Nathan Kupp

579 total citations
22 papers, 403 citations indexed

About

Nathan Kupp is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Management Science and Operations Research. According to data from OpenAlex, Nathan Kupp has authored 22 papers receiving a total of 403 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Hardware and Architecture, 12 papers in Electrical and Electronic Engineering and 6 papers in Management Science and Operations Research. Recurrent topics in Nathan Kupp's work include VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Optimal Experimental Design Methods (6 papers). Nathan Kupp is often cited by papers focused on VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Optimal Experimental Design Methods (6 papers). Nathan Kupp collaborates with scholars based in United States and France. Nathan Kupp's co-authors include Yiorgos Makris, Yier Jin, Ke Huang, John M. Carulli, Petros Drineas and Mohamed Slamani and has published in prestigious journals such as SHILAP Revista de lepidopterología, IEEE Design and Test and Journal of Electronic Testing.

In The Last Decade

Nathan Kupp

22 papers receiving 387 citations

Peers

Nathan Kupp
Michiko Inoue Japan
Adit D. Singh United States
Masaya Yoshikawa Japan
Kaushik Roy United States
Luca Cassano Italy
H. Fatih Uğurdağ Türkiye
John M. Acken United States
Mario Barbareschi Italy
Philippe Coussy France
Giovanni Mariani Switzerland
Michiko Inoue Japan
Nathan Kupp
Citations per year, relative to Nathan Kupp Nathan Kupp (= 1×) peers Michiko Inoue

Countries citing papers authored by Nathan Kupp

Since Specialization
Citations

This map shows the geographic impact of Nathan Kupp's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nathan Kupp with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nathan Kupp more than expected).

Fields of papers citing papers by Nathan Kupp

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Nathan Kupp. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nathan Kupp. The network helps show where Nathan Kupp may publish in the future.

Co-authorship network of co-authors of Nathan Kupp

This figure shows the co-authorship network connecting the top 25 collaborators of Nathan Kupp. A scholar is included among the top collaborators of Nathan Kupp based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Nathan Kupp. Nathan Kupp is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kupp, Nathan, et al.. (2015). A comparative study of one-shot statistical calibration methods for analog / RF ICs. 1–10. 23 indexed citations
2.
Kupp, Nathan, et al.. (2015). Silicon Demonstration of Statistical Post-Production Tuning. 628–633. 2 indexed citations
3.
Huang, Ke, et al.. (2014). Low-Cost Analog/RF IC Testing through Combined Intra- and Inter-Die Correlation Models. IEEE Design and Test. 1–1. 8 indexed citations
4.
Huang, Ke, Nathan Kupp, John M. Carulli, & Yiorgos Makris. (2013). Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. Design, Automation, and Test in Europe. 553–558. 10 indexed citations
5.
Huang, Ke, Nathan Kupp, John M. Carulli, & Yiorgos Makris. (2013). Process monitoring through wafer-level spatial variation decomposition. 1–10. 14 indexed citations
6.
Huang, Ke, Nathan Kupp, John M. Carulli, & Yiorgos Makris. (2013). Handling Discontinuous Effects in Modeling Spatial Correlation of Wafer-level Analog/RF Tests. Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013. 553–558. 12 indexed citations
7.
Huang, Ke, Nathan Kupp, John M. Carulli, & Yiorgos Makris. (2013). On combining alternate test with spatial correlation modeling in analog/RF ICs. 8 indexed citations
8.
Kupp, Nathan, Ke Huang, John M. Carulli, & Yiorgos Makris. (2012). Spatial correlation modeling for probe test cost reduction in RF devices. 23–29. 22 indexed citations
9.
Kupp, Nathan, Ke Huang, John M. Carulli, & Yiorgos Makris. (2012). Spatial estimation of wafer measurement parameters using Gaussian process models. 1–8. 19 indexed citations
10.
Kupp, Nathan & Yiorgos Makris. (2012). Integrated optimization of semiconductor manufacturing: A machine learning approach. 1–10. 4 indexed citations
11.
12.
Kupp, Nathan, et al.. (2011). On proving the efficiency of alternative RF tests. International Conference on Computer Aided Design. 762–767. 7 indexed citations
13.
Kupp, Nathan & Yiorgos Makris. (2011). Applying the Model-View-Controller Paradigm to Adaptive Test. IEEE Design & Test of Computers. 29(1). 28–35. 6 indexed citations
14.
Kupp, Nathan, Mohamed Slamani, & Yiorgos Makris. (2011). Correlating inline data with final test outcomes in analog/RF devices. 1–6. 13 indexed citations
15.
Kupp, Nathan, et al.. (2010). Post-production performance calibration in analog/RF devices. 1–10. 21 indexed citations
16.
Kupp, Nathan, et al.. (2010). Improving Analog and RF Device Yield through Performance Calibration. IEEE Design & Test of Computers. 28(3). 64–75. 23 indexed citations
17.
Kupp, Nathan, et al.. (2009). On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction. Journal of Electronic Testing. 25(6). 309–321. 10 indexed citations
18.
Jin, Yier, Nathan Kupp, & Yiorgos Makris. (2009). Experiences in Hardware Trojan design and implementation. 50–57. 156 indexed citations
19.
Kupp, Nathan, et al.. (2008). A low cost advance encryption standard (AES) co-processor implementation. SHILAP Revista de lepidopterología. 6 indexed citations
20.
Kupp, Nathan, et al.. (2008). Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. 35–40. 15 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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