Fazhan Zhao
- Electrical and Electronic Engineering
- Materials Chemistry
- Computer Vision and Pattern Recognition
- Hardware and Architecture top 10%
- Biomedical Engineering
- Co-authors
- Kaige WangKun ZhaoZhengsheng HanBo LiJiantou GaoJinshun BiLei WangKai Xi
- Topics
- Semiconductor materials and devices (28 papers)Integrated Circuits and Semiconductor Failure Analysis (23 papers)Radiation Effects in Electronics (23 papers)
In The Last Decade
Fazhan Zhao
54 papers receiving 274 citations
Peers
Comparison fields: 5 of 66
- Electrical and Electronic Engineering 169
- Materials Chemistry 39
- Computer Vision and Pattern Recognition 38
- Hardware and Architecture 34
- Biomedical Engineering 24
Countries citing papers authored by Fazhan Zhao
This map shows the geographic impact of Fazhan Zhao's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Fazhan Zhao with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Fazhan Zhao more than expected).
Fields of papers citing papers by Fazhan Zhao
This network shows the impact of papers produced by Fazhan Zhao. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Fazhan Zhao. The network helps show where Fazhan Zhao may publish in the future.
Co-authorship network of co-authors of Fazhan Zhao
This figure shows the co-authorship network connecting the top 25 collaborators of Fazhan Zhao. A scholar is included among the top collaborators of Fazhan Zhao based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Fazhan Zhao. Fazhan Zhao is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 2 | |
| 5 | 0 | |
| 6 | 78 | |
| 7 | 3 | |
| 8 | 1 | |
| 9 | 2 | |
| 10 | 2 | |
| 11 | 2 | |
| 12 | 5 | |
| 13 | 1 | |
| 14 | 1 | |
| 15 | 3 | |
| 16 | 3 | |
| 17 | 5 | |
| 18 | Study on the Deep Submicron Radiation Hardened SRAM Circuit for RHBD Technologies | 1 |
| 19 | Total Dose Radiation Hardened PDSOI CMOS 64k SRAMs | 1 |
| 20 | STUDIES ON THE ACTIVATION AND INHIBITION STATES OF SNAKE MUSCLE FRUCTOSE 1, 6-BISPHOSPHATASE | 1 |
About Fazhan Zhao
Fazhan Zhao is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Materials Chemistry, having authored 63 papers that have together received 287 indexed citations. Recurring topics across this work include Semiconductor materials and devices (28 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Radiation Effects in Electronics (23 papers). The work is most often cited by research in Hardware and Architecture (34 citations), Electrical and Electronic Engineering (169 citations) and Industrial and Manufacturing Engineering (20 citations). Fazhan Zhao has collaborated with scholars based in China, Singapore and Canada. Frequent co-authors include Kaige Wang, Kun Zhao, Zhengsheng Han, Bo Li, Jiantou Gao, Jinshun Bi, Lei Wang, Kai Xi, Gang Liu and Zhangang Zhang. Their work appears in journals such as Sensors, Journal of Physics Condensed Matter and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.