M.L. Bushnell

3.0k total citations · 1 hit paper
104 papers, 1.9k citations indexed

About

M.L. Bushnell is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering. According to data from OpenAlex, M.L. Bushnell has authored 104 papers receiving a total of 1.9k indexed citations (citations by other indexed papers that have themselves been cited), including 97 papers in Electrical and Electronic Engineering, 89 papers in Hardware and Architecture and 7 papers in Biomedical Engineering. Recurrent topics in M.L. Bushnell's work include VLSI and Analog Circuit Testing (84 papers), Integrated Circuits and Semiconductor Failure Analysis (63 papers) and Low-power high-performance VLSI design (35 papers). M.L. Bushnell is often cited by papers focused on VLSI and Analog Circuit Testing (84 papers), Integrated Circuits and Semiconductor Failure Analysis (63 papers) and Low-power high-performance VLSI design (35 papers). M.L. Bushnell collaborates with scholars based in United States, United Kingdom and Germany. M.L. Bushnell's co-authors include Vishwani D. Agrawal, T.J. Chakraborty, Srimat Chakradhar, K. Heragu, Xinghao Chen, Ramesh Ramadoss, G. Parthasarathy, Rohit Pandey, Seongmoon Wang and Subhashis Majumder and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Discrete Applied Mathematics.

In The Last Decade

M.L. Bushnell

99 papers receiving 1.8k citations

Hit Papers

Essentials of Electronic Testing for Digital, Memory and ... 2002 2026 2010 2018 2002 250 500 750 1000
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
    2002 1.0k citations M.L. Bushnell, Vishwani D. Agrawal profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M.L. Bushnell United States 17 1.7k 1.6k 158 131 100 104 1.9k
Spyros Tragoudas United States 21 1.2k 0.7× 947 0.6× 96 0.6× 228 1.7× 462 4.6× 237 1.7k
Wu-Tung Cheng United States 29 2.8k 1.6× 2.7k 1.7× 232 1.5× 48 0.4× 123 1.2× 182 3.0k
Jerzy Tyszer United States 30 2.9k 1.7× 3.0k 1.9× 524 3.3× 77 0.6× 105 1.1× 157 3.2k
Krzysztof Koźmiński United States 8 927 0.6× 872 0.5× 66 0.4× 139 1.1× 111 1.1× 17 1.2k
M.A. Breuer United States 27 2.1k 1.2× 1.8k 1.1× 167 1.1× 140 1.1× 217 2.2× 122 2.4k
Hans-Joachim Wunderlich Germany 30 3.3k 2.0× 3.4k 2.1× 445 2.8× 73 0.6× 277 2.8× 249 3.6k
K. Antreich Germany 20 1.4k 0.8× 1.1k 0.7× 45 0.3× 233 1.8× 75 0.8× 45 1.6k
M. Abramovici United States 32 3.9k 2.3× 4.2k 2.6× 328 2.1× 325 2.5× 241 2.4× 88 4.6k
Zainalabedin Navabi Iran 19 996 0.6× 1.0k 0.6× 103 0.7× 132 1.0× 581 5.8× 217 1.5k
Janusz Rajski United States 37 4.5k 2.7× 4.6k 2.8× 682 4.3× 127 1.0× 121 1.2× 214 4.8k

Countries citing papers authored by M.L. Bushnell

Since Specialization
Citations

This map shows the geographic impact of M.L. Bushnell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.L. Bushnell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.L. Bushnell more than expected).

Fields of papers citing papers by M.L. Bushnell

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M.L. Bushnell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.L. Bushnell. The network helps show where M.L. Bushnell may publish in the future.

Co-authorship network of co-authors of M.L. Bushnell

This figure shows the co-authorship network connecting the top 25 collaborators of M.L. Bushnell. A scholar is included among the top collaborators of M.L. Bushnell based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M.L. Bushnell. M.L. Bushnell is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Bushnell, M.L.. (2007). SPARTAN: a spectral and entropy-based partial-scan and test point insertion algorithm. Rutgers University Community Repository (Rutgers University).
3.
Bushnell, M.L., et al.. (2007). Power Grid Analysis of Dynamic Power Cutoff Technology. 1393–1396. 3 indexed citations
4.
Bushnell, M.L., et al.. (2007). SPARTAN: a spectral and information theoretic approach to partial-scan. 1–10. 9 indexed citations
5.
6.
Agrawal, Vishwani D., et al.. (2006). Transistor Sizing of Logic Gates to Maximize Input Delay Variability. Journal of Low Power Electronics. 2(1). 121–128. 6 indexed citations
7.
Mohan, Sanjay & M.L. Bushnell. (2002). A code transition delay model for ADC test. 274–282.
8.
9.
Chakradhar, Srimat, Vishwani D. Agrawal, & M.L. Bushnell. (2002). Polynomial time solvable fault detection problems. 56–63. 3 indexed citations
10.
Bushnell, M.L., et al.. (2002). Circuit design for low overhead delay-fault BIST using constrained quadratic 0-1 programming. 393–399. 3 indexed citations
11.
Bushnell, M.L., et al.. (2002). Effect of noise on analog circuit testing. 138–144. 3 indexed citations
12.
Chakraborty, T.J., Vishwani D. Agrawal, & M.L. Bushnell. (2000). Improving path delay testability of sequential circuits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 8(6). 736–741. 4 indexed citations
13.
Agrawal, Vishwani D., et al.. (2000). False-Path Removal Using Delay Fault Simulation. Journal of Electronic Testing. 16(5). 463–476. 5 indexed citations
14.
Bushnell, M.L., et al.. (1997). Classification and Test Generation for Path-Delay Faults Using Single Struck-at Fault Tests. Journal of Electronic Testing. 11(1). 55–67. 33 indexed citations
15.
Heragu, K., M.L. Bushnell, & Vishwani D. Agrawal. (1994). An efficient path delay fault coverage estimator. 516–521. 20 indexed citations
16.
Chakradhar, Srimat, Vishwani D. Agrawal, & M.L. Bushnell. (1994). Energy minimization and design for testability. Journal of Electronic Testing. 5(1). 57–66. 9 indexed citations
17.
Chakraborty, T.J., Vishwani D. Agrawal, & M.L. Bushnell. (1992). Delay fault models and test generation for random logic sequential circuits. Design Automation Conference. 165–172. 77 indexed citations
18.
Chakradhar, Srimat & M.L. Bushnell. (1992). A solvable class of quadratic 0–1 programming. Discrete Applied Mathematics. 36(3). 233–251. 7 indexed citations
19.
Chen, Xinghao & M.L. Bushnell. (1988). A module area estimator for VLSI layout. Design Automation Conference. 54–59. 1 indexed citations
20.
Bushnell, M.L.. (1986). VLSI CAD Tool Integration Using the Ulysses Environment. Design Automation Conference. 55–61. 25 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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