Jingcun Liu

1.6k total citations · 1 hit paper
37 papers, 1.3k citations indexed

About

Jingcun Liu is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Jingcun Liu has authored 37 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Electrical and Electronic Engineering, 19 papers in Condensed Matter Physics and 5 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Jingcun Liu's work include Silicon Carbide Semiconductor Technologies (31 papers), Semiconductor materials and devices (19 papers) and GaN-based semiconductor devices and materials (19 papers). Jingcun Liu is often cited by papers focused on Silicon Carbide Semiconductor Technologies (31 papers), Semiconductor materials and devices (19 papers) and GaN-based semiconductor devices and materials (19 papers). Jingcun Liu collaborates with scholars based in United States, China and Japan. Jingcun Liu's co-authors include Yuhao Zhang, Ruizhe Zhang, Joseph P. Kozak, Ming Xiao, Guogang Zhang, Qihao Song, Jianhua Wang, Bixuan Wang, Wataru Saito and Cliff Drowley and has published in prestigious journals such as IEEE Transactions on Power Electronics, Sensors and IEEE Transactions on Electron Devices.

In The Last Decade

Jingcun Liu

36 papers receiving 1.2k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Stability, Reliability, and Robustness of GaN Power Devices: A Review

2023 192 citations Joseph P. Kozak, Ruizhe Zhang et al. IEEE Transactions on Power Electronics profile →

Peers

Countries citing papers authored by Jingcun Liu

Since Specialization

Citations

This map shows the geographic impact of Jingcun Liu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jingcun Liu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jingcun Liu more than expected).

Fields of papers citing papers by Jingcun Liu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jingcun Liu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jingcun Liu. The network helps show where Jingcun Liu may publish in the future.

