Jingtian Xi
- Electrical and Electronic Engineering top 5%
- Surfaces, Coatings and Films top 0.5%
- Atomic and Molecular Physics, and Optics top 5%
- Materials Chemistry top 10%
- Biomedical Engineering top 5%
- Co-authors
- E. Fred SchubertJong Kyu KimM. SchubertShawn-Yu LinMinfeng ChenJ. SmartTerry Tao YeHong Luo
- Topics
- RFID technology advancements (14 papers)Optical Coatings and Gratings (13 papers)Energy Harvesting in Wireless Networks (12 papers)
- Cited by
- Surfaces, Coatings and FilmsCondensed Matter PhysicsAtomic and Molecular Physics, and Optics
- Partner nations
- United StatesChinaSwitzerland
In The Last Decade
Jingtian Xi
44 papers receiving 2.2k citations
Hit Papers
Peers
Comparison fields: 5 of 70
- Electrical and Electronic Engineering 1.2k
- Surfaces, Coatings and Films 957
- Atomic and Molecular Physics, and Optics 674
- Materials Chemistry 588
- Biomedical Engineering 570
Countries citing papers authored by Jingtian Xi
This map shows the geographic impact of Jingtian Xi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jingtian Xi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jingtian Xi more than expected).
Fields of papers citing papers by Jingtian Xi
This network shows the impact of papers produced by Jingtian Xi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jingtian Xi. The network helps show where Jingtian Xi may publish in the future.
Co-authorship network of co-authors of Jingtian Xi
This figure shows the co-authorship network connecting the top 25 collaborators of Jingtian Xi. A scholar is included among the top collaborators of Jingtian Xi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jingtian Xi. Jingtian Xi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 30 | |
| 3 | 2 | |
| 4 | 27 | |
| 5 | 51 | |
| 6 | A manufacture-friendly multi-layer RFID tag antenna design | 1 |
| 7 | 3 | |
| 8 | 12 | |
| 9 | 14 | |
| 10 | 2 | |
| 11 | 17 | |
| 12 | 124 | |
| 13 | 92 | |
| 14 | 93 | |
| 15 | 62 | |
| 16 | 1 | |
| 17 | 117 | |
| 18 | 1 | |
| 19 | 11 | |
| 20 | 2 |
About Jingtian Xi
Jingtian Xi is a scholar working on Surfaces, Coatings and Films, Media Technology and Biophysics, having authored 45 papers that have together received 2.3k indexed citations. Recurring topics across this work include RFID technology advancements (14 papers), Optical Coatings and Gratings (13 papers) and Energy Harvesting in Wireless Networks (12 papers). The work is most often cited by research in Surfaces, Coatings and Films (957 citations), Condensed Matter Physics (406 citations) and Atomic and Molecular Physics, and Optics (674 citations). Jingtian Xi has collaborated with scholars based in United States, China and Switzerland. Frequent co-authors include E. Fred Schubert, Jong Kyu Kim, M. Schubert, Shawn-Yu Lin, Minfeng Chen, J. Smart, Terry Tao Ye, Hong Luo, Th. Gessmann and Cheolsoo Sone. Their work appears in journals such as Nano Letters, Applied Physics Letters and Nature Photonics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.