Ken Fujita

1.5k total citations
54 papers, 1.3k citations indexed

About

Ken Fujita is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, Ken Fujita has authored 54 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Atomic and Molecular Physics, and Optics, 31 papers in Electrical and Electronic Engineering and 13 papers in Biomedical Engineering. Recurrent topics in Ken Fujita's work include Semiconductor materials and devices (24 papers), Surface and Thin Film Phenomena (21 papers) and Force Microscopy Techniques and Applications (9 papers). Ken Fujita is often cited by papers focused on Semiconductor materials and devices (24 papers), Surface and Thin Film Phenomena (21 papers) and Force Microscopy Techniques and Applications (9 papers). Ken Fujita collaborates with scholars based in Japan. Ken Fujita's co-authors include Masakazu Ichikawa, Heiji Watanabe, S. Fukatsu, Y. Shiraki, Hiroyuki Yaguchi, R. Ito, Kiyoyuki Terakura, Koichi Kato, T. Kawamura and Tsuyoshi Uda and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

Ken Fujita

53 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Ken Fujita Japan 18 1.0k 652 539 215 163 54 1.3k
M. C. Reuter United States 20 993 1.0× 1.1k 1.7× 469 0.9× 248 1.2× 192 1.2× 37 1.6k
R. Matz Germany 18 584 0.6× 452 0.7× 253 0.5× 198 0.9× 209 1.3× 47 902
R.N. Thomas United States 22 1.0k 1.0× 618 0.9× 416 0.8× 190 0.9× 79 0.5× 47 1.3k
S. Kohmoto Japan 17 511 0.5× 747 1.1× 286 0.5× 201 0.9× 154 0.9× 49 958
A. A. Shklyaev Russia 21 931 0.9× 1.1k 1.7× 807 1.5× 488 2.3× 258 1.6× 131 1.7k
W. Seifert Germany 21 1.3k 1.2× 682 1.0× 551 1.0× 228 1.1× 69 0.4× 129 1.5k
O. P. Pchelyakov Russia 22 995 1.0× 1.1k 1.8× 690 1.3× 331 1.5× 89 0.5× 132 1.6k
M. Kittler Germany 25 2.3k 2.3× 1.2k 1.9× 1.0k 1.9× 476 2.2× 124 0.8× 229 2.6k
M. Hohenstein Germany 14 653 0.6× 937 1.4× 404 0.7× 161 0.7× 104 0.6× 30 1.1k
H. Tanoue Japan 22 1.1k 1.1× 640 1.0× 551 1.0× 227 1.1× 49 0.3× 128 1.6k

Countries citing papers authored by Ken Fujita

Since Specialization
Citations

This map shows the geographic impact of Ken Fujita's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ken Fujita with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ken Fujita more than expected).

Fields of papers citing papers by Ken Fujita

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ken Fujita. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ken Fujita. The network helps show where Ken Fujita may publish in the future.

