N Kato

750 total citations
22 papers, 537 citations indexed

About

N Kato is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Structural Biology. According to data from OpenAlex, N Kato has authored 22 papers receiving a total of 537 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 11 papers in Surfaces, Coatings and Films and 9 papers in Structural Biology. Recurrent topics in N Kato's work include Integrated Circuits and Semiconductor Failure Analysis (12 papers), Electron and X-Ray Spectroscopy Techniques (11 papers) and Advanced Electron Microscopy Techniques and Applications (9 papers). N Kato is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (12 papers), Electron and X-Ray Spectroscopy Techniques (11 papers) and Advanced Electron Microscopy Techniques and Applications (9 papers). N Kato collaborates with scholars based in Japan, United States and Greece. N Kato's co-authors include H. Saka, Takashi Saka, Zhouguang Wang, Katsuhiro Sasaki, Tsukasa Hirayama, Hiroyasu Saka, Takeharu Kato, A. Nishikawa, Т. Такеда and Terumi Nakajima and has published in prestigious journals such as Applied Physics Letters, Applied Surface Science and IEEE Transactions on Magnetics.

In The Last Decade

N Kato

21 papers receiving 506 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
N Kato Japan 9 270 168 151 150 126 22 537
M.H.F. Overwijk Netherlands 10 201 0.7× 161 1.0× 150 1.0× 158 1.1× 65 0.5× 20 462
G. R. Anstis Australia 12 206 0.8× 166 1.0× 150 1.0× 203 1.4× 99 0.8× 22 588
N Poirier-Demers Canada 5 155 0.6× 179 1.1× 197 1.3× 150 1.0× 99 0.8× 8 448
G. C. Gazzadi Italy 14 130 0.5× 108 0.6× 185 1.2× 156 1.0× 61 0.5× 31 469
A.P. Pogany Australia 10 210 0.8× 63 0.4× 71 0.5× 164 1.1× 50 0.4× 30 421
Ch. Ziethen Germany 11 103 0.4× 138 0.8× 198 1.3× 127 0.8× 77 0.6× 17 421
A. J. McGibbon United States 9 150 0.6× 146 0.9× 138 0.9× 277 1.8× 79 0.6× 23 515
Hisazo Kawakatsu Poland 11 232 0.9× 73 0.4× 217 1.4× 65 0.4× 76 0.6× 39 479
Daniel J. Masiel United States 12 141 0.5× 284 1.7× 187 1.2× 174 1.2× 121 1.0× 30 525
Thomas Stammler United States 7 96 0.4× 59 0.4× 107 0.7× 138 0.9× 52 0.4× 14 428

Countries citing papers authored by N Kato

Since Specialization
Citations

This map shows the geographic impact of N Kato's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N Kato with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N Kato more than expected).

Fields of papers citing papers by N Kato

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N Kato. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N Kato. The network helps show where N Kato may publish in the future.

Co-authorship network of co-authors of N Kato

This figure shows the co-authorship network connecting the top 25 collaborators of N Kato. A scholar is included among the top collaborators of N Kato based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N Kato. N Kato is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wang, Zhouguang, Takeharu Kato, Tsukasa Hirayama, et al.. (2005). Wedge‐shaped and flat cross‐sections for quantitative characterization of the electrostatic potential distributions across p‐n junctions by electron holography. Surface and Interface Analysis. 37(2). 221–224. 7 indexed citations
2.
Kato, N. (2004). Reducing focused ion beam damage to transmission electron microscopy samples. Journal of Electron Microscopy. 53(5). 451–458. 188 indexed citations
3.
Wang, Zhouguang, Takeharu Kato, Tsukasa Hirayama, et al.. (2004). Surface damage induced by focused-ion-beam milling in a Si/Si p–n junction cross-sectional specimen. Applied Surface Science. 241(1-2). 80–86. 53 indexed citations
4.
Wang, Zhouguang, Takeharu Kato, Tsukasa Hirayama, et al.. (2003). Focused-ion-beam preparation of wedge-shaped cross sections and its application to observing p–n junctions by electron holography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 21(5). 2155–2158. 4 indexed citations
5.
Hagimoto, K., et al.. (2003). Above 8-Gb/s GaAs monolithic flip-flop ICs for very high-speed optical transmission systems. 23–26. 1 indexed citations
6.
Wang, Zhouguang, Takeharu Kato, Noriyoshi Shibata, et al.. (2002). Characterizing an implanted Si/Si p–n junction with lower doping level by combined electron holography and focused-ion-beam milling. Applied Physics Letters. 81(3). 478–480. 17 indexed citations
7.
8.
Wang, Zhouguang, Tsukasa Hirayama, Katsuhiro Sasaki, Hiroyasu Saka, & N Kato. (2002). Electron holographic characterization of electrostatic potential distributions in a transistor sample fabricated by focused ion beam. Applied Physics Letters. 80(2). 246–248. 52 indexed citations
9.
Kato, N, A. Nishikawa, & H. Saka. (2001). Dislocations in Si generated by fatigue at room temperature. Materials Science in Semiconductor Processing. 4(1-3). 113–115. 12 indexed citations
10.
Takahashi, Haruko, N Kato, Makoto Iwashima, & Kazuo Iguchi. (1999). Determination of Absolute Configurations of Tertiary Alcohols by NMR Spectroscopy. Chemistry Letters. 28(11). 1181–1182. 8 indexed citations
11.
Kato, N, et al.. (1999). Side-wall damage in a transmission electron microscopy specimen of crystalline Si prepared by focused ion beam etching. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 17(4). 1201–1204. 80 indexed citations
12.
Nishikawa, Akira, et al.. (1999). An Application of Passive Voltage Contrast (PVC) to Failure Analysis of CMOS LSIs Using Secondary Electron Collection. Proceedings - International Symposium for Testing and Failure Analysis. 30835. 239–244. 7 indexed citations
13.
Kato, N, et al.. (1998). Reduction of the Damage Induced in an Fib-Fabricated X-Tem Specimen. MRS Proceedings. 523. 1 indexed citations
14.
Kato, N, et al.. (1998). A plasma-polymerized protective film for transmission electron microscopy specimen preparation by focused ion beam etching. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 16(3). 1127–1130. 11 indexed citations
15.
Kato, N, et al.. (1987). [A survey on the contraction of dental diseases in handicapped children in our pedodontic outpatient clinic and our special clinic for handicapped children. 1st Report: 1st, 2nd and 3rd group according to Uehara's classification].. PubMed. 25(3). 618–26.
16.
Saka, Takashi & N Kato. (1986). Accurate measurement of the Si structure factor by the Pendellösung method. Acta Crystallographica Section A Foundations of Crystallography. 42(6). 469–478. 60 indexed citations
17.
Kato, N, et al.. (1985). Ferrite substrates for high-frequency switching DC-to-DC converter applications. IEEE Transactions on Magnetics. 21(5). 1723–1725. 2 indexed citations
18.
Nakajima, Terumi, et al.. (1980). Isolation and identification of polyamine metabolites in urine of animals.. PubMed. 12(5). 401–10. 8 indexed citations
19.
Такеда, Т. & N Kato. (1978). The measurement of the real part of anomalous scattering. Acta Crystallographica Section A. 34(1). 43–47. 7 indexed citations
20.
Inoue, Takashi, et al.. (1975). [Present status of pulmonary tuberculosis among labourers of Airen area in Osaka City (author's transl)].. PubMed. 50(9). 255–61. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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