Co-authorship network of co-authors of Jingcun Liu

This figure shows the co-authorship network connecting the top 25 collaborators of Jingcun Liu. A scholar is included among the top collaborators of Jingcun Liu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jingcun Liu. Jingcun Liu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Stability, Reliability, and Robustness of GaN Power Devices: A Review breakdown → 2023 ·IEEE Transactions on Power Electronics ·Joseph P. Kozak, Ruizhe Zhang, Matthew Porter, Qihao Song, Jingcun Liu, Bixuan Wang, (unknown), Wataru Saito, Yuhao Zhang	192
2	Surge Current Interruption Capability of Discrete IGBT Devices in DC Hybrid Circuit Breakers 2023 ·IEEE Journal of Emerging and Selected Topics in Power Electronics ·Lakshmi Ravi, Jian Liu, Jingcun Liu, Yuhao Zhang, Cyril Buttay, (unknown), Rolando Burgos, Dong Dong	5
3	Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses 2022 ·The HKU Scholars Hub (University of Hong Kong) ·Joseph P. Kozak, Qihao Song, Jingcun Liu, Ruizhe Zhang, Qiang Li, Wataru Saito, Yuhao Zhang	3
4	Pulsed Overcurrent Capability of Power Semiconductor Devices in Solid-State Circuit Breakers: SiC MOSFET vs. Si IGBT 2022 ·2022 IEEE Applied Power Electronics Conference and Exposition (APEC) ·Xin Yang, Jingcun Liu, Bixuan Wang, Guogang Zhang	14
5	Packaged Ga₂O₃ Schottky Rectifiers With Over 60-A Surge Current Capability 2021 ·IEEE Transactions on Power Electronics ·Ming Xiao, Boyan Wang, Jingcun Liu, Ruizhe Zhang, Zichen Zhang, Chao Ding, (unknown), Kohei Sasaki, Guo‐Quan Lu, Cyril Buttay, Yuhao Zhang	102
6	Robustness of Cascode GaN HEMTs under Repetitive Overvoltage and Surge Energy Stresses 2021 ·The HKU Scholars Hub (University of Hong Kong) ·Qihao Song, Ruizhe Zhang, Joseph P. Kozak, Jingcun Liu, Qiang Li, Yuhao Zhang	14
7	Surge Current and Avalanche Ruggedness of 1.2-kV Vertical GaN p-n Diodes 2021 ·IEEE Transactions on Power Electronics ·Jingcun Liu, Ruizhe Zhang, Ming Xiao, Subhash Pidaparthi, Hao Cui, Andrew Edwards, (unknown), Cliff Drowley, Yuhao Zhang	53
8	Tuning Avalanche Path in Vertical GaN JFETs By Gate Driver Design 2021 ·IEEE Transactions on Power Electronics ·Jingcun Liu, Ruizhe Zhang, Ming Xiao, Subhash Pidaparthi, Hao Cui, Andrew Edwards, Cliff Drowley, Yuhao Zhang	20
9	Failure Mechanisms of Cascode GaN HEMTs Under Overvoltage and Surge Energy Events 2021 ·The HKU Scholars Hub (University of Hong Kong) ·Qihao Song, Ruizhe Zhang, Joseph P. Kozak, Jingcun Liu, Qiang Li, Yuhao Zhang	16
10	True Breakdown Voltage and Overvoltage Margin of GaN Power HEMTs in Hard Switching 2021 ·IEEE Electron Device Letters ·Joseph P. Kozak, Ruizhe Zhang, Qihao Song, Jingcun Liu, Wataru Saito, Yuhao Zhang	62
11	Physics of Degradation in SiC MOSFETs Stressed by Overvoltage and Overcurrent Switching 2020 ·The HKU Scholars Hub (University of Hong Kong) ·Joseph P. Kozak, Ruizhe Zhang, Jingcun Liu, Khai D. T. Ngo, Yuhao Zhang	4
12	IGBT aging monitoring and remaining lifetime prediction based on long short-term memory (LSTM) networks 2020 ·Microelectronics Reliability ·Wanping Li, Bixuan Wang, Jingcun Liu, Guogang Zhang, Jianhua Wang	32
13	Surge Energy Robustness of GaN Gate Injection Transistors 2020 ·The HKU Scholars Hub (University of Hong Kong) ·Ruizhe Zhang, Joseph P. Kozak, Jingcun Liu, Ming Xiao, Yuhao Zhang	20
14	Multiple failure mode identification of SiC planar MOSFETs in short-circuit operation 2020 ·Microelectronics Reliability ·Bixuan Wang, Jingcun Liu, Wanping Li, Guogang Zhang, Yingsan Geng, Jianhua Wang	9
15	Hard-Switched Overvoltage Robustness of p-Gate GaN HEMTs at Increasing Temperatures 2020 ·The HKU Scholars Hub (University of Hong Kong) ·Joseph P. Kozak, Ruizhe Zhang, Jingcun Liu, Qihao Song, Ming Xiao, Yuhao Zhang	11
16	Trap-Mediated Avalanche in Large-Area 1.2 kV Vertical GaN p-n Diodes 2020 ·IEEE Electron Device Letters ·Jingcun Liu, Ming Xiao, Ruizhe Zhang, Subhash Pidaparthi, Cliff Drowley, (unknown), Andrew Edwards, Hao Cui, (unknown), Yuhao Zhang	51
17	Surge-Energy and Overvoltage Ruggedness of P-Gate GaN HEMTs 2020 ·IEEE Transactions on Power Electronics ·Ruizhe Zhang, Joseph P. Kozak, Ming Xiao, Jingcun Liu, Yuhao Zhang	112
18	Modeling of SiC MOSFET Behavior in Short-circuit Transient Considering Gate Leakage Current 2019 ·Jingcun Liu, Guogang Zhang, Bixuan Wang, Wanping Li, Jianhua Wang	2
19	Gate Failure Physics of SiC MOSFETs Under Short-Circuit Stress 2019 ·IEEE Electron Device Letters ·Jingcun Liu, Guogang Zhang, Bixuan Wang, Wanping Li, Jianhua Wang	78
20	Research on dynamic modeling and transient characteristics of hybrid DC switch 2017 ·Jingcun Liu, Guogang Zhang, Qian Chen, (unknown), Zheng Qin, Jianhua Wang	5

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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