Co-authorship network of co-authors of Ken Fujita

This figure shows the co-authorship network connecting the top 25 collaborators of Ken Fujita. A scholar is included among the top collaborators of Ken Fujita based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ken Fujita. Ken Fujita is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
MORI, Hiroki, et al.. (2005). LARGE FORMATTED AND HIGH RESOLUTION CMOS FLAT PANEL SENSORS FOR X-RAY. 1 indexed citations
2.
Shibata, Motoshi, et al.. (2002). The nanometer-scale selective overgrowth of Ge over Si islands on Si() windows in ultrathin SiO2 films. Surface Science. 496(1-2). L7–L12. 9 indexed citations
3.
Shibata, Motoshi, et al.. (2000). Pyramidal Si nanocrystals with a quasiequilibrium shape selectively grown on Si(001) windows in ultrathinSiO2films. Physical review. B, Condensed matter. 61(11). 7499–7504. 22 indexed citations
4.
Shibata, Motoshi, et al.. (2000). Nanometer-scale Ge selective growth on Si(001) using ultrathin SiO2 film. Surface Science. 462(1-3). L587–L593. 17 indexed citations
5.
Shibata, Motoshi, et al.. (2000). Facets formation of pyramidal Si nanocrystals selectively grown on Si(001) windows in ultrathin SiO2 films. Journal of Crystal Growth. 220(4). 449–456. 10 indexed citations
6.
Fujita, Ken & Masakazu Ichikawa. (2000). Step rearrangement on Si(001) surface during diborane exposure. Surface Science. 468(1-3). 85–91. 2 indexed citations
7.
Shibata, Motoshi, et al.. (1999). Nanometer-scale Si selective growth on Ga-adsorbed voids in ultrathin SiO2 films. Surface Science. 431(1-3). L565–L569. 10 indexed citations
8.
Watanabe, Heiji, Koichi Kato, Tsuyoshi Uda, et al.. (1998). Kinetics of Initial Layer-by-Layer Oxidation of Si(001) Surfaces. Physical Review Letters. 80(2). 345–348. 249 indexed citations
9.
Fujita, Ken, Heiji Watanabe, & Masakazu Ichikawa. (1998). Scanning tunneling microscopy study on void formation by thermal decomposition of thin oxide layers on stepped Si surfaces. Journal of Applied Physics. 83(8). 4091–4095. 24 indexed citations
10.
Fujita, Ken, et al.. (1998). Current–voltage characteristics of the partially Ga-terminated Si (111) surface studied by scanning tunneling microscopy. Journal of Applied Physics. 83(11). 5890–5895. 1 indexed citations
11.
Fujita, Ken, et al.. (1997). Nucleation along step edges during Si epitaxial growth on the Si(111) surface observed by STM. Surface Science. 380(1). 66–74. 23 indexed citations
12.
Watanabe, Heiji, Ken Fujita, & Masakazu Ichikawa. (1997). Atomic-step observation at buried SiO2Si(111) interfaces by scanning reflection electron microscopy. Surface Science. 385(2-3). L952–L957. 40 indexed citations
13.
Watanabe, Heiji, S. Fujita, Shigemitsu Maruno, Ken Fujita, & Masakazu Ichikawa. (1997). Electron-Beam-Induced Selective Thermal Decomposition of Ultrathin SiO2 Layers Used in Nanofabrication. Japanese Journal of Applied Physics. 36(12S). 7777–7777. 16 indexed citations
14.
Fujita, Ken, et al.. (1996). Self-organizing modification of surfaces on the nanometer scale. Surface Science. 357-358. 490–494. 7 indexed citations
15.
Fujita, Ken, et al.. (1996). A nanoscale self-organization induced by removing Ga atoms on the Si(111)–∛×∛–Ga surface. Applied Physics Letters. 68(6). 770–772. 4 indexed citations
16.
Fujita, Ken, et al.. (1995). X-Ray Photoelectron Spectroscopic Studies on Pyrolysis of Plasma-Polymerized Fluorocarbon Films on Si. Japanese Journal of Applied Physics. 34(1R). 304–304. 1 indexed citations
17.
Yamashita, Yoshifumi, Koji Maeda, Ken Fujita, et al.. (1993). Dislocation glide motion in heteroepitaxial thin films of Si1−xGex/Si(100). Philosophical Magazine Letters. 67(3). 165–171. 34 indexed citations
18.
Fukatsu, S., Ken Fujita, Hiroyuki Yaguchi, Y. Shiraki, & R. Ito. (1992). Atomistic picture of interfacial mixing in the Si/Ge heterostructures. Surface Science. 267(1-3). 79–82. 26 indexed citations
19.
Fukatsu, S., Ken Fujita, Hiroyuki Yaguchi, Y. Shiraki, & R. Ito. (1991). Self-limitation in the surface segregation of Ge atoms during Si molecular beam epitaxial growth. Applied Physics Letters. 59(17). 2103–2105. 188 indexed citations
20.
Yamamoto, Jun, et al.. (1987). Anomalous Hydrodynamic Behavior of Smectic Liquid Crystals at Low Frequencies. Japanese Journal of Applied Physics. 26(10A). L1718–L1718. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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