Joel L. Plawsky

5.1k citations
211 papers · 4.0k indexed · h-index 34

Joel L. Plawsky

200 papers receiving 3.9k citations

Peers

Joel L. Plawsky
Comparison fields: 5 of 118
  • Surfaces, Coatings and Films 520
  • Computational Mechanics 1.1k
  • Electronic, Optical and Magnetic Materials 658
  • Mechanical Engineering 1.1k
  • Electrical and Electronic Engineering 1.3k
Replace O. Hunderi with:
O. Hunderi Norway
F. A. Stevie United States
François Lequeux France
John Henry J. Scott United States
Raynald Gauvin Canada
Lorenz Ratke Germany
Wei Cao Finland
Élie Raphaël France
William N. Gill United States
Tim Still United States
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Citations per year

Countries citing papers authored by Joel L. Plawsky

Since Specialization
Citations

This map shows the geographic impact of Joel L. Plawsky's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Joel L. Plawsky with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Joel L. Plawsky more than expected).

Fields of papers citing papers by Joel L. Plawsky

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Joel L. Plawsky. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Joel L. Plawsky. The network helps show where Joel L. Plawsky may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Joel L. Plawsky, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Joel L. Plawsky Line = papers co-authored together Joel L. Plawsky links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20250
2 20250
3 20252
4 20243
5 20241
6 20241
7 202158
8 202014
9 20197
10 201813
11 201731
12 20161
13 201610
14 201520
15 201354
16 201211
17 201263
18 200562
19 20020
20
Determination of the dispersion constant in a constrained vapor bubble thermosyphon
19950

About Joel L. Plawsky

Joel L. Plawsky is a scholar working on Surfaces, Coatings and Films, Computational Mechanics and Electronic, Optical and Magnetic Materials, having authored 211 papers that have together received 4.0k indexed citations. Recurring topics across this work include Heat Transfer and Boiling Studies (58 papers), Copper Interconnects and Reliability (38 papers), Semiconductor materials and devices (37 papers), Fluid Dynamics and Thin Films (33 papers), Heat Transfer and Optimization (20 papers), Spacecraft and Cryogenic Technologies (17 papers), Surface Modification and Superhydrophobicity (17 papers) and Fluid Dynamics and Heat Transfer (15 papers). The work is most often cited by research in Surfaces, Coatings and Films (520 citations), Computational Mechanics (1.1k citations) and Electronic, Optical and Magnetic Materials (658 citations). Joel L. Plawsky has collaborated with scholars based in United States, South Korea and India. Frequent co-authors include Peter Wayner, William N. Gill, W. N. Gill, Yoav Peles, Corey Woodcock, A. K. Jain, Sunando DasGupta, E. Fred Schubert, Svetlana Rogojevic and Theodorian Borca‐Tasciuc. Their work appears in journals such as Physical Review Letters, Advanced Materials and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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