
  • Software 31
  • Pharmacology 16
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Citations per field
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Citations per year

Countries citing papers authored by L. Bolzani

Since Specialization
Citations

This map shows the geographic impact of L. Bolzani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Bolzani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Bolzani more than expected).

Fields of papers citing papers by L. Bolzani

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Bolzani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Bolzani. The network helps show where L. Bolzani may publish in the future.

Co-authorship network of co-authors of L. Bolzani

This figure shows the co-authorship network connecting the top 25 collaborators of L. Bolzani. A scholar is included among the top collaborators of L. Bolzani based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L. Bolzani. L. Bolzani is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 6
2 14
3 11
4 3
5 8
6 1
7 19
8 22
9 20
10
On Test Program Generation for Peripheral Components in a SoC Resorting to High-Level Metrics
3
11 8
12 1
13 1
14 4
15 10
16 18
17 1
18
SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: are they a good remedy? A Case Study on a COTS Microprocessor
2
19
On the Mitigation of Conducted Electromagnetic Immunity by Means of SW-Based Fault Handling Mechanisms
4
20
Experimental research on antiepileptic activity of propranolol.
2

About L. Bolzani

L. Bolzani is a scholar working on Hardware and Architecture, Software and Electrical and Electronic Engineering, having authored 36 papers that have together received 288 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (20 papers), Radiation Effects in Electronics (14 papers) and Integrated Circuits and Semiconductor Failure Analysis (10 papers). The work is most often cited by research in Hardware and Architecture (175 citations), Software (31 citations) and Electrical and Electronic Engineering (244 citations). L. Bolzani has collaborated with scholars based in Italy, Brazil and United States. Frequent co-authors include Fabian Vargas, M. Sonza Reorda, M. Violante, Maurizio Rebaudengo, Andrea Calimera, Paolo Bernardi, Alberto Macii, Enrico Macii, Massimo Poncino and Ernesto Sánchez. Their work appears in journals such as IEEE Transactions on Computers, Journal of Electronic Testing and PubMed.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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