F. W. Saris

3.4k citations
99 papers · 2.8k indexed · h-index 30
Topics
Ion-surface interactions and analysis (55 papers)Silicon and Solar Cell Technologies (36 papers)Integrated Circuits and Semiconductor Failure Analysis (27 papers)

In The Last Decade

F. W. Saris

98 papers receiving 2.6k citations

Peers

F. W. Saris
Comparison fields: 5 of 58
  • Electrical and Electronic Engineering 1.2k
  • Computational Mechanics 1.1k
  • Atomic and Molecular Physics, and Optics 1.1k
  • Materials Chemistry 819
  • Surfaces, Coatings and Films 560
Replace S. T. Picraux with:
S. T. Picraux United States
J. Ferrón Argentina
L. C. Feldman United States
J. Peisl Germany
D. M. Zehner United States
Tadashi Narusawa Japan
B. R. Appleton United States
F. Bijkerk Netherlands
T. W. Haas United States
W. F. van der Weg Netherlands
F. W. Saris relative to S. T. Picraux United States S. T. Picraux's profile →
Citations per field
00.5×1.5×
S. T. Picraux · 1×
Citations per year

Countries citing papers authored by F. W. Saris

Since Specialization
Citations

This map shows the geographic impact of F. W. Saris's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. W. Saris with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. W. Saris more than expected).

Fields of papers citing papers by F. W. Saris

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. W. Saris. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. W. Saris. The network helps show where F. W. Saris may publish in the future.

Co-authorship network of co-authors of F. W. Saris

This figure shows the co-authorship network connecting the top 25 collaborators of F. W. Saris. A scholar is included among the top collaborators of F. W. Saris based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. W. Saris. F. W. Saris is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 28
2 10
3 6
4 27
5 0
6 15
7 19
8 143
9 4
10 42
11 37
12 30
13 1
14 40
15 1
16 9
17 4
18 18
19 2
20 25

About F. W. Saris

F. W. Saris is a scholar working on Computational Mechanics, Surfaces, Coatings and Films and Radiation, having authored 99 papers that have together received 2.8k indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (55 papers), Silicon and Solar Cell Technologies (36 papers) and Integrated Circuits and Semiconductor Failure Analysis (27 papers). The work is most often cited by research in Surfaces, Coatings and Films (560 citations), Computational Mechanics (1.1k citations) and Radiation (373 citations). F. W. Saris has collaborated with scholars based in Netherlands, United States and Canada. Frequent co-authors include R. M. Tromp, R.G. Smeenk, J. F. van der Veen, Holger Kersten, R.J. Schreutelkamp, J.R. Liefting, R. de Reus, W.C. Sinke, J. S. Custer and L. S. Hung. Their work appears in journals such as Nature, Physical Review Letters and Physical review. B, Condensed matter.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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