K. P. Mogilnikov
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Electronic, Optical and Magnetic Materials top 5%
- Mechanics of Materials top 5%
- Biomedical Engineering
- Co-authors
- Mikhaı̈l R. BaklanovF. N. DultsevV. G. PolovinkinQuoc Toan LeF.K. de TheijeRuud BalkenendeMarcel A. VerheijenV. A. Gritsenko
- Topics
- Copper Interconnects and Reliability (19 papers)Semiconductor materials and devices (17 papers)Mesoporous Materials and Catalysis (8 papers)
- Journals
- SHILAP Revista de lepidopterologíaJournal of Applied PhysicsThe Journal of Physical Chemistry B
- Partner nations
- RussiaBelgiumUnited States
In The Last Decade
K. P. Mogilnikov
37 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 55
- Electrical and Electronic Engineering 729
- Materials Chemistry 680
- Electronic, Optical and Magnetic Materials 675
- Mechanics of Materials 313
- Biomedical Engineering 134
Countries citing papers authored by K. P. Mogilnikov
This map shows the geographic impact of K. P. Mogilnikov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. P. Mogilnikov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. P. Mogilnikov more than expected).
Fields of papers citing papers by K. P. Mogilnikov
This network shows the impact of papers produced by K. P. Mogilnikov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. P. Mogilnikov. The network helps show where K. P. Mogilnikov may publish in the future.
Co-authorship network of co-authors of K. P. Mogilnikov
This figure shows the co-authorship network connecting the top 25 collaborators of K. P. Mogilnikov. A scholar is included among the top collaborators of K. P. Mogilnikov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. P. Mogilnikov. K. P. Mogilnikov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 9 | |
| 3 | 5 | |
| 4 | 4 | |
| 5 | 13 | |
| 6 | 0 | |
| 7 | 9 | |
| 8 | 13 | |
| 9 | 22 | |
| 10 | 12 | |
| 11 | 93 | |
| 12 | 2 | |
| 13 | Characterization of porous dielectric films by ellipsometric porosimetry. | 6 |
| 14 | 1 | |
| 15 | 12 | |
| 16 | 2 | |
| 17 | Anomalous scattering of photoinjected electrons in an amorphous film | 5 |
| 18 | 26 | |
| 19 | 4 | |
| 20 | 1 |
About K. P. Mogilnikov
K. P. Mogilnikov is a scholar working on Electronic, Optical and Magnetic Materials, Ceramics and Composites and Mechanics of Materials, having authored 39 papers that have together received 1.3k indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (19 papers), Semiconductor materials and devices (17 papers) and Mesoporous Materials and Catalysis (8 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (675 citations), Ceramics and Composites (93 citations) and Materials Chemistry (680 citations). K. P. Mogilnikov has collaborated with scholars based in Russia, Belgium and United States. Frequent co-authors include Mikhaı̈l R. Baklanov, F. N. Dultsev, V. G. Polovinkin, Quoc Toan Le, F.K. de Theije, Ruud Balkenende, Marcel A. Verheijen, V. A. Gritsenko, Kenneth P. Rodbell and V. Patel. Their work appears in journals such as SHILAP Revista de lepidopterología, Journal of Applied Physics and The Journal of Physical Chemistry B.